• Title/Summary/Keyword: spectroscopic

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Spectroscopic observation of the massive high-z (z=1.48) galaxy cluster SPT-CL J2040-4451 using Gemini Multi-Object Spectrographs

  • Kim, Jinhyub;Jee, Myungkook J.;Kim, Seojin F.;Ko, Jongwan
    • The Bulletin of The Korean Astronomical Society
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    • v.44 no.1
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    • pp.74.2-74.2
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    • 2019
  • Mass measurement of high-redshift galaxy clusters with high accuracy is important in constraining cosmological parameters. Extremely massive clusters at high redshift may impose a serious tension with the current ΛCDM paradigm. SPT-CL J2040-4451 at z=1.48 is considered one such case given its redshift and mass estimate inferred from the SZ data. The system has also been confirmed to be indeed massive from a recent weak-lensing (WL) analysis. Comparison of the WL mass with the spectroscopic result may provide invaluable information on the dynamical stage of the system. However, the existing spectroscopic coverage of the cluster is extremely poor; only 6 blue star-forming galaxies have been found within the virial radius, which results in highly inflated and biased velocity dispersion. In this work, we present a spectroscopic analysis of the member candidates using Gemini Multi-Object Spectrographs (GMOS) observation in Gemini South. The observation was designed to find early-type member galaxies within the virial radius and to obtain reliable velocity dispersion. We explain our selection scheme and preliminary results of the spectra. We also compare the dynamical mass estimate inferred from the velocity dispersion with the WL mass.

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Study of Stray-light Analysis and Suppression Methods for the Spectroscopic System of a Solar-radiation Observer Instrument

  • Zheng, Ru;Liu, Bo;Wang, Lingyun;Gao, Yue;Li, Guangxi;Li, Changyu
    • Current Optics and Photonics
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    • v.5 no.3
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    • pp.220-228
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    • 2021
  • To improve the measurement accuracy of a solar-radiation observer instrument, aiming at the problem of multiorder-stray-light interference caused by the diffraction of the flat-field concave grating in the spectroscopic system, straylight suppression methods for different forms of optical traps are studied. According to the grating surface-scattering distribution-function model, the bidirectional scattering distribution function (BSDF) of a dust-polluted surface and the flat-field concave grating's transition area of the spectroscopic system is calculated, and a Lyot stop with blade baffle is designed to suppress this kind of stray light. For diffraction multiorder stray light, based on the theory of light-energy transmission, a design for precise positioning of the trench optical trap is proposed. The superiority of the method is verified through simulation and actual measurement. The simulation results show that in a spectroscopic system approximately 160 mm × 140 mm × 80 mm in size, the energy of the stray light is reduced by one order of magnitude by means of the trench optical trap and Lyot stop, and the number of beams is reduced from 5664 to 1040. The actual measurements show that the stray-light-suppression efficiency is about 69.4%, which is effective reduction of the amount of stray light.

HIGH RESOLUTION SPECTROSCOPIC STUDY OF SYMBIOTIC STAR AG DRACONIS

  • KIM, SOO HYUN;YOON, TAE SEOG;OH, HYUNG-IL
    • Publications of The Korean Astronomical Society
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    • v.37 no.2
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    • pp.13-31
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    • 2022
  • We observed the symbiotic star AG Dra for a total of 61 nights between April 2004 and December 2021 using the 1.8-m telescope and the high-resolution Echelle spectrograph BOES at the Bohyunsan Optical Astronomy Observatory and obtained 355 frames of spectroscopic data to investigate the variations in its spectral lines. Overnight short-term and long-term changes in prominent emission lines are examined. No short-term changes are found in the line profiles. However, the peak intensity of the Hα emission line exhibits very small variation. In the long-term period, many emission lines including He I λ5875, λ6678, λ7065 and Fe II λ5018 are found to vary reflecting the symbiotic outburst activities. It is noted that He II λ4686 and Raman-scattered O VI λ6830, λ7088 are exceptions, where no significant variations are discernible. One of the noticeable lines is the λ5018 line. Its appearance and disappearance pattern are different from other emission lines, and the line is found to appear in outburst states. The Hα and Hβ lines remain very similar in our spectroscopic monitoring campaign.

