Reverse recovery and other electrical properties of an electron-irradiated silicon $p^--n^-$ junction diode
(전자 조사된 실리콘 $p^--n^-$ 접합 다이오드의 transient 거동)
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- Proceedings of the Materials Research Society of Korea Conference
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- 2003.03a
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- pp.118-118
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- 2003