• 한국군사과학기술학회지
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• 제13권2호
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• pp.336-341
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• 2010

The burning interruption between the initiator and the delay column in a Zr-Ni K1 delay system used for a K510 fuze occurs with long-time storage. About 10 % failure probability of 15-years stored delay systems shows the failure mode in open literature. This paper shows storage lifetime improvement results for the delay system through changing the single-base delay column into double-base ones and controlling the manufacturing processes especially the initial inclusion of humidity. The double-base delay columns was implemented by inserting one delay column of fast burning rates between the initiator and the previous delay column of slow burning rates. Accelerated aging tests of the delay systems with double-base columns, and then the firing tests were performed to evaluate the improved lifetime. The double-base delay columns shows improved storage lifetime of the delay system through preventing the failure mode.

• 한국전기전자재료학회논문지
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• 제22권9호
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• pp.732-736
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• 2009

Protons are irradiated into SOl wafers under total dose of 100 krad, 500 krad, 1 Mrad and 2 Mrad to analyze the irradiation effect. The electrical properties are analyzed by pseudo MOSFET technology after proton irradiation. The wafers are annealed to stabilize generated defects in a nitrogen atmosphere at $300^{\circ}C$ for 1 hour because proton irradiation induces a lot of unstable defects in the surface silicon film. Both negative and positive turn-on voltages are shifted to negative direction after the irradiation. The more proton total dose, the more turn on voltage shifts. It means that positive oxide trap charge is generated in the buried oxide(BOX). The minority carrier lifetime which is analyzed by the drain current transient characteristics decreases with the increase of proton total dose. The proton irradiation makes crystal defects in the silicon film, and consequently, the crystal defects reduce the carrier lifetime and mobility. As these results, it can be concluded that pseudo MOSFET is a useful technology for the analysis of irradiated SOI wafer.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권3호
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• pp.181-187
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• 2017

Purpose: The purpose of this study is to estimate the lifetime of commercial passenger vehicles shock absorber using degradation test and data. Method: The degradation factor of shock absorber was determined to be a damping force using FMEA. Degradation test was performed on damping force under real world usage condition and analysed the degradation data. Results: To estimate the lifetime of shock absorber, a degradation model was developed and a numerical example was provided. Conclusion: Evaluation of the lifetime of commercial and military vehicles shock absorber will be possible by using the proposed degradation analysis method.

• Asian-Australasian Journal of Animal Sciences
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• 제20권5호
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• pp.661-668
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• 2007

Data on 1,037 Nili-Ravi buffaloes from four institutional herds were used to study lifetime milk yield, herd life, productive life and breeding efficiency. A general linear model was used to study the environmental effects while an animal model having herd, year of birth and age at first calving (as covariate) along with random animal effect was used to estimate breeding values. The lifetime milk yield, herd life, productive life and breeding efficiency averaged $7,723{\pm}164$ kg, $3,990{\pm}41$ days, $1,061{\pm}19$ days and 64 percent, respectively. All the traits were significantly (p<0.01) affected by the year of birth and herd of calving, while the herd life was also affected (p<0.01) by the age at first calving. The heritabilities for lifetime milk yield, herd life, productive life and breeding efficiency were $0.093{\pm}0.056$, $0.001{\pm}0.055$, $0.144{\pm}0.079$ and 0.001, respectively. The definition for productive life, where each lactation gets credit upto 10 months had slightly better heritability and may be preferred over the definition where no limit is placed on lactation length. The genetic correlation between productive life and lifetime milk yield was low but high between productive life and herd life. The selection for productive life will increase herd life while lifetime milk yield will also improve. The overall phenotypic trend during the period under the study was negative for lifetime milk yield (-280 kg/year), herd life (-93 days), productive life (-42 days/year) and breeding efficiency (-0.36 percent/year), whereas the genetic trend was positive for lifetime milk yield (+15 kg/year) and productive life (+4 days/year).

• 한국산학기술학회논문지
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• 제16권12호
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• pp.8637-8642
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• 2015

현재 군에 보급되고 있는 접착식 전투화용 고무의 대표적인 노화현상은 열에 의한 정기적인 스트레스 노화가 대표적이다. 본 연구에서는 전투화용 고무의 노화시험을 실시하고, 아레니우스 관계식을 이용하여 노화온도($60^{\circ}C$, $80^{\circ}C$, $100^{\circ}C$)에 따른 반응속도 상수 k를 구하였다. 제품의 수명한계를 인장강도는 30% 감소시점, 신장률은 50% 감소시점, 내마모도는 380%로 가정하였으며, ln($P/P_0$) 및 활성화 에너지와 상수를 고려한 수명예측을 하였다. 이를 통해 노화온도에 영향을 받은 전투화용 고무의 수명을 예측하였고, 그 결과 실온($20^{\circ}C$)에서 예상수명이 10년 이상임을 확인할 수 있었다.