Physiological and Spectroscopic Changes of Rice by Nitrogen Fertilization Conditions

  • Jung-Il Cho;Dongwon Kwon;Hoejeong Jeong;Wan-Gyu Sang;Sungyul Chang;Jae-Kyeong Baek
    • Proceedings of the Korean Society of Crop Science Conference
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    • 2022.10a
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    • pp.106-106
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    • 2022
  • An appropriate amount of nitrogen fertilizer input during rice cultivation is essential for rice growth, quality control, and reduction of greenhouse gases in paddy fields. Therefore, it is necessary to develop a technology that can check whether an appropriate amount of fertilizer is applied in paddy fields. In this study, we tried to derive a method for diagnosing nitrogen fertilization level using spectroscopic diagnosis, physiological analysis, and molecular indicator genes. Nitrogen fertilization treatment was performed in a greenhouse by dividing into five treatment conditions: no fertilization (N0), low fertilization (N0.5), standard fertilization (N1.0), excessive fertilization (N1.5), and double fertilization (N2.0), respectively. Growth characteristics analysis was investigated by nitrogen fertilization conditions and growth stages, and the height of the canopy was analyzed using a laser scanner. Physiological and spectroscopic analyses were performed by analyzing chlorophyll and sugar contents and measuring SPAD and leaf spectrometer on rice leaves. In addition, real-time PCR experiment was performed to check the relative expression levels of several known nitrogen metabolism related genes. These results suggest that spectroscopic techniques can be helpful in diagnosing the level of nitrogen fertilization in rice paddy fields.

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Accuracy Enhancement of Dynamic Spectroscopic Polarimetry (일체형 분광편광간섭모듈 기반 분광타원편광계의 정확도 향상)

  • Gukhyeon Hwang;Junbo Shim;Inho Choi;Sukhyun Choi;Saeid Kheiryzadehkhanghah;Daesuk Kim
    • Journal of the Semiconductor & Display Technology
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    • v.22 no.3
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    • pp.90-95
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    • 2023
  • We describe an optimal alignment method for improving accuracy of dynamic spectroscopic polarimeter based on monolithic polarizing interferometer. The dynamic spectroscopic polarimeter enables real-time measurements of spectral ellipsometric parameters by using a spectral carrier frequency concept. However, the non-polarizing beam splitter used in the monolithic polarizing interferometer cannot maintain the polarization state perfectly due to phase retardation caused by optical anisotropic characteristics of the non-polarizing beam splitter, resulting in degraded measurement accuracy. The effect of the beam splitter can be minimized through optimal alignment of the polarizers used in the polarizing interferometer and the analyzer. We demonstrate how much the proposed alignment method can enhance the measurement accuracy by comparing with previous alignment approach.

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A Novel Analysis Of Amorphous/Crystalline Silicon Heterojunction Solar Cells Using Spectroscopic Ellipsometer (Spectroscopic Ellipsometer를 이용한 a-Si:H/c-Si 이종접합 태양전지 박막 분석)

  • Ji, Kwang-Sun;Eo, Young-Ju;Kim, Bum-Sung;Lee, Heon-Min;Lee, Don-Hee
    • New & Renewable Energy
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    • v.4 no.2
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    • pp.68-73
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    • 2008
  • It is very important that constitution of good hetero-junction interface with a high quality amorphous silicon thin films on very cleaned c-Si wafer for making high efficiency hetero-junction solar cells. For achieving the high efficiency solar cells, the inspection and management of c-Si wafer surface conditions are essential subjects. In this experiment, we analyzed the c-Si wafer surface very sensitively using Spectroscopic Ellipsometer for < ${\varepsilon}2$ > and u-PCD for effective carrier life time, so we accomplished < ${\varepsilon}2$ > value 43.02 at 4.25eV by optimizing the cleaning process which is representative of c-Si wafer surface conditions very well. We carried out that the deposition of high quality hydrogenated silicon amorphous thin films by RF-PECVD systems having high density and low crystallinity which are results of effective medium approximation modeling and fitting using spectroscopic ellipsometer. We reached the cell efficiency 12.67% and 14.30% on flat and textured CZ c-Si wafer each under AM1.5G irradiation, adopting the optimized cleaning and deposition conditions that we made. As a result, we confirmed that spectroscopic ellipsometry is very useful analyzing methode for hetero-junction solar cells which need to very thin and high quality multi layer structure.

