• Title/Summary/Keyword: time to failure

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Field data analyses for products with multiple-modes of failure (고장원인이 여럿인 제품의 사용현장 데이터 분석)

  • 배도선;최인수;황용근
    • The Korean Journal of Applied Statistics
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    • v.8 no.1
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    • pp.89-104
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    • 1995
  • This paper is concerned with the method of estimating lifetime distributin from field data for products with multiple modes of failure. When product failures occur within warranty period, a manufacturer can obtain failure-record data; failure times, causes of failure, and covariates. Since these data are seriously incomplete for satisfactory inference, that is, only failures occured during warrantly period may be recorded, it is usually necessary to incoporate the failure-record data by taking a supplementary sample of items obtained following up a portion of products that survive warranty time. The log linear function is considered as a model for describing the relation between failure time of a product and covariates. General methods for obtaining pseudo maximum likelihood estimators(PMLEs) for the parameters are outlined and their asymptotic properties are studied, and specific formulas for exponential or Weibull distribution are obtained. Effects of follow-up percentage on the PMLEs are investigated. Extensions to calendar time warranty or calendar and obtaining time warranty are also considered.

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The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

  • Nozadian, Mohsen Hasan Babayi;Zarbil, Mohammad Shadnam;Abapour, Mehdi
    • Journal of Power Electronics
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    • v.16 no.4
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    • pp.1426-1437
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    • 2016
  • In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

A Study on Failure Characteristics and Reliability Prediction of the Rice Combine Harvester (콤바인 수확기(收穫機)의 고장특성(故障特性) 및 신뢰성(信賴性) 예측(豫測)에 관(關)한 연구(硏究))

  • Kim, H.K.;Chung, C.J.
    • Journal of Biosystems Engineering
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    • v.11 no.1
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    • pp.76-85
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    • 1986
  • This study was intended to examine the failure characteristics and breakdowns of the head-fed type combines generally used on farms. The failure distribution was assumed to follow Weibull distribution function and the Weibull parameters of the major parts, units and combine as whole were estimated by using the data collected in a survey. A computer program for the estimation of the Weibull parameter was developed. Monte Carlo method was used in predicting the time between failures. The results of study may be summarized as follows: 1. The number of failures per combine was 4.83 times per year and 0.3 times per hectare of combines of different ages. 2. According to the Kolmogorov-Smirnov test method, it was proved that the Weibull distribution function is well fitted to the characteristics of the failure and breakdowns of combines. 3. Weibull parameters of failure distribution of the combine as a whole were estimated to give the shape parameter ${\beta}$=1.3089 and the scale parameter ${\alpha}$=105.2409. The combining area with 80% reliability was 1.1 ha, and the probability of operating the combine without any failure for a year, was $2.76{\times}10^{-4}$. 4. The mean time between failures (MTBF) of the combines was predicted to be 3.2 ha of operation, which corresponds to 32 hours of operation.

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A Study on the Estimation of Shelf Life for Fuze MTSQ KM577A1 from ASRP Data (저장탄약신뢰성평가 데이터를 이용한 기계식시한신관 KM577A1 저장수명 추정 연구)

  • Lee, Dongnyok;Yoon, Keunsig
    • Journal of Applied Reliability
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    • v.18 no.1
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    • pp.56-65
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    • 2018
  • Purpose: The purpose of this study is to estimate shelf life of fuze MTSQ (Mechanical Time & Super Quick) KM577A1 from Ammunition Stockpile Reliability Program (ASRP) data. Methods: For many years, ammunition test data had been gathered from ASRP. In this study, lot selection criteria and reliability score of functioning time for fuze are proposed. Reliability score of functioning time and failure data are used to estimate shelf life. Results: The results of this study are as follows; The failure modes of fuze MTSQ KM577A1 are dud, inverse function and mechanical time functioning failure (not operating in intended time). Dud and inverse function are major failure modes. Fuze MTSQ KM577A1's shelf life ($B_5$) is estimated 18.2 years conservatively. Conclusion: Degradation of chemical components in fuze MTSQ KM577A1 is major factor for its reliability. And shelf life ($B_5$) of fuze MTSQ KM577A1 is estimated 18.2 years conservatively.

MV Cable Failure Statistics Analysis and Failure Rate Utilization Method of Prioritization of Diagnosis Targets (지중 배전용케이블 고장통계 분석 및 고장률 활용 진단대상 우선순위 선정방법)

  • Cho, Chong-Eun;Lee, On-You;Kim, Sang-Bong;Kim, Kang-Sik
    • KEPCO Journal on Electric Power and Energy
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    • v.7 no.2
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    • pp.263-268
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    • 2021
  • This paper statistically analyzes the time required for each failure cause and describes a diagnostic method for 159 reports of failure analysis of MV cables that occurred in the distribution system of KEPCO over the past 18 years. In addition, the manufacturer's failure rate compared to 100C-km was calculated using 381 cases of MV cable deterioration failure between 2008 and 2020. It is hoped that this paper will help those in charge of maintaining underground facilities at the business office to use the failure rate to prioritize facility diagnosis.

