• Transactions of the Society of Information Storage Systems
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• v.1 no.1
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• pp.1-22
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• 2005

There are two important trends in the modern information society, including digital networking and ubiquitous environment. Thus it is strongly required to develop new information storage devices such as high density storages to match the increased data capacity and small size storage devices to be applied to the mobile multimedia electronics. So far, many approaches have been studied for the high density memory, including the holographic memory, super-RENS and near-field recording using solid immersion lens (SIL) or nano-probe for the ODD (Optical Disk Drive) system, and the perpendicular magnetic recording and heat-assisted magnetic recording for the HDD (Hard Disk Drive) system. In addition, new mobile storage devices have been prepared using 0.85" HDD and 30mm ODD systems from a lot of foreign and domestic companies and institutes. In this paper, the recent technology trend for the next generation information storage system is summarized to offer a research motivation and encouragement to new researchers in this field with an emphasis on the technical issues of the increase of data capacity and decrease of device size.

• Transactions of the Society of Information Storage Systems
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• v.3 no.2
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• pp.54-58
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• 2007

Using metal/Si materials as a recording layer, we have achieved good results for a SR disc (super resolution disc). Mainly by controlling metal composition and the ratio of metal to Si of recording layer, signal qualities were greatly enhanced. At the mark length of 75nm, the best CNR (Carrier to Noise Ratio) was about 45dB. Write power was reduced down to about 6.5mW. LFN (Low Frequency Noise) could also be reduced down to 14dB. Single tone pattern jitters for every mark whose length is from 2T through 8T were achieved to be below 10%. The readout signal was stable sustaining CNR>40dB during about 15,000 times reading. The so-called "3T-problem" could be avoided.

• Korean Journal of Optics and Photonics
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• v.18 no.5
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• pp.351-361
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• 2007

The samples composed of a GST thin film and the protective layers of $ZnS-SiO_2$ or $Al_2O_3$ coated on c-Si substrate were prepared by using the magnetron sputtering method. Samples of three different structures were prepared, that is, i) the GST single film on c-Si substrate, ii) the GST film sandwiched by the protective $ZnS-SiO_2$ layers on c-Si substrate, and iii) the GST film sandwiched by $Al_2O_3$ protective layers on c-Si substrate. The ellipsometric constants in the temperature range from room temperature to $700^{\circ}C$ were obtained by using the in-situ ellipsometer equipped with a conventional heating chamber. The measured ellipsometric constants show strong variations versus temperature. The variation of ellipsometric constants at the temperature region higher than $300^{\circ}C$ shows different behaviors as the ambient medium is changed from in air to in vacuum or the protective layers are changed from $ZnS-SiO_2$ to $Al_2O_3$. Since the long heating time of 1-2 hours is believed to be the origin of the high temperature variation of ellipsometric constants upon the heating environment and the protective layers, a PRAM (Phase-Change Random Access Memory) recorder is introduced to reduce the heating time drastically. By using the PRAM recorder, the GST samples are heated up to $700^{\circ}C$ decomposed preventing its partial evaporation or chemical reactions with adjacent protective layers. The surface image obtained by SEM and the surface micro-roughness verified by AFM also confirmed that samples prepared by the PRAM recorder have smoother surface than the samples prepared by using the conventional heater.