• Korean Journal of Remote Sensing
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• v.27 no.2
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• pp.131-140
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• 2011

In this study, temporal variations of the Advanced Microwave Scanning Radiometer E (AMSR-E) soil moisture products were evaluated using ground based measurements from the Haenam flux monitoring network site for two years (2004 and 2006). Even if there were major comparison issues including spatial resolutions, AMSR-E soil moisture production showed a great potential to replicate temporal variability patterns with ground based measurements. Additional intensive validation efforts should be conducted at a variety of field conditions including vegetation type for better utilization of remotely sensed soil moisture and understanding of the land surface-atmosphere interactions in the view of hydrometeorology.

• Imaging Science in Dentistry
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• v.34 no.3
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• pp.151-157
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• 2004

Purpose : To evaluate the quantitative accuracy of three-dimensional (3D) images by means of comparing distance measurements on the 3D images with direct measurements of dry human skull according to slice thickness and scanning modes. Materials and Mathods : An observer directly measured the distance of 21 line items between 12 orthodontic landmarks on the skull surface using a digital vernier caliper and each was repeated five times. The dry human skull was scanned with a Helical CT with various slice thickness (3, 5, 7 mm) and acquisition modes (Conventional and Helical). The same observer measured corresponding distance of the same items on reconstructed 3D images with the internal program of V-works 4.0/sup TM/(Cybermed Inc., Seoul, Korea). The quantitative accuracy of distance measurements were statistically evaluated with Wilcoxons' two-sample test. Results: 11 line items in Conventional 3 mm, 8 in Helical 3mm, 11 in Conventional 5mm, 10 in Helical 5mm, 5 in Conventional 7mm and 9 in Helical 7mm showed no statistically significant difference. Average difference between direct measurements and measurements on 3D CT images was within 2mm in 19 line items of Conventional 3mm, 20 of Helical 3mm, 15 of Conventional 5mm, 18 of Helical 5mm, II of Conventional 7mm and 16 of Helical 7mm. Conclusion: Considering image quality and patient's exposure time, scanning protocol of Helical 5mm is recommended for 3D image analysis of the skull in CT.

• Journal of Technologic Dentistry
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• v.36 no.2
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• pp.91-96
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• 2014

Purpose: The purpose of this study was evaluate the validity of polyurethane model fabricated by intra oral scanning method. Methods: Ten sam cases of stone models were manufactured from master model, and polyurethane models were made with the intra oral scanning and CNC milling method. One examiner individually measured 6 distances(intercanine distance, intermolar distance, two dental arch lengths(right, left) and two diagonal of dental arch lengths(right, left) on the stone models and the polyurethane models. The Mann-Whitney U test(${\alpha}$=0.05) were used for statistical analysis. Results: The mean difference between measurements made directly on the stone models and those made on the polyurethane models was 0.31-0.38mm. No statistically differences between the two groups were founded 4 distances(p>0.05), but 2 distances were statistically significant(p<0.05). Conclusion: Stone models showed larger than polyurethane models fabricated by intra oral scanning method.

• Journal of the Optical Society of Korea
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• v.18 no.5
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• pp.531-537
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• 2014

Through-silicon vias (TSVs) are fine, deep holes fabricated for connecting vertically stacked wafers during three-dimensional packaging of semiconductors. Measurement of the TSV geometry is very important because TSVs that are not manufactured as designed can cause many problems, and measuring the critical dimension (CD) of TSVs becomes more and more important, along with depth measurement. Applying white-light scanning interferometry to TSV measurement, especially the bottom CD measurement, is difficult due to the attenuation of light around the edge of the bottom of the hole when using a low numerical aperture. In this paper we propose and demonstrate four bottom CD measurement methods for TSVs: the cross section method, profile analysis method, tomographic image analysis method, and the two-dimensional Gaussian fitting method. To verify and demonstrate these methods, a practical TSV sample with a high aspect ratio of 11.2 is prepared and tested. The results from the proposed measurement methods using white-light scanning interferometry are compared to results from scanning electron microscope (SEM) measurements. The accuracy is highest for the cross section method, with an error of 3.5%, while a relative repeatability of 3.2% is achieved by the two-dimensional Gaussian fitting method.

