• Title/Summary/Keyword: scattering layer

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Studies on Depletion Layer of Probe Particles in the System of Poly(vinyl acetate)/Dimethyl Sulfoxide by Dynamic Light Scattering (폴리(비닐 아세테이트)/디메틸설폭사이드 계에서 동적 광산란법에 의한 탐침입자의 배제층 연구)

  • Jeon, Guk Jin;Jang, Jinho;Park, Il Hyun
    • Polymer(Korea)
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    • v.39 no.3
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    • pp.370-381
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    • 2015
  • In the system of poly(vinyl alcohol) (PVA)/dimethyl sulfoxide, the refractive index of polymer was very well matched to that of solvent and thus its scattered intensity could be minimized. After adding small amount of polystyrene latex particle (nominal diameter 200 nm), diffusion behavior of only probe particle was investigated against the concentration of polymer matrix by means of dynamic light scattering. The polymer concentration dependence of its reduced diffusion coefficient was able to be analysed with the stretched exponential function of the reduced concentration $C[{\eta}]$. In very dilute concentration regime, the depletion layer kept constant but at the early semi-dilute regime of $1{\leq}C[{\eta}]{\leq}2.5$, the concentration-dependent exponent of depletion layer ${\delta}$ was appeared to be -0.8 which was very close to theoretical one of -0.85. However it was also observed at the higher concentration that its layer thickness decreased more abruptly than theoretical expectation and this phenomenon was ascribed to Oosawa type attractive interaction between adjacent latex particles.

Analysis of H-polarized Electromagnetic Scattering by a Conductive Strip Grating Between a Grounded Double Dielectric Layer Using FGMM (FGMM을 이용한 접지된 2중 유전체층 사이의 완전도체띠 격자구조에 의한 H-분극 전자파 산란 해석)

  • Yoon, Uei-Joong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.20 no.1
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    • pp.83-88
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    • 2020
  • In this paper, H-polarized electromagnetic scattering problems by a conductive strip grating between a grounded double dielectric layer are analyzed by applying the FGMM(Fourier-Galerkin Moment Method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the grounded double dielectric layers, and incident angles. Generally, as the value of the dielectric constant and dielectric thickness of a grounded double dielectric layer increases, the reflected power increased. And as dielectric thickness of a grounded double dielectric layer increases, the current density induced in the strip center increases. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers using the PMM(Point Matching Method).

A Study on TM Scattering by a Conductive Strip Grating Between a Double Dielectric Layer (2중 유전체층 사이의 완전도체띠 격자구조에 의한 TM 산란에 관한 연구)

  • Yoon, Uei-Joong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.18 no.2
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    • pp.73-79
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    • 2018
  • In this paper, TM(transverse magnetic) scattering problems by a conductive strip grating between a double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition is applied to analysis of the conductive strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. Generally, in the case of numerical analysis except for reflection and transmission power in free space, as the dielectric constants of the double dielectric layer increases, the reflected power increases and the transmitted power decreases relatively, respectively. The numerical results for the presented structure of this paper having a grounded double dielectric layer are shown in good agreement compared to those of the existing papers.

Measurement of Polymer Chain Depletion Layer in the Poly(vinyl alcohol)/Dimethyl Sulfoxide/Polystyrene Latex System by Dynamic Light Scattering (동적 광산란법에 의한 폴리(비닐 알코올)/디메틸설폭사이드/폴리스티렌 라텍스 계에서의 고분자 사슬 배제층 측정)

  • Eom, Hyo-Sang;Park, Il-Hyun
    • Polymer(Korea)
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    • v.36 no.5
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    • pp.628-636
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    • 2012
  • The polymer concentration dependence of depletion layer was investigated by means of dynamic light scattering after the very small amount of polystyrene spherical latex particles was added into the matrix solution of poly(vinyl alcohol)(PVA)/dimethyl sulfoxide. At the dilute regime, the magnitude of depletion layer kept constant at the level of $63{\pm}3%$ of the radius of gyration of the corresponding PVA chain. Next, at the early semi-dilute regime of $1.5{\leq}C[{\eta}]{\leq}3$, polymer concentration dependence of the layer thickness ${\delta}$ was obtained as ${\delta}{\sim}C^{-0.8}$, and this experimental value was very close to theoretical one of -0.75. However it was observed above $C[{\eta}]$ >3 that its thickness decreased abruptly, and this was ascribed to aggregation effect of latex particles which was driven by Oosawa type attractive interaction.

A Study on TM Scattering by a Resistive Strip Grating Between a Double Dielectric Layer (2중 유전체층 사이의 저항띠 격자구조에 의한 TM 산란에 관한 연구)

  • Yoon, Uei-Joong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.21 no.1
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    • pp.49-54
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    • 2021
  • In this paper, n this paper, E-polarized electromagnetic scattering problems by a resistive strip grating between a double dielectric layer are analyzed by applying the PMM(Point Matching Method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, and the resistive boundary condition is applied to analysis of the resistive strip. The numerical results for the normalized reflected and transmitted power are analyzed by according as the relative permittivity and thickness of the double dielectric layers, and the resistivity of resistive strip. Overall, when the resistivity of the resistive strip decreased or the relative permittivity of the dielectric layer increased, the reflected power increased, and as the reflected power increased, the transmitted power decreased relatively. Especially, as the relative permittivity of double dielectric layer increases, the minimum value of the variation curve of the reflected power shifted in the direction that the grating period decreased. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers.

