• YAKHAK HOEJI
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• v.37 no.4
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• pp.383-388
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• 1993

Pharmacokinetics of aucubin, an irdoid glucoside, was compared in rats of experimental hepatic failure(EHF). EHF was induced by CCI$_{4}$ or D-galactosamine pretreatment. This work was designed to find out any differences in the pharmacokinetics of aucubin that may explain the different protective effect of aucubin on CCI$_{4}$- and galactosamine-induced EHF : aucubin reportedly protected CCI$_{4}$-inducing hepatotoxicity effectively, but did not for galactosamine-hepatotoxicity. EHF was induced by intraperitoneal injection Of CCI$_{4}$(0.9ml/kg) or galactosamine(250 mg/kg) to Wistar rats 24 hr before the pharmacokinetic study. The rats were fasted during the 24 hr. Aucubin was iv injected at a dose of 15 mg/kg and the plasma aucubin was assayed by HPLC. There were no significant differences in the pathophysiologies(body weight, liver weight, GTP, hematocrit, blood cell distrbution and plasma protein binding of aucubin) between the two EHF models except GOP which was significantly (p<0.05) higher in CCI$_{4}$-than in galactosamine-EHF. On the other hand, pharmacokinetics of aucubin such as total cleatance(CL$_{t}$), distribution volume at steady-state(Vd$_{ss}$), and mean residence time(MRT) differed significantly(p<0.05) between the models : for example, CL$_{t}$ was increased two fold by CCI$_{4}$, but not by galaclosamine ; Vd$_{ss}$, in galactosamine-EHF was higher than that in CCI$_{4}$-EHF ; MRT was decreased by CCI$_{4}$, but increased conversely by galactosamine. The increase of CL$_{t}$(and decrease of MRT) in rats of CCI$_{4}$-EHF was contrary to the general expectation for the hepatic failure : most of the hepatic failures have been known to decrease CL$_{t}$ of the administered drugs. Whether the difference in the pharmacokinetics is responsible for the different protective effect of aucubin against the two EHF models is of interest. However, much more studies on biliary excretion, urinary excretion, and hepatic uptake in cellular level should be preceded before any conclusions are made on the role of different pharmacokinetics on the different pharmacology of aucubin.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.26 no.5
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• pp.896-903
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• 2002

The susceptibility of SCC for the weldment and PWHT specimens of HT-60 steel was evaluated using a slow strain rate method under applied potential by means of the potentiostat in synthetic seawater. In case of the parent, anodic polarization voltage was inappropriate in elongating the time to failure(TTF). -0.8V corresponding to cathodic protection range is most effective in improving the SCC resistance against corrosive environment. In case of the weldment, the values of reduction of area(ROA) and TTF at -0.68V corresponding to cathodic polarization value were 45.2% and 715,809sec which were the largest and longest life among other applied potentials. Those were vise versa at -1.1V. In case of the PWHT specimens, TTF and ROA at -0.68V was longest and largest like the weldment. Besides, PWHT is effective in prolonging the time to failure of the welded off-shore structure due to softening of effect. Regardless of the weldment and PWHT specimen, as corrosion rate gets higher, TTF becomes shorter and deformation behaviour for the weldment and PWHT specimen at -1.1V was shown to be irregular. Finally, it was found that specimens showed brittle fracture at -1.1V, but more ductile fracture accompanying the micro-cracks at applied potential of -0.68V.

• The Journal of Korean Academy of Prosthodontics
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• v.41 no.4
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• pp.493-502
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• 2003

Statement of problem : Removable partial denture and complete denture often require denture base relines to improve the fittness against tissue-bearing mucosa because of the gradual change in edentulous ridge contour and resorption of underlyng bony structure. Self-curing hard reline resins offers the immediate and relatively inexpensive means to be recondition the surface of denture base directly However weak bond between denture base resin and reline material can harbor bacteria, promote staining, or result in complete separation of the two materials. Purpose : The purpose of this study was to evaluate the effect of denture cleansers on bond strength and surface hardness of reline resin to denture base resin Denture base resin beams($60.0{\times}15.0{\times}3.0mm$) were made with Lucitone 199. Material and methods : 10mm section was removed from the center of each specimen. The samples were replaced in the molds and the space of l0mm sections were packed with Tokuso Rebase reline material. The specimens were immersed in denture cleansers (Polident, Cleadent) and were evaluated after 1 week, 2 weeks, and 4 weeks. The bond strength and surface hardness of self-curing hard reline materials to heat-curing denture base resin were measured using an UTM (universal testing machine). Results and conclusion : 1) There was no significant difference of usage, kind, and denture cleaner by application time on the bonding strength of self-curing hard reline resin to denture base resin. 2) There was no significant difference of usage, kind, and denture cleaner by application time on the surface hardness, but the surface hardness showed decreasing tendency, as the time of immersion was extended. 3) The failure modes of the specimens was initially adhesive failure and finally cohesive failure of self-curing hard reline resin.

• Korean Journal of Construction Engineering and Management
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• v.19 no.3
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• pp.43-51
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• 2018

Facility Management (FM) phase in building lifecycle management is the most crucial phase concerning building value and life cycle cost management. Nevertheless, systematic and rational FM process is not yet constructed, leading to failure of facility value and cost management from accurate and proactive FM. This is because there has been minimal approach regarding construction of optimal FM process based on rational FM data analysis. The purpose of this study is to provide optimal FM process with quantitative FM data analysis method using spatial data. This study investigated existing FM data structure and derive the limitation of it from both expert interview and practical FM material analysis. As a solution for this limitation, this study provided optimal FM process with MTBF (Mean Time Between Failure), which is quantitative FM data analysis method. The effect of the provided process was validated with a case study. It is expected that this process allows rational and objective FM data analysis, resulting in accurate and proactive FM. And it is expected that it can be used as a useful basic data for developing an effective system for the FM process.