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Optical Constants and Dispersion Parameters of CdS Thin Film Prepared by Chemical Bath Deposition

  • Park, Wug-Dong
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.4
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    • pp.196-199
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    • 2012
  • CdS thin film was prepared on glass substrate by chemical bath deposition in an alkaline solution. The optical properties of CdS thin film were investigated using spectroscopic ellipsometry. The real (${\varepsilon}_1$) and imaginary (${\varepsilon}_2$) parts of the complex dielectric function ${\varepsilon}(E)={\varepsilon}_1(E)+i{\varepsilon}_2(E)$, the refractive index n(E), and the extinction coefficient k(E) of CdS thin film were obtained from spectroscopic ellipsometry. The normal-incidence reflectivity R(E) and absorption coefficient ${\alpha}(E)$ of CdS thin film were obtained using the refractive index and extinction coefficient. The critical points $E_0$ and $E_1$ of CdS thin film were shown in spectra of the dielectric function and optical constants of refractive index, extinction coefficient, normal-incidence reflectivity, and absorption coefficient. The dispersion of refractive index was analyzed by the Wemple-DiDomenico single-oscillator model.

Globular clusters with multiple red giant branches: Low-resolution spectroscopy

  • Lim, Dongwook;Lee, Young-Wook;Roh, Dong-Goo;Han, Sang-Il
    • The Bulletin of The Korean Astronomical Society
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    • v.38 no.2
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    • pp.74.2-74.2
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    • 2013
  • Recent spectroscopic observations have provided evidences for the multiple stellar populations having different abundances in some massive globular clusters (GCs). In particular, some of these GCs show clear separations of red giant-branches (RGBs) in calcium narrow band photometry. In order to confirm the differences in heavy element abundances and radial velocities among multiple RGBs, we have performed the low-resolution spectroscopy for the RGB stars in these GCs. The spectral data were taken from the multi-object spectroscopic mode with WFCCD mounted on the du Pont 2.5m telescope in Las Campanas Observatory. In this talk, we will present our progress in the spectroscopic analysis of the RGB stars in these GCs.

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Integral Field Spectroscopic Data Reduction Method for High Resolution Infrared Observation

  • Lee, Sung-Ho;Pak, Soo-Jong;Choi, Min-Ho
    • Journal of Astronomy and Space Sciences
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    • v.27 no.4
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    • pp.309-318
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    • 2010
  • We introduce a technical approach for reducing three-dimensional infrared (IR) spectroscopic data generated by integral field spectroscopy or slit-scanning observations. The first part of data reduction using IRAF presents a guideline for processing spectral images from long-slit IR spectroscopy. Multichannel image reconstruction, Image Analysis and Display (MIRIAD) is used in the later part to construct and analyze the data cubes which contain spatial and kinematic information of the objects. This technic has been applied to a sample data set of diffuse 2.1218 ${\mu}m$ $H_2$ 1-0 S(1) emission features observed by slit-scanning around Sgr A East in the Galactic center. Details of image processing for the high-dispersion infrared data are described to suggest a sequence of contamination cleaning and distortion correction. Practical solutions for handling data cubes are presented for survey observations with various configurations of slit positioning.

A NEW ALTERNATIVE ELLIPTIC PDE IN EIT IMAGING

  • Kim, Sungwhan
    • Bulletin of the Korean Mathematical Society
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    • v.49 no.6
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    • pp.1291-1302
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    • 2012
  • In this paper, we introduce a new elliptic PDE: $$\{{\nabla}{\cdot}\(\frac{|{\gamma}^{\omega}(r)|^2}{\sigma}{\nabla}v_{\omega}(r)\)=0,\;r{\in}{\Omega},\\v_{\omega}(r)=f(r),\;r{\in}{\partial}{\Omega},$$ where ${\gamma}^{\omega}={\sigma}+i{\omega}{\epsilon}$ is the admittivity distribution of the conducting material ${\Omega}$ and it is shown that the introduced elliptic PDE can replace the standard elliptic PDE with conductivity coefficient in EIT imaging. Indeed, letting $v_0$ be the solution to the standard elliptic PDE with conductivity coefficient, the solution $v_{\omega}$ is quite close to the solution $v_0$ and can show spectroscopic properties of the conducting object ${\Omega}$ unlike $v_0$. In particular, the potential $v_{\omega}$ can be used in detecting a thin low-conducting anomaly located in ${\Omega}$ since the spectroscopic change of the Neumann data of $v_{\omega}$ is inversely proportional to thickness of the thin anomaly.