• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2007.10a
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• pp.795-798
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• 2007

In this paper, we proposed a simple power allocation scheme to maximize network lifetime. To maximize network lifetime, it is important to allocate power fairly among nodes in a network as well as to minimize total transmitted power. In the proposed scheme, the allocated power is proportional to the residual power and also satisfies the required SNR at destination node. In this paper, we calculate power allocation in "amplify and forward" (AF) model. We evaluated the proposed power allocation scheme using extensive simulation and simulation results show that proposed power allocation obtains much longer network lifetime than the equal power allocation.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.839-842
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• 2009

In this paper, chalcogenide glasses material(Se, Te, Sb) is firstly used as encapsulation layer of OLEDs under high vacuum of $10^{-4}$Pa. In the experiments, properties of OLEDs encapsulated by Se, Te, Sb thin film is compared with that of device encapsulated by traditional method. It is found that Se, Te, Sb film can extend lifetime of devices to 1.4, 2, 1.3 times respectively. Chalcogenide glasses film as encapsulation layer has little effect on some characteristics of device. The research indicated that OLEDs can be well protected upon applying Se, Te, Sb film as encapsulation layer. It is clear that it can prolong the lifetime obviously.

• International Journal of Reliability and Applications
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• v.16 no.1
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• pp.15-26
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• 2015

Present study investigates the fuzzy reliability of some systems using intuitionistic fuzzy Weibull lifetime distribution, in which the lifetime parameters are assumed to be fuzzy parameter due to uncertainty and inaccuracy of data. Expressions for fuzzy reliability, fuzzy mean time to failure, fuzzy hazard function and their ${\alpha}$-cut have been discussed when systems follow intuitionistic fuzzy Weibull lifetime distribution. A numerical example is also taken to illustrate the methodology to calculate the fuzzy reliability characteristics of systems.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.20 no.2
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• pp.101-105
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• 2010

Silicon electrode and ring in a plasma etcher those are in contact with harsh plasma suffer from periodic heating and cooling during their lifetime. This causes the silicon components failure due to thermal stress remaining the persistent slip bands (PSBs) on their surfaces. The factors that determine the lifetime of silicon electrode and ring were discussed with respect to silicon ingot. The impurity level and the average defect concentration measured with glow discharge mass spectrometer (GDMS) and microwave photo-conductance decay (${\mu}$-PCD) were compared with the grade of silicon ingots those are divided to slip-free and slip-allowed ingot. Some silp-allowed samples showed planar defects along <110> direction on {001} surface. The role of these defects was suggested from the viewpoint of the lifetime of silicon components.

• Journal of the Korea Institute of Military Science and Technology
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• v.14 no.5
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• pp.888-896
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• 2011

A white smoke hand grenade, KM8 is used to make smoke screen in order to provide visual field interceptions or signals. The grenade fails when its time to emit smoke is longer than the specified emission time so that the smoke concentration becomes lighter. This paper considered failure in smoke emission time, and evaluated its storage lifetime. The main objective of this paper is to modify the present specification limits of smoke emission time for the efficient process control in manufacturing, through analyzing effect of its specification change on the storage lifetime, based on the lifetime evaluation results. Accelerated degradation test was performed and then failure in smoke emission time was reproduced from the test. And estimated storage lifetimes from the accelerated test results was compared to evaluated lifetimes of grenades using the ASRP data. Past process testing results of the grenade in manufacturing were analyzed in this paper. Then, each storage lifetime for the specifications, ${\pm}3$ and ${\pm}5$ in seconds, extended from the current specification in manufacturing were estimated using the past testing results, and compared to one another.

• Corrosion Science and Technology
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• v.3 no.4
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• pp.161-165
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• 2004

Aluminum source in an Al-Fe coating reacts with molten carbonate and develops a protective $LiAlO_2$ layer on the coating surface during operation of molten carbonate fuel cells (MCFC). However, if aluminum content in an Al-Fe coating decreases to a critical level for some reasons during MCFC operation, a stable and continuous $LiAlO_2$ protective layer can no longer be maintained. The aluminum content in an Al-Fe coating can be depleted by two different processes; one is by corrosion reaction at the surface between the aluminum source in the coating and molten carbonate, and the other is inward-diffusion of aluminum atoms within the coating into a substrate. In these two respects, therefore, the decreasing rate of aluminum concentration in an Al-Fe coating was measured, and then the influences of these two aspects on the lifetime of Al-Fe coating were investigated, respectively.

• Proceedings of the IEEK Conference
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• 2004.06b
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• pp.327-330
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• 2004

It is shown that the hot carrier degradation due to enhanced hot holes trapping dominates PMOSFETs lifetime both in thin and thick devices. Moreover, it is found that in 0.13 ${\mu}m$ CMOSFET the PMOS lifetime under CHC (Channel Hot Carrier) stress is lower than the NMOSFET lifetime under DAHC (Drain Avalanche Hot Carrier) stress. Therefore. the interface trap generation due to enhanced hot hole injection will become a dominant degradation factor. In case of thick MOSFET, the degradation by hot carrier is confirmed using charge pumping current method and highly necessary to enhance overall device lifetime or circuit lifetime in upcoming nano-scale CMOS technology.

• Wind and Structures
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• v.6 no.4
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• pp.307-324
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• 2003

The paper presents results of studies concerning wind-induced aeolian vibration and fatigue of a 110 kV covered conductor overhead line. Self-damping measurement techniques are discussed: power method is found to be the most reliable technique. A method for compensating tension variations during the self-damping test is presented. Generally used empirical self-damping power models are enhanced and the different models are compared with each other. The Energy Balance Analysis (EBR) is used to calculate the aeolian vibration amplitudes, which thereafter are converted to bending stress for the calculation of conductor lifetime estimate. The results of EBA are compared with field measurements, Results indicate that adequate lifetime estimates are produced by EBA as well as field measurements. Generally the EBA gives more conservative lifetime expectancy. This is believed to result from the additional damping existing in true suspension structures not taken into account by EBA. Finally, the correctness of the line design is verified using Cigre's safe design tension approach.

• Management Science and Financial Engineering
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• v.17 no.2
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• pp.39-62
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• 2011

In wireless sensor network, since each sensor is equipped with a limited power, efficient use of the energy is important. One possible network management scheme is to cluster the sensors into several sets, so that the sensors in each of the sets can completely perform the monitoring task. Then the sensors in one set become active to perform the monitoring task and the rest of the sensors switch to a sleep state to save energy. Therefore, we rotate the roles of the active set among the sensors to maximize the network lifetime. In this paper, we suggest an optimal algorithm for the maximum lifetime coverage problem which maximizes the network lifetime. For comparison, we implemented both the heuristic proposed earlier and our algorithm, and executed computational experiments. Our algorithm outperformed the heuristic concerning the obtained network lifetimes, and it found the solutions in a reasonable amount of time.

• The Transactions of the Korean Institute of Power Electronics
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• v.25 no.6
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• pp.496-502
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• 2020

The reliability of a solid-state transformer (SST) is one of the important aspects to consider when replacing a conventional low-frequency passive transformer with SST for urban railway vehicles. Lifetime evaluation of SST in the design phase is therefore essential in guaranteeing a certain SST reliability. In this study, a lifetime evaluation of power semiconductor devices in SST is performed with respect to temperature stress. For a case study, a 3 MW SST with three kinds of power modules (one IGBT module and two SiC-MOSFET modules) is used for the lifetime estimation under the operation profile of urban railway vehicles.