• Journal of Platform Technology
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• v.6 no.3
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• pp.47-54
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• 2018

Predictive analysis in the hardware industry can be performed at an appropriate point in time to prevent failure of production facilities and reduce management costs. This helps to perform more efficient and scientific maintenance through automation of failure analysis. Among them, predictive management aims to prevent the occurrence of anomalous state by identifying and improving the abnormal state based on the gathering, analysis, and scientific data management of facilities using information technology and constructing prediction model do. In this study, we made a fault tree through the Relex tool and analyzed the error code of the hardware to study the safety.

• JSTS:Journal of Semiconductor Technology and Science
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• v.12 no.1
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• pp.34-40
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• 2012

We have developed a highly sensitive inspection technique based on an electron beam inspection for detecting the contact failure of a poly-Si plugged layer. It was difficult to distinguish the contact failure from normal landing plugs with high impedance. Normally, the thermal annealing method has been used to decrease the impedance of poly-Si plugs and this method increases the difference of charged characteristics and voltage contrast. However, the additional process made the loss of time and broke down the device characteristics. Here, the interval scanning method without thermal annealing was effectively applied to enhance the difference of surface voltage between well-contacted poly-Si plugs and incomplete contact plugs. It is extremely useful to detect the contact failures of non-annealed plug contacts with high impedance.

• Korean Journal of Clinical Pharmacy
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• v.10 no.3
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• pp.120-124
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• 2000

Diltiazem inhibits calcium channels and leads to vascular smooth muscle relaxation and negative inotroic and chronotropic effects in the heart. Diltiazem (DTZ) is almost completely absorbed after oral administration, but its bioavailability is reduced because of considerable hepatic first-pass metabolism. The main metabolite of DTZ is deacetyldiltiazem. The purpose of this study was to report the pharmacokinetic changes of DTZ and its metabolite, deacetyldiltiazem (DAD) after intravenous administration of diltiazem to control rabbits and rabbits with mild and medium folate-induced renal failure (FIRRs). The area under the plasma concentration-time curves (AUC) of DTZ were significantly increased in mild and medium FIRRs. The metabolite ratio of the DAD to DTZ were significantly decreased in mild and medium FIRRs. The elimination rate constant $(\beta)$ and total body clearances (CLt) of DTZ were significantly decreased in mild and medium FIRRS. These findings suggest that the hepatic metabolism of diltiazem was inhibited and CLt and ${\beta}$ of DTZ were significantly decreased in mild and in rabbits with medium folate-induced renal failure.

• Journal of Applied Reliability
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• v.7 no.1
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• pp.13-22
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• 2007

A preventive maintenance model, caller FNBM (${\alpha},{\delta},{\gamma}$) model, is proposed to decide an optimal repair number under achieved availability requirements (r) along with taking two types of failures (repairable or irrepairable) into account. In this model, the current system is replaced by a new one in case when it doesn't meet the achieved availability requirement, even though it is repairable failure; Othewise it is replaced in time of the first irrepairable failure. Assumed that the j-th failure is repairable with probability ${\alpha}_j$ minimal repairs are allowed for repairable failure between replacements. Expected cost rate for preventive maintenance model is developed using NHPP (Non - Homogeneous Poisson Process) in order to de term in the optimal number $n^*$, also numerical examples are shown in order to explain the proposed model. Since the proposed FNBM (${\alpha},{\delta},{\gamma}$) model includes Park FNBM model (1979) and Nakagawa FNBM (p) model (1983) m this proposed model is thought to be better than previous model, especially for weapon system which requires availability as primary parameter.

• Advances in materials Research
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• v.1 no.1
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• pp.83-92
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• 2012

The effect of under-bump-metallization (UBM) on electromigration was investigated at temperatures ranging from $135^{\circ}C$ to $165^{\circ}C$. The UBM structures were examined: 5-${\mu}m$-Cu/3-${\mu}m$-Ni and $5{\mu}m$ Cu. Experimental results show that the solder joint with the Cu/Ni UBM has a longer electromigration lifetime than the solder joint with the Cu UBM. Three important parameters were analyzed to explain the difference in failure time, including maximum current density, hot-spot temperature, and electromigration activation energy. The simulation and experimental results illustrate that the addition 3-${\mu}m$-Ni layer is able to reduce the maximum current density and hot-spot temperature in solder, resulting in a longer electromigration lifetime. In addition, the Ni layer changes the electromigration failure mode. With the $5{\mu}m$ Cu UBM, dissolution of Cu layer and formation of $Cu_6Sn_5$ intermetallic compounds are responsible for the electromigration failure in the joint. Yet, the failure mode changes to void formation in the interface of $Ni_3Sn_4$ and the solder for the joint with the Cu/Ni UBM. The measured activation energy is 0.85 eV and 1.06 eV for the joint with the Cu/Ni and the Cu UBM, respectively.

• Journal of Power Electronics
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• v.17 no.3
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• pp.811-820
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• 2017

The reliability issue of IGBT is a concern for researchers given the critical role the device plays in the safety of operations of the converter system. The reliability of power devices can be estimated from the intermittent life test, which aims to simulate typical applications in power electronics in an accelerated manner to obtain lifetime data. However, the test is time-consuming, as testing conditions are not well considered and only rough provisions have been made in the current standards. Acceleration of the test by changing critical test conditions is controversial due to the activation of unexpected failure mechanisms. Therefore, full investigations were conducted on critical test conditions of intermittent life test. A design optimization process for IGBT intermittent life testing program was developed to save on test times without imposing additional failure mechanisms. The applicability of the process has been supported by a number of tests and failure analysis of the test results. The process proposed in this paper can guide the test process for other power semiconductors.