• 제목/요약/키워드: test time

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누적손상이론을 이용한 기계류부품의 가속수명시험법 개발 (Development of Accelerated Life Test Method for Machanical Parts Using Cumulative Damage Theory)

  • 김대철;이근호;김형의
    • 연구논문집
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    • 통권32호
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    • pp.35-43
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    • 2002
  • This study was performed to develop accelerated life test method of machanical parts using cumulative damage theory that used to model the fatigue of parts that receive variable load. The cumulative damage theory was introduced, and the estimation of life and calculation of accelerated life test time was illustrated. As the actual application example, accelerated life test method of agricultural tractor transmission was described. Life distribution of agricultural tractor transmission was supposed to follow Weibull distribution and life test time was calculated under the conditions of average life (MTBF) 3,000 hours and 90% reliability for one test sample. According to the cumulative damage theory, because test time can shorten in case increase test load, test time could be reduced by 482 hours when we put the load 1.1 times of rated load than 0.73 times of rated load that is equivalent load calculated by load spectrum of the agricultural tractor. This time, acceleration coefficient was 11.7. This accelerated test method was used to develop accelerated test method of gear reducer, hydraulic hose and bearing as well as agricultural tractor transmission and it is considered to be applied comprehensively to machanical parts the fatigue of which is happened by load or pressure etc.

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무기체계 임베디드 소프트웨어에 대한 TFM 기반 시스템 테스트 모델 설계 및 적용 (Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software)

  • 김재환;윤희병
    • 정보처리학회논문지D
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    • 제13D권7호
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    • pp.923-930
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    • 2006
  • 본 논문에서는 무기체계 임베디드 소프트웨어의 시간 요소를 고려한 TFM(Time Factor Method) 기반의 시스템 테스트 모델을 설계하고, 적용사례를 통하여 결과를 제시한다. 이를 위해 무기체계 임베디드 소프트웨어의 특징과 시스템 테스트 그리고 객체지향 모델의 표현방법인 UML 표기법에 대하여 알아보고, 시스템 테스트 모델 설계를 위한 TFM 접근 방법으로 시간 요소를 고려한 테스트 방법과 시간 요소 측정 방법 그리고 테스트 케이스 선정 알고리즘을 제시한다. 무기체계 임베디드 소프트웨어의 TFM 기반 시스템 테스트 모델은 세 가지 요소 (X,Y,Z) 로 구성되며, 'X' 에서는 최대시간경로를 선정하는 알고리즘을 통해 테스트 케이스가 도출되고, 'Y' 에서는 Sequence Diagram과 관련된 객체를 식별하고, 'Z'에서는 Timing Diagram을 통하여 식별된 각 객체들의 실행시간을 측정한다. 또한 제안한 W:M 기반 시스템 테스트 모델을 '다기능 미사일 방어시스템'에 적용하여 테스트 케이스를 추출하는 방법을 제시한다.

An Adequacy Based Test Data Generation Technique Using Genetic Algorithms

  • Malhotra, Ruchika;Garg, Mohit
    • Journal of Information Processing Systems
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    • 제7권2호
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    • pp.363-384
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    • 2011
  • As the complexity of software is increasing, generating an effective test data has become a necessity. This necessity has increased the demand for techniques that can generate test data effectively. This paper proposes a test data generation technique based on adequacy based testing criteria. Adequacy based testing criteria uses the concept of mutation analysis to check the adequacy of test data. In general, mutation analysis is applied after the test data is generated. But, in this work, we propose a technique that applies mutation analysis at the time of test data generation only, rather than applying it after the test data has been generated. This saves significant amount of time (required to generate adequate test cases) as compared to the latter case as the total time in the latter case is the sum of the time to generate test data and the time to apply mutation analysis to the generated test data. We also use genetic algorithms that explore the complete domain of the program to provide near-global optimum solution. In this paper, we first define and explain the proposed technique. Then we validate the proposed technique using ten real time programs. The proposed technique is compared with path testing technique (that use reliability based testing criteria) for these ten programs. The results show that the adequacy based proposed technique is better than the reliability based path testing technique and there is a significant reduce in number of generated test cases and time taken to generate test cases.

내환경 온도시험의 촉진시간에 관한 연구 (A Study on the Promotion Time in Environmental Temperature Test)

  • 한철호;김경훈;김형의
    • 대한기계학회논문집A
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    • 제35권3호
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    • pp.325-331
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    • 2011
  • 내환경 시험시 시험물체가 요구시험온도가 되게 온도시험조를 가열 또는 냉각하는 계단형 온도시험 프로파일에서 적정 촉진온도 유지시간을 예측하는 집중용량법에 의한 새로운 해석적 방법을 제안하였다. 해석은 주어진 온도시험조건에 대해 시험시간을 줄이고 에너지를 절약하는 촉진시간이 존재함을 보여주고 있다. 이론결과는 작업소재로 강을 사용한 몇 가지 실험결과와 비교적 잘 부합하고 있다. 제안된 적정촉진시간은 동일재료에 대해 시편의 질량/표면적비와 근사적으로 비례한다.

