• Title/Summary/Keyword: tap-scan method

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The tap-scan method for damage detection of bridge structures

  • Xiang, Zhihai;Dai, Xiaowei;Zhang, Yao;Lu, Qiuhai
    • Interaction and multiscale mechanics
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    • v.3 no.2
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    • pp.173-191
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    • 2010
  • Damage detection plays a very important role to the maintenance of bridge structures. Traditional damage detection methods are usually based on structural dynamic properties, which are acquired from pre-installed sensors on the bridge. This is not only time-consuming and costly, but also suffers from poor sensitivity to damage if only natural frequencies and mode shapes are concerned in a noisy environment. Recently, the idea of using the dynamic responses of a passing vehicle shows a convenient and economical way for damage detection of bridge structures. Inspired by this new idea and the well-established tap test in the field of non-destructive testing, this paper proposes a new method for obtaining the damage information through the acceleration of a passing vehicle enhanced by a tapping device. Since no finger-print is required of the intact structure, this method can be easily implemented in practice. The logistics of this method is illustrated by a vehicle-bridge interaction model, along with the sensitivity analysis presented in detail. The validity of the method is proved by some numerical examples, and remarks are given concerning the potential implementation of the method as well as the directions for future research.

IEEE 1500 Wrapper and Test Control for Low-Cost SoC Test (저비용 SoC 테스트를 위한 IEEE 1500 래퍼 및 테스트 제어)

  • Yi, Hyun-Bean;Kim, Jin-Kyu;Jung, Tae-Jin;Park, Sung-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.44 no.11
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    • pp.65-73
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    • 2007
  • This paper introduces design-for-test (DFT) techniques for low-cost system-on-chip (SoC) test. We present a Scan-Test method that controls IEEE 1500 wrapper thorough IEEE 1149.1 SoC TAP (Test Access Port) and design an at-speed test clock generator for delay fault test. Test cost can be reduced by using small number of test interface pins and on-chip test clock generator because we can use low-price automated test equipments (ATE). Experimental results evaluate the efficiency of the proposed method and show that the delay fault test of different cores running at different clocks test can be simultaneously achieved.

Development of Bolt Tap Shape Inspection System Using Computer Vision Technology (컴퓨터 비전 기술을 이용한 볼트 탭 형상 검사 시스템 개발)

  • Park, Yang-Jae
    • Journal of Digital Convergence
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    • v.16 no.3
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    • pp.303-309
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    • 2018
  • Computer vision technology is a component inspection to obtain a video image from the camera to the machine to perform the capabilities of the human eye with a field of artificial intelligence, and then analyzed by the algorithm to determine to determine the good and bad of production parts It is widely applied. Shape inspection method was used as how to identify the location of the start point and the end point of the search range, measure the height to the line scan method, in such a manner as to determine the presence or absence of the bolt tabs average brightness of the inspection area in a circular scan type value And the degree of similarity was calculated. The total time it takes to test in the test performance tests of two types of bolts tab enables test 300 min, and demonstrated the accuracy and efficiency of the inspection on the production line represented a complete inspection accuracy.