• Title/Summary/Keyword: rock analog material

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Application of Automated Microscopy Equipment for Rock Analog Material Experiments: Static Grain Growth and Simple Shear Deformation Experiments Using Norcamphor (유사물질 실험을 위한 자동화 현미경 실험 기기의 적용과 노캠퍼를 이용한 입자 성장 및 단순 전단 변형 실험의 예)

  • Ha, Changsu;Kim, Sungshil
    • Economic and Environmental Geology
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    • v.54 no.2
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    • pp.233-245
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    • 2021
  • Many studies on the microstructures in rocks have been conducted using experimental methods with various equipment as well as natural rock studies to see the development of microstructures and understand their mechanisms. Grain boundary migration of mineral aggregates in rocks could cause grain growth or grain size changes during metamorphism or deformation as one of the main recrystallization mechanisms. This study suggests improved ways regarding the analog material experiments with reformed equipment to see sequential observations of these grain boundary migration. It can be more efficient than the existing techniques and carry out an appropriate microstructure analysis. This reformed equipment was implemented to enable optical manipulation by mounting polarizing plates capable of rotating operation on a stereoscopic microscope and a deformation rig capable of experimenting with analog materials. The equipment can automatically control the temperature and strain rate of the deformation rig by microcontrollers and programming and can take digital photomicrographs with constant time intervals during the experiment to observe any microstructure changes. The composite images synthesized using images by rotated polarizing plates enable us to see more accurate grain boundaries. As a rock analog material, norcamphor(C7H10O) was used, which has similar birefringence to quartz. Static grain growth and simple shear deformation experiments were performed using the norcamphor to verify the effectiveness of the equipment. The static grain growth experiments showed the characteristics of typical grain growth behavior. The number of grains decreases and the average grain size increases over time. These case experiments also showed a clear difference between the growth curves with three temperature conditions. The result of the simple shear deformation experiment under the medium temperature-low strain rate showed no significant change in the average grain size but presented the increased elongation of grain shapes in the direction of about 53° regarding the direction perpendicular to the shearing direction as the shear strain increases over time. These microstructures are interpreted as both the plastic deformation and the internal recovery process in grains are balanced by the deformation under the given experimental conditions. These experiments using the reformed equipment represent the ability to sequentially observe changing the microstructure during experiments as desired in the tests with the analog material during the entire process.

Analysis of noise rejection of stored holographic digital data on the chalcogenide thin film (칼코게나이드 박막에 저장된 홀로그래픽 디지털 정보의 잡음 제거에 관한 연구)

  • Lim, Byoung-Rock;Lee, Woo-Sung;Ahn, Kwang-Seop;Yeo, Cheol-Ho;Chung, Hong-Bay
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.479-480
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    • 2005
  • The Analog data is impossible to perfect reconstruct original data at a hologram data storage because of noise such as cross talk. So it is necessary that data can be stored by digital signal unavoidably. Therefore this work deals with experiments from this point of view through writing & reading of digital data. We stored 256bit digital data at one point on As-Ge-Se-S chalcogenide thin film and we reconstruct original data of 100% through the specified algorithm such as the histogram equalization, the interactive correction, etc. This result shows that the data is able to reconstruct under relative low diffraction efficiency. As the result, we expect the possibility of chalcogenide thin film for HDDS as the analysis of the effective resolution refer to reconstruction rate and diffraction efficiency.

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