• Fashion & Textile Research Journal
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• v.13 no.4
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• pp.624-634
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• 2011

The purpose of this study is to develop the pattern of safety clothes used at flat or mountainous areas and to identify the pattern of safety clothes by conducting experimental evaluation of virtual wear. Three subjects were selected, based on fire fighters' physical constitution. A prototype design for safety clothing was determined after in-depth interviewing of professionals and surveying of Forest service staff and related agency. Wearing test should be carried out in the order of pattern making, virtual and real wearing evaluation. For data analysis, technical statistical values should be obtained by using body measurements of subject, frequency analysis and T-test. The jacket is designed to have a front extension and the entire length of clothing enough for wearer to put on it over ordinary shirts or sweater. The collar of jacket is of round type. Cyber reality enables to identify the movement and activity of virtual fitting model and to find out errors or problems in safety clothing prior to on-the-spot wear test, thus raising the precision level of pattern. There was significant difference between real and virtual fit preference. The results show that the virtual try-on system need the development of a specific style.

• Korean Journal of Materials Research
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• v.15 no.1
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• pp.54-60
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• 2005

Recently a lots of problems have observed in high densified and high integrated electronic components. One of them is ion migration phenomena, which induce the electrical short of electrical circuit. ion migration phenomena has been observed in the field of exposing the specific environment and using for a long tin e. This study was evaluated the generation time of ion migration and was investigated properly test method through water drop test and high temperature high humidity test. Also we observed direct causes and confirmed generation mechanism of dendritic growth as we reproduced the ion migration phenomena. We utilized PCB(printed circuit board) having a comb pattern as follows 0.5, 1.0, 2.0 mm pattern distance. Cu, SnPb and Au were electroplated on the comb pattern. 6.5 V and 15 V were applied in the comb pattern and then we measured the electrical short time causing by ion migration. In these results, we examined a difference of ion migration time depending on pattern materials, applied voltage and pattern spacing of PCB conductor.

• Proceedings of the IEEK Conference
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• 2003.07e
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• pp.1763-1766
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• 2003

This paper proposes a non-contact color inspection system for plasma display panel (PDP). The red, green, and blue test pattern images are acquired by using the area color CCD camera at the various distance from the PDP. The RGB values are obtained from the region of interest (ROI) which are extracted by applying the image processing to the test pattern image. Finally, the CIE xy and u'v' chromaticity coordinates of the test pattern images according to the distance are acquired from the RGB color coordinates.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.22 no.7
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• pp.1394-1402
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• 1997

In this work, an efficient test algorithm and BIST architeture a for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect nighborhood pattern sensitive fault which could not be detected in previous march test algoarithms. The proposed test algorithm perposed test algorithm performs testing for neghborhood pattern sensitive fault using backgroung data which has been used word-oriented memory testing.

• The Research Journal of the Costume Culture
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• v.9 no.5
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• pp.770-782
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• 2001

The definite objects of this study are as follows; 1. The study presents the methods of the designing collar pattern and bodice pattern by each concrete object after comparing and analyzing the factors among the features which are in need of clothes designing. 2. The object of this study is to make body-suitable ready-made clothes by comparing and analyzing the methods of designing collar pattern and bodices pattern presented by each concrete objects and Bunka Pattern. The results of this study are as follows; 1 . The results of this study developed the body-suitable bodice pattern of bend-forward type, straight type and lean-back type Compared with the Bunka pattern by physical function test, this study was rated high in the aspects of the shape of neck and shoulder. 2. The collar pattern was designed according to each type. The front center rising point of straight type is 2.5cm, lean-back type is 3.0cm and bend-forward type is 1.5cm. Compared with the Bunka pattern by physical function test, this study is rated high in the aspects of the shape. To confirm the increase and change of the measure definitely, the complete examination of each subject is necessary. This developed and investigated pattern must be supplemented more by comparing and analyzing with other pattern and body types.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.1
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• pp.79-89
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• 2014

It has been an increase in consumers who want a high-capacity and fast speed by the newly diffused mobile device(Smart phones, Ultra books, Tablet PC). As a result, the demand for Flash Memory is constantly increasing. Flash Memory is separated by a NAND-type and NOR-type. NAND-type Flash Memory speed is slow, but price is cheaper than the NOR-type Flash Memory. For this reason, NAND-type Flash Memory is widely used in the mobile market. So Fault Detection is very important for Flash Memory Test. In this paper, Proposed PMBIST for Pattern Test of NAND-type Flash Memory improved Fault detection.

• Journal of the Korean Society of Costume
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• v.53 no.8
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• pp.1-10
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• 2003

The purpose of this study was to verify fitness of a new raglan sleeve pattern according to the result of appearance and function evaluation. Also, it was to search the relation between the construction factor and the function on the selected 3 types of the existent raglan sleeve patterns and the new sleeve pattern. Three female university students having different shoulder shapes were selected as subjects, wore 4 different types of the raglan steeve was evaluated by professional panel. The functions of the evaluated sleeve patterns evaluated was made by the wearer themselves. According to the comparison of the new raglan sleeve pattern with the existent raglan sleeve pattern, the new raglan sleeve pattern acquired the higher evaluation scores both on the appearance test and the function evaluation. It was known that the appearance and function of the raglan sleeve pattern were effected by construction factors of the sleeve pattern.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.5
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• pp.81-90
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• 2004

This paper presents new testability measure based on learning, which can be useful in the deterministic process of test pattern generation algorithms. This testability measure uses the structural information that are obtained by teaming. The proposed testability measure searches for test pattern that can early detect the conflict in case of the hardest decision problems. On the other hand in case of the easiest decision problem, it searches for test pattern that likely results in the least conflict. The proposed testability measure reduces CPU time to generate test pattern that accomplishes the same fault coverage as that of the distance-based measure.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.53 no.1
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• pp.22-27
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• 2004

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.7
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• pp.81-88
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• 2002

A new pattern generator of BIST based on the pattern clustering is developed. The proposed technique embeds a pre-computed deterministic test set with low hardware overhead for test-per-clock environments. The test control logic is simple and can be synthesized automatically. Experimental results for the ISCAS benchmark circuits show that the effectiveness of the new pattern generator compared to the previous methods.