A Study on H-polarized Electromagnetic Scattering by a Resistive Strip Grating Between a Grounded Double Dielectric Layer (접지된 2중 유전체층 사이의 저항띠 격자구조에 의한 H-polarized 전자파 산란에 관한 연구)

  • Yoon, Uei-Joong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.22 no.1
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    • pp.29-34
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    • 2022
  • In this paper, thr H-polarized scattering problems by a resistive strip grating in a grounded double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. The %error of the convergence of the reflected power according to the relative permittivity of the dielectric layer and the size of the number of rows in the square matrix was compared, as the size of the number of rows in the square matrix increased, the accuracy of the reflected power increased. As the resistivity of the resistive strip decreased, the thickness of the dielectric layers decreased, and the relative permittivity of the dielectric layers increased, the reflected power increased. The numerical results for the presented structure of this paper having a grounded double dielectric layer are shown in good agreement compared to those of the existing papers.

Effect of surface roughness onto the scattering in low loss mirrors (기판의 표면거칠기와 반사경 산란에 대한 연구)

  • 조현주;신명진;이재철
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.209-214
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    • 2002
  • The effect of surface roughness on mirror scattering has been studied. Five kinds of substrates with different surface roughness were fabricated. On those substrates, a dielectric multi-layer coating with high reflectivity was deposited by ion beam sputtering and electron beam evaporation. A total integrated scattering measurement set-up was built for the evaluation of deposited samples. Most of the ion beam sputtered mirrors showed lower scattering than the electron beam evaporated one, which deposited on substrates similar in surface roughness. Over ~2 $\AA$ in surface roughness, scattering strongly depend on the micro-structure of the super-polished surface. The lowest scattering we have achieved is 2.06 ppm by ion beam sputtering from the substrate with surface roughness of 0.23 $\AA$.

Acoustic Scattering Layers in the East China Sea ( 2 ) -Vertical Distribution of Volume Scattering Strength- (동지나해의 초음파 산란층에 관한 연구 ( 2 ) -체적산란강도의 연직분포-)

  • 이대재
    • Journal of the Korean Society of Fisheries and Ocean Technology
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    • v.26 no.1
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    • pp.20-25
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    • 1990
  • During the summer of 1989, the authors carried out the hydroacoustic surverys to investigate the vertical distribution of volume backscattering strength in the East China Sea and simultaneously the biological sampling of the scattering layers by bottom trawling. The echoes from the scattering layers was continuously measured by using a 50 kHz echo sounder during the day and night. A data acquisition system was used to record digitally the envelope of the echoes and the echo integration technique was used to determine the scattering strength proportional to biomass density in each layer. The vertical profiles of volume backscattering strength also were compared with the one of water temperature. The results obtained can be summarized as follows: 1. The vertical profiles of mean volume backscattering strength at day and night suggested that during the night the biggest fish concentrations appeared in the mixed layer above the thermocline and during the day near the bottom. In another profiles where the thermocline was not well developed, peaks in scattering appeared at midwater depths and near the bottom. 2. The maximum values of mean volume backscattering strengths varied from -49.3 dB to -48.0 dB on different regions and at different times of the day and night. 3. Trawl data indicated that the organisms consisting of the scattering layer near the bottom were squid and various species of demersal fishes.

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Temperature and the Interfacial Buffer Layer Effects on the Nanostructure in the Copper (II) Phthalocyanine: Fullerene Bulk Heterojunction

  • Kim, Hyo Jung;Kim, Jang-Joo;Jeon, Taeyeol;Kong, Ki Won;Lee, Hyun Hwi
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.275.1-275.1
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    • 2014
  • The effects of the interfacial buffer layer and temperature on the organic bulk heterojunction (BHJ) nanostructures of copper phthalocyanine (CuPc) and fullerene (C60) systems were investigated using real time in-situ x-ray scattering. In the CuPc:C60 BHJ structures, standing-on configured ${\gamma}$-CuPc phase was formed by co-deposition of CuPc and C60. Once formed ${\gamma}$-phase was thermally stable during the annealing upon $180^{\circ}C$. Meanwhile, the insertion of CuI buffer layer prior to deposition of the CuPc:C60 BHJ layer induced lying-down configured CuPc crystals in the BHJ layer. The lying CuPc peak intensity and the lattice parameter were increased by the thermal annealing. This increment of the intensity seemed to be related to the strain at the interface between CuPc:C60 and CuI, which was proportional to the enhancement of the power conversion efficiency of the device.

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