공압밸브의 동적응답 특성측정 자동화 시스템 개발 (Development of automatic measurement system for dynamic respose time of pneumatic solenoid valve)

  • 강보식;김형의
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1991년도 한국자동제어학술회의논문집(국내학술편); KOEX, Seoul; 22-24 Oct. 1991
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    • pp.974-978
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    • 1991
  • Electro-pneumatic valve is an electro-mechanical device which converts electric signal into pneumatic flow mu or pressure. A measurement of dynamic response time is very important to evaluate valve performance. Dynamic response time of electro-pneumatic valve has a variation accordance with valve types, operating way and test standard. In this study, automatic measurement system of dynamic response time is composed based on test condition of dynamic response time test standard(CETOP, JIS). Also, in this study test pressure variation characteristics accordance with variation of solenoid excitation power, and we developed dynamic response measurement system enable to compare of and analyze these two characteristics.

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가혹조건에서의 태양전지모듈 내구성 평가를 통한 최적의 시험조건 제안 (Suggestion of Long-term Life Time Test for PV Module in Highly Stressed Conditions)

  • 김경수;강기환;유권종;윤순길
    • 한국태양에너지학회 논문집
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    • 제30권5호
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    • pp.63-68
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    • 2010
  • To guarantee life time more than 20 years for manufacturer without stopping photovoltaic(PV) system, it is really important to test the module in realistic time and condition compared to outside weather. In here, we tested PV modules in highly stressed condition compared to IEC standards. In IEC 61215 and IEC 61646 standards, damp-heat, thermal cycle(TC200) and mechanical test are main test items for evaluating long-term durability of PV module in controlled temperature and humidity condition. So in this paper, we have lengthened the test time for TC200 and damp-heat test and increased the loading stress on surface of module. Through this test, we can get some clue of proper the method for measuring realistic life cycle of PV modules and suggested the minimum time for PV test method. The detail description is specified as the following paper.

Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC

  • Song, Jaehoon;Jung, Jihun;Kim, Dooyoung;Park, Sungju
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제14권3호
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    • pp.345-355
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    • 2014
  • Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, an efficient parallel scan test technique is introduced to minimize the test application time. Multiple scan enable signals are adopted to implement scan architecture to achieve optimal test application time for the test patterns scheduled for concurrent scan test. Experimental results show that testing times are considerably reduced with little area overhead.

테스트 자원 그룹화를 이용한 시스템 온 칩의 테스트 스케줄링 (Test Scheduling for System-on-Chips using Test Resources Grouping)

  • 박진성;이재민
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2002년도 합동 추계학술대회 논문집 정보 및 제어부문
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    • pp.257-263
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    • 2002
  • Test scheduling of SoC becomes more important because it is one of the prime methods to minimize the testing time under limited power consumption of SoCs. In this paper, a heuristic algorithm, in which test resources are selected for groups and arranged based on the size of product of power dissipation and test time together with total power consumption in core-based SoCs is proposed. We select test resource groups which has maximum power consumption but does not exceed the constrained power consumption and make the testing time slot of resources in the test resource group to be aligned at the initial position to minimize the idle test time of test resources.

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A Test Input Sequence for Test Time Reduction of $I_{DDQ}$ Testing

  • Ohnishi, Takahiro;Yotsuyanagi, Hiroyuki;Hashizume, Masaki;Tamesada, Takeomi
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2000년도 ITC-CSCC -1
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    • pp.367-370
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    • 2000
  • It is shown that $I_{DDQ}$ testing is very useful for shipping fault-free CMOS ICs. However, test time of $I_{DDQ}$ testing is extremely larger than one of logic testing. In this paper, a new test input sequence generation methodology is proposed to reduce the test time of $I_{DDQ}$ testing. At first, it is Shown that $I_{DDQ}$ test time Will be denominated by charge supply current for load capacitance of gates whose output logic values are changed by test input vector application and the charge current depends on input sequence of test vectors. After that, a test input sequence generation methodology is proposed. The feasibility is checked by some experiments.riments.

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A Consistent Test for Linearity for a Class of General First order Nonlinear Time Series

  • Hwang, Sun Y.
    • Journal of the Korean Statistical Society
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    • 제27권4호
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    • pp.451-458
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    • 1998
  • Problem of testing linearity among general class of first order nonlinear time series models is discussed. The null hypotheses of linearity is identified via conditional expectations. A consistent test is then suggested and relevant limiting results are derived. It is worth indicating that any specific alternatives are not specified.

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