• International Journal of Concrete Structures and Materials
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• v.7 no.2
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• pp.95-110
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• 2013

We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.

• Journal of the Korean Applied Science and Technology
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• v.25 no.3
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• pp.380-387
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• 2008

The effects of the applied stretch and MgADP binding on the structure of the actin and myosin cross-bridges in rabbit fibers in the rigor state have been investigatedwith improved resolution by x-ray diffraction using synchrotron radiation. To clarify the structure of the ATP hydrolysis intermediates formed by actin and myosin cross-bridges,the effects of various phosphate analogs in the of MgADP on the structure of the thin and thick filaments in glycerinated rabbit muscle fibers in the rigor state investigated by x-ray diffraction with a short exposure time using synchrotron radiation. These results strongly suggest that when MgADP and phosphate analogs such as metallofluorides(BeF3 and AlF4)and vanadate(VO4(Vi)) were added the rigor fibers in the presence of the ATP-depletion backup system, the intensities of the actin-based layer lines were markedly weakened. We found that the intensity of the 14.5 nm-based meridional reflections increase by 20-50% when phosphate analogs such as metallofluorides(BeF3 and AlF4) and vanadate(VO4(Vi)) was added to the rigor muscle.

• Proceedings of the Korean Magnestics Society Conference
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• 2009.12a
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• pp.204-205
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• 2009

The magnetic properties and structure of FeRh thin film pitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380K. Both M-T curve and d-spacing changes correspond to each other very closely.

• Proceedings of the Korea Concrete Institute Conference
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• 2009.05a
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• pp.319-320
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• 2009

The alkali activation products of slag, fly ash C and fly ash F were investigated using compressive strength test and synchrotron x-ray diffraction. We propose that the predominantly amorphous geopolymer formed under ambient conditions is a disordered form of one of the ABC-6 group of zeolites, which includes poly-types such as hydroxycancrinite, hydroxysodalite, chabazite, levyne or fransinite.

• Proceedings of the Korean Radioactive Waste Society Conference
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• 2019.05a
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• pp.149-150
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• 2019

• Nuclear Engineering and Technology
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• v.56 no.1
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• pp.114-122
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• 2024

Irradiation-induced defects and the precipitates in the wrapper material of the Indian Fast Breeder Test Reactor (FBTR), SS 316 are analyzed using the synchrotron source-based Angle Dispersive X-Ray Diffraction (ADXRD) technique with X-rays of energy 17.185 keV (wavelength ~0.72146 Å). The differences and similarities in the high displacement damage samples as a function of dpa (displacement per atom) and dpa rate in the range of 2.9 × 10^-7- 9 × 10^-7 dpa/s are studied. Ferrite and M₂₃C₆ are commonly observed in the present set of high displacement damage 40-74 dpa SS 316 samples irradiated at temperatures in the range of 400-483 ℃. Also, the dislocation density has increased as a function of the irradiation dose. The X-ray diffraction peak profile parameters quantified such as peak shift and asymmetry show that the irradiation-induced defects are sensitive to the dpa rate-irradiation temperature combinations. The increase in yield strength as a function of displacement damage is also correlated to the dislocation density.

• Macromolecular Research
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• v.13 no.2
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• pp.156-161
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• 2005

The thermal transitions of a nylon 6/layered silicate nanocomposite were studied by differential scanning calorimetry and in-situ synchrotron X-ray diffraction. The drawn film of the nylon 6/layered silicate nanocomposite typically showed three endotherms in the DSC thermogram; a very broad endotherm at $\sim120^{\circ}C(T_{1})$, a double-melting endotherm at $\sim215^{\circ}C(T_{2})$, and a high temperature endotherm at $\sim240^{\circ}C(T_{3})$. The drawn film of the nylon 6/ layered silicate nanocomposite was comprised of a mixture of the $\alpha and \gamma$ forms, with $the \alpha form$ being generated by drawing the pressed film having $the \gamma form$. The melting and crystallization of the crystals were observed at the above thermal transitions during the heating experiment performed at the Pohang X-ray synchrotron radiation source (4C2). The newly generated form was meta-stable and melted $at {\sim}T_{1}$. The double-melting $at {\sim}T_{2}$ was due to the exothermic crystallization of $the \alpha form$ during the main endothermic melting of $the \gamma form$. $The \alpha form$ crystallized $at {\sim}T_{2}$ and melted $at {\sim}T_{3}$.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Journal of the Korean institute of surface engineering
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• v.29 no.5
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• pp.399-406
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• 1996

The orientational cross-over phenomena in an RF sputtering growth of TiN films were studied in an in-situ, real-time synchrotron x-ray scattering experiment. For the films grown with pure Ar sputtering gas, the cross-over from the more strained (002)-oriented grains to the less strained (111)-oriented grains occurred as the film thickness was increased. As the sputtering power was increased, the cross-over thickness, at which the growth orientation changes from the <002> to the <111> direction, was decreased. The addition of $N_2$ besides Ar as sputtering gas suppressed the cross-over, and consequently resulted in the (002) preferred orientation without exhibiting the cross-over. We attribute the observed cross-over phenomena to the competition between the surface and the strain energy. The x-ray powder diffraction, the x-ray reflectivity, and the ex-situ AFM surface topology study consistently suggest that the microscopic growth front was in fact always the (002) planes. In the initial stage of growth, the (002) planes were aligned to the substrate surface to minimize the surface energy. At later stages, however, the (002) growth front tilted away from the surface by about $60^{\circ}$ to relax the strain, which caused the cross-over of the preferred growth direction to the <111> direction.

• Bulletin of the Korean Chemical Society
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• v.31 no.2
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• pp.497-499
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• 2010