• 한국생산제조학회지
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• 제8권1호
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• pp.126-134
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• 1999

In this paper, a new error compensating technique for form-error compensation of rough-surface profile obtained by contact stylus profilometer is proposed. By the method, the real contact points of rough-surface and diamond stylus can be estimated and the measured profile data corrected. To verify the compensation effect, the properties(Ra, RMS, Kurtosis, Skewness) of measured profile data and compensated data were compared. And, the cumulative RMS slope was proposed to assess the compensated effect of upper area of profile. The results show that the measuring error could be compensated very well in amplitude parameters and in proposed cumulative RMS slope by the developed form-error compensating technique.

• 한국광학회지
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• 제14권5호
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• pp.504-508
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• 2003

최근 전자산업계에 새롭게 널리 생산되는 마이크로 전자부품들은 왜곡이 최소화된 정밀한 외관 형상을 갖도록 제조되고 관리되지만, 측정 대상의 표면이 가시광 영역에서 광산란되는 특징을 가짐으로 인해, 기존의 피죠나 마이켈슨 형태의 비교간섭법으로는 고정밀의 삼차원 형상측정이 용이하지 아니하였다. 본 논문에서는 광섬유를 이용한 새로운 개념의 점회절 간섭계를 제안하고, 이를 광산란 거친표면의 대표적인 제품인 칩패키지와 실리콘 웨이퍼의 삼차원 형상 측정에 적용하였다. 측정결과 66 mm 측정영역에서 측정 형상오차 PV(peak-to-valley value) 5.6 $\mu\textrm{m}$, 분산값($\sigma$) 1.5 $\mu\textrm{m}$를 획득함으로써 기존의 비교 간섭 측정법에 비해 더욱 향상된 측정 정밀도를 획득하였다.

• 대한기계학회논문집
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• 제17권5호
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• pp.1202-1207
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• 1993

본 논문에서는 삼차원형상 측정의 슬릿광 주사방법(slit beam scanning topography)의 형상측정에 응용에 대해 기술한다. 이는 광학적인 방법으로 레이저 평면광을 물체에 주사하여 얻어지는 변형된 광궤적으로부터 광삼각법(optical triangulation)과 컴퓨터비젼 기술을 응용하여 삼차원형상을 측정한다. 기존의 방법 들과 비교하여 슬릿광 주사방법은 고속의 삼차원측정이 가능하여 검사자동화에 용이 하게 적용될 수 있는 장점을 갖는다. 본 논문에서는 슬릿광 주사방법에 대한 기본원 리를 유도하며, 이를 구현할 수 있는 측정시스템의 설계와 실제 측정예를 통해 본 방법이 갖는 장단점에 관하여 검토한다.

• 한국정밀공학회지
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• 제22권11호
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• pp.64-71
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• 2005

In order to measure surface roughness profile, stylus type equipments are commonly used, but the stylus keeps contact with surface and damages specimens by its tip pressure. Therefore, optics based measurement systems are developed, and light phase interferometer, which is based on light interference phenomenon, is the most noticeable research. However, light interference based measurements require translation mechanisms of nano-meter order in order to generate phase differences or multiple focusing, thus the systems cannot satisfy the industrial need of on-the-machine and in-process measurement to achieve factory automation and productive enhancement. In this research, we focused light reflectance phenomenon rather than the light interference, because reflectance based method do not need translation mechanisms. However, the method cannot direct]y measure surface roughness profile, because reflected light consists of several components and thus it cannot supply surface height information with its original form. In order to overcome the demerit, we newly proposed an image processing based algorithm, which can separate reflected light components and conduct parameterization and reconstruction process with respect to surface height information, and then confirmed the reliability of proposed algorithm by experiment.

• Journal of the Optical Society of Korea
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• 제18권3호
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

• 한국정밀공학회지
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• 제18권2호
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• pp.90-95
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• 2001

f-$\theta$len is one of the important parts in Laser Scanning Unit because it affects on the optical performance of Laser Scanning Unit dominantly. It is necessary to find out the relationship between the surface profile error of f-$\theta$lens and the beam profile focusing on the Organic Photo Conductive drum in order to analysis the beam profile problems such as appearance of side lobe and expansion of center lobe. In this research, a simulation process which relates the surface profile characteristics to the beam profile has been developed by CODE V. The simulated beam profile also have been compared with the measurement results.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2011년도 춘계학술대회 논문집
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• pp.869-870
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• 2011

• 한국태양에너지학회 논문집
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• 제36권4호
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• pp.11-20
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• 2016

For accurate wind resource assessment and wind turbine performance test, it is essential to secure wind data covering a rotor plane of wind turbine including a hub height. In general, we can depict wind speed profile by extrapolating or interpolating the wind speed data measured from a meteorological tower where multiple anemometers are mounted at different heights using a power-law of wind speed profile. The most important parameter of a power-law equation is a vertical wind profile exponent which represents local characteristics of terrain and land cover. In this study, we calculated diurnal vertical wind profile exponents of 8 locations in Jeju Island who possesses excellent wind resource according to the GUM (Guide to the Expression of Uncertainty in Measurement) to evaluate its uncertainty. Expanded uncertainty is calculated by combined standard uncertainty, which is the result of composing type A standard uncertainty with type B standard uncertainty. Although pooled standard deviation should be considered to derive type A uncertainty, we used the standard deviation of vertical wind profile exponent of each day avoiding the difficult of uncertainty evaluation of diurnal wind profile variation. It is anticipated that the evaluated uncertainties of diurnal vertical wind profile exponents at 8 locations in Jeju Island are to be registered as a national standard reference data and widely used in the relevant areas.

• 한국공작기계학회논문집
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• 제15권3호
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• pp.104-110
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• 2006

It is a study on the design of a cam profile for diesel engine SOHC. It is used a reverse engineering method without the usual copy processing. It draws up the contour data from an actual cam and processes by CNC. The profile of the cam is reappeared to be up to operational specifications that are the opening and shutting time, lift, speed and acceleration of the inhalation and escape valves. While the cam operating, the noise and vibration are occurred by the sudden change of speed. The new design of cam profile is suitable fur the valve operations to be smooth. We propose the design method of a cam profile far the reappearance of an actual cam. It is proved to be the propriety about the design of the cam profile through the processing, measurement, and comparison of the cam profile.

• 제어로봇시스템학회논문지
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• 제9권7호
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• pp.507-514
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• 2003

Inspection and shape measurement of three-dimensional objects are widely needed in industries for quality monitoring and control. Recently the shape measurement using interferometric principle is found to be a successful methodology among other visual or optical technologies. Especially, the measuring method using wavelength scanning interferometer(WSI) has a great advantage in comparison with other conventional jnterferometric methods in that the absolute distance from the reference surface can be directly obtained from the amount of jnterferometric phase change. However, the measurement methods using WSI proposed by other researchers have low measurement resolution so far because they can't measure fractional phase change. To avoid this shortcoming we propose a new algorithm in this paper, which can obtain a small amount of even fractional phase change by sinusoidal function fitting. To evaluate the effectiveness of the proposed sinusoidal function fitting algorithm, a series of measuring experiments are conducted for discontinuously shaped specimens which have various height. The proposed algorithm shows much more enhanced measurement resolution than other existing conventional algorithms such as zero crossing algorithm and Fourier transform algorithm.