• Tribology and Lubricants
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• 제35권4호
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• pp.222-228
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• 2019

As rubber products such as O-rings, which are also known as packings or toric joints, come in regular, long term contact with liquid fuel, they can eventually swell, become mechanically weakened, and occasionally crack; this diminishes both their usefulness and intrinsic lifetime and could cause leaks during the steady-state flow condition of the fuel. In this study, we evaluate the lifetime of such products through compression set tests of FKM, a family of fluorocarbon elastomer materials defined by the ASTM international standard D141; these materials have great compression, sunlight, and ozone resistance as well as a low gas absorption rate. In this process, O-rings are immersed in the liquid fuel of airtight containers that can be expressed as a compression set, and the liquid fuel leakage in a flow rig tester at variable temperatures over 12 months is investigated. Using the Power Law model, our study determined a theoretical O-ring lifetime of 2,647 years, i.e. a semi-permanent lifespan, by confirming the absence of liquid fuel leakage around the O-ring assembled fittings. These results indicate that the FKM O-rings are significantly compatible for fuel tests to evaluate long-term sealing conditions.

• Journal of Electrical Engineering and Technology
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• 제11권5호
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• pp.1377-1382
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• 2016

• 산업경영시스템학회지
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• 제40권3호
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• pp.92-98
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• 2017

The rapid growth of engineering technology and the emergence of systemized and large-scale engineering systems have resulted in complexity and uncertainty throughout the lifecycle activities of engineering systems. This complex and large-scale engineering system consists of numerous components, but system failure can be caused by failure of any one of a number of components. There is a real difficulty in managing such a complex and large-scale system as a part. In order to efficiently manage the system and have high reliability, it is necessary to structure a system with a complex structure as a sub-system. Also, in the case of a system in which cause of failures exist at the same time, it is required to identify the correlation of the components lifetime and utilize it for the design policy or maintenance activities of the system. Competitive risk theory has been used as a theory based on this concept. In this study, we apply the competitive risk theory to the models with combined structure of series and parallel which is the basic structure of most complex engineering systems. We construct a competing risks model and propose a mathematical model of net lifetime and crude lifetime for each cause of failure, assuming that the components consisting a parallel system are mutually dependent. In addition, based on the constructed model, the correlation of cause of failure is mathematically analyzed and the hazard function is derived by dividing into net lifetime and crude lifetime.

• Nuclear Engineering and Technology
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• 제55권3호
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• pp.919-926
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• 2023

To analyze the cause of the destruction of thin, carbon-backed lithium fluoride targets during a measurement of the fusion of ⁷Li and ¹⁷O, we estimate theoretically the lifetimes of carbon and LiF films due to sputtering, thermal evaporation, and lattice damage and compare them with the lifetime observed in the experiment. Sputtering yields and thermal evaporation rates in carbon and LiF films are too low to play significant roles in the destruction of the targets. We estimate the lifetime of the target due to lattice damage of the carbon backing and the LiF film using a previously reported model. In the experiment, elastically scattered target and beam ions were detected by surface silicon barrier (SSB) detectors so that the product of the beam flux and the target density could be monitored during the experiment. The areas of the targets exposed to different beam intensities and fluences were degraded and then perforated, forming holes with a diameter around the beam spot size. Overall, the target thickness tends to decrease linearly as a function of the beam fluence. However, the thickness also exhibits an increasing interval after SSB counts per beam ion decreases linearly, extending the target lifetime. The lifetime of thin LiF film as determined by lattice damage is calculated for the first time using a lattice damage model, and the calculated lifetime agrees well with the observed target lifetime during the experiment. In experiments using a thin LiF target to induce nuclear reactions, this study suggests methods to predict the lifetime of the LiF film and arrange the experimental plan for maximum efficiency.

• Smart Structures and Systems
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• 제22권2호
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• pp.167-174
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• 2018

Digital input and output modules are widely used to connect digital sensors and actuators to automation systems. Digital I/O modules provide flexible connectivity extension to numerous sensors and actuators and protect systems from high voltages and currents by isolation. Components in digital I/O modules are inevitably affected by operating and environmental conditions, such as high voltage, high current, high temperature, and temperature cycling. Because digital I/O modules transfer signals or isolate the systems from unexpected voltage and current transients, their failures may result in signal transmission failures and damages to sensitive circuitry leading to system malfunction and system shutdown. In this study, the lifetime of optocouplers, one of the critical components in digital I/O modules, was predicted using Bayesian tracking approaches. Accelerated degradation tests were conducted for collecting the critical performance parameter of optocouplers, current transfer ratio (CTR), during their lifetime. Bayesian tracking approaches, including extended Kalman filter and particle filter, were applied to predict the failure. The performance of each prognostic algorithm was then compared using accuracy and robustness-based performance metrics.