• Proceedings of the Optical Society of Korea Conference
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• 2006.07a
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• pp.39-40
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• 2006

Digital image-projection and several modifications are the classical applications of Digital Micromirror Devices (DMD), however further applications in the field of optical metrology are also available. Operated with certain patterns, a DMD can function, for instance, as an array of pinholes that may substitute the Galvanic mirror or the stage scanning system presently used for 2 dimensional scanning in confocal microscopes. The various process parameters that influence the result of measurement (e.g. pinhole size, lateral scanning pitch and the number of pinholes used simultaneously, etc.) should be configured precisely for individual measurements by appropriately operating the DMD. This paper presents suitable conditions for the diffraction limited analysis between DMD-optics-CCD to achieve the best performance. Also sampling theorem that is necessary for the image acquisition by scanning system is simulated with OPTISCAN which is the simulator based on the diffraction theory.

• Journal of the Korean Society of Costume
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• v.65 no.2
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• pp.157-175
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• 2015

The study was aimed to develop a torso-type dress form representing body features of the female fashion models in Korea. To fulfill this purpose, 5 female fashion models aged between 20 and 26 having the average body measurements of professional fashion models in Korea were selected and their 3-D whole body scanned data were analysed. The 3-D whole body scanning method enabled to generate a virtual female fashion model within the CAD system by measuring the subjects' body shapes and sizes. In addition, the virtual model's body data led the development of a standard female fashion model dress form for the efficient fashion show preparation. In order to manufacture the real dress form for female fashion models, 3-D printing technology was adopted. The consequent results are as follows: (1) the body measurements (unit: cm) of the developed dress form were: biacromion length, 36.0, bust point to bust point, 16.6, front/back interscye lengths, 32.0/33.0, neck point to breast point, 26.0, neck point to breast point to waist line, 41.5, waist front/back lengths, 34.5/38.5, waist to hip length, 24.0, bust circumference, 85.0, underbust circumference, 75.0, waist circumference, 65.0, hip circumference, 92.0. (2) the body measurements differences between the developed and existing dress forms were highlighted with the body measurements of neck point to breast point and waist to hip length. (3) the body shape features of the developed dress form showed that bust, shoulder blade, shoulder slope, abdomen and back waist line to hip line parts were more realistically manufactured.

• Journal of the Korean Society for Precision Engineering
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• v.31 no.11
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• pp.999-1006
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• 2014

In this investigation, we explain the sub-sampling technique of white light scanning interferometry (WLSI) to improve the measurement speed. In addition to the previous work using Fourier domain analysis, several methods to extract the height from the correlogram of WLSI are described with the sub-sampling technique. Especially, Fourier-inverse Fourier transformation method adopting sub-sampling technique is proposed and the phase compensation technique is verified with simulation and experiments. The main advantage of sub-sampling is to speed up the measurements of WLSI but the precision such as repeatability is slightly poor. In case of measuring the sample which has high height step or difference, the proposed technique can be widely used to reduce the measurement time.

• Journal of the Korean Society for Nondestructive Testing
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• v.14 no.3
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• pp.157-171
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• 1994

A scanning tunneling microscope has been built, which can resolve atomic arrangements of conductors and semiconductors in ultra high vacuum below $10^{-11}$ Torr. Its background and operational principles are reviewed and the guide lines in building the scanning tunneling microscope are shown. The results of measurements for highly oriented pyrolytic graphite and Si(111) surface are presented.

• Korean Journal of Remote Sensing
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• v.29 no.3
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• pp.325-329
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• 2013

This present study describes an application of UV scanning spectrometer $O_4$ data for retrieval of aerosol vertical profiles in Seoul during the measurement period that includes two Asian dust event days. The results show large variations of aerosol load in vertical and temporal scales. Large variations in aerosol were observed at 1 km in height during the daytime in the measurement period when the Asian dust events took place. The aerosol load, however, was found to be largest at the surface compared to those retrieved at the higher atmospheric layers. The results also clearly identified the diurnal patterns of aerosol vertical distributions. The aerosol load was high in the morning and noon whereas it was low in the afternoon. This study demonstrates that UV scanning spectrometer observations of the oxygen dimer can serve as a potential method for determination of atmospheric aerosol vertical distributions and optical properties.

• Transactions of the Korean Society of Mechanical Engineers
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• v.17 no.7 s.94
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• pp.1731-1739
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• 1993

An application of Scanning Tunneling Microscopy(STM) is investigated for the measurement of 3-dimensional profiles of the macro-machined patterns of which critical dimensions lie in the range of submicrometers. Special emphasis of this investigation is given to extending the measuring ranges of STM upto the order of several micrometers while maintaining superb nanometer measuring resolution. This is accomplished by correcting hysteresis effects of piezoelectric actuators by using non-linear compensation models. Detailed aspects of design and control of a prototype measurement system are described with some actual measuring examples in which fine It patterns can successfully be traced with a resolution of 1 nanometer over a surface range of $4{\times}2$ micrometers.