• Korean Journal of Optics and Photonics
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• v.13 no.1
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• pp.51-57
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• 2002

We have calculated the optimum refractive index and normalized thickness of a single layer antireflection coating on the facet of buried channel waveguides as a function of waveguide width for several waveguide depths using the angular spectrum method and field profiles obtained by the effective index method (EIM) and the variational method (VM), respectively, and discussed the results. In the area of large waveguide width, the optimum parameters of a single layer antireflection coating obtained by both methods are almost the same. However, as waveguide width decreases, the parameters obtained by the VM approach those of a single layer antireflection coating between cladding layer and air, while those obtained by the EIM do not approach those, and the difference between the two parameters is large. The tolerance maps of the quasi-TE and quasi-TM modes obtained by the VM for square waveguides are located in almost the same area regardless of refractive index contrast, while those obtained by the free space radiation mode (FSRM) method for refractive index contrast of 10% are located in the different area. Thus, we think that the tolerance maps obtained by the VM are more exact than those obtained by the FSRM method.