Analysis of failure rate according to capacitor position of bidirectional converter (양방향 컨버터의 커패시터 위치에 따른 고장률 분석)

  • Kim, Ye-rin;Kang, Feel-soon
    • Journal of IKEEE
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    • v.23 no.1
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    • pp.261-265
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    • 2019
  • We analyze the failure rate change of a conventional bidirectional converter and a modified one which moves an output capacitor towards propulsion battery. We analysis of the circuit structural homogeneity and the difference between both converters, and confirm that the capacitor working voltage is reduced by changing the capacitor position. After obtaining the capacitor failure rate according to voltage stress factor and operating temperature, it is applied to the fault-tree of the bidirectional converter to obtain the overall failure rate of the converter. We analyzes the advantages and disadvantages of design changes by comparing and analyzing the failure rate and mean time between failures (MTBF) according to operating temperature and capacitance value.

Probabilistic Integrity Assessment of CANDU Pressure Tube for the Consideration of Flaw Generation Time (결함발생 시점을 고려한 CANDU 압력관 결함의 확률론적 건전성평가)

  • Kwak, Sang-Log;Lee, Joon-Seong;Kim, Young-Jin;Park, Youn-Won
    • Proceedings of the KSME Conference
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    • 2001.11a
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    • pp.155-160
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    • 2001
  • This paper describes a probabilistic fracture mechanics (PFM) analysis based on Monte Carlo (MC) simulation. In the analysis of CANDU pressure tube, it is necessary to perform the PFM analyses based on statistical consideration of flaw generation time. A depth and an aspect ratio of initial semi-elliptical surface crack, a fracture toughness value, delayed hydride cracking (DHC) velocity, and flaw generation time are assumed to be probabilistic variables. In all the analyses, degradation of fracture toughness due to neutron irradiation is considered. Also, the failure criteria considered are plastic collapse, unstable fracture and crack penetration. For the crack growth by DHC, the failure probability was evaluated in due consideration of flaw generation time.

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Analysis of the APS protocol for BSHR/2 networks (BSHR/2 네트워크를 위한 APS 프로토콜 분석)

  • 김성선;손희영;이상순
    • Journal of the Korea Society of Computer and Information
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    • v.6 no.2
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    • pp.108-115
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    • 2001
  • SDH-based SHR networks are the reconfiguration process in case of failure and APS protocol used. In this study, addresses the maximum allowed recovery time in two fiber bidirectional networks. We analyse the APS protocol and derive the Processing time domains of each n order to cope with the maximum reconfiguration time of 50㎳, as specified in the ITU-T standard. We finally analyze the interleaved failures. One is the signal degrade then the signal failure, the other is the signal failure then the signal failure. Any case analysis is carried out. reconfiguration time can be guaranteed.

Prediction of the Failure Stress of Tofu Texture Using a Delay Time of Ultrasonic Wave (초음파의 지연 시간을 이용한 두부 조직의 물성변화 예측에 관한 연구)

  • Kim, Hak-Jung;Hahm, Young-Tae;Kim, Byung-Yong
    • Applied Biological Chemistry
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    • v.38 no.4
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    • pp.325-329
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    • 1995
  • Changes in the physical properties of soybean curd upon the processing conditions such as coagulant concentration, heating temperature and molding pressure were determined by using a failure stress and residual delay time of ultrasonic wave(5 MHz). Maximum failure stress of Tofu was obtained at the 0.3% $CaCl_2$ coagulant concentration, $95^{\circ}C$ heating temperature and greater molding pressure, respectively, whereas the delay time is inverse proportion to the failure stress value. The results of the multiple regression analysis with factorial design showed that the model equation consisted with delay time and processing conditions gave the good prediction of the Tofu failure stress.

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Fault-tree based reliability analysis for bidirectional converter (고장나무를 이용한 양방향 컨버터의 신뢰성 분석)

  • Heo, Dae-ho;Kang, Feel-soon
    • Journal of IKEEE
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    • v.23 no.1
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    • pp.254-260
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    • 2019
  • The failure rate of bidirectional dc-to-dc converter is predicted through the failure mode and effect analysis (FMEA) and the fault-tree analysis (FTA) considering the operational risk. In order to increase the driving voltage of the electric vehicle efficiently, the bidirectional converter is attached to the front of the inverter. It has a boost mode for discharging battery power to the dc-link capacitor and a buck mode for charging the regenerative power to the battery. Based on the results of the FMEA considering the operating characteristics of the bidirectional converter, the fault-tree is designed considering the risk of the converter. After setting the design parameters for the MCU for the electric vehicle, we analyze the failure rate of the capacitor due to the output voltage ripple and the inductor component failure rate due to the inductor current ripple. In addition, we obtain the failure rate of major parts according to operating temperature using MIL-HDBK-217F. Finally, the failure rate and the mean time between failures (MTBF) of the converter are predicted by reflecting the part failure rate to the basic event of the fault-tree.