• Journal of Radiation Industry
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• v.6 no.3
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• pp.231-237
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• 2012

This paper introduces a gamma-ray measurement system for a transportable tomography which is applicable for an industrial process diagnosis. The gamma-ray measurement system consists of pulse mode operating 72 channel CsI detectors, main AMP-pulse shaper, single channel analyzer, counter and control PC. The CsI crystal is coupled with a PIN diode which is connected to an amplifier and pulse shaper. For a compact design, the amplifier and pulse shaping circuit are included in a single package. 36 sets of CsI detectors are connected to a multi-channel counter through single channel analyzers. A computer controls and collects data from two multi-channel counters. This configuration results in 72 channel counting system in total. The CT rotator and radiation measurement system are controlled by a PC with LabVIEW program. Tomographic data were measured for a phantom by the measurement system and transportable gamma-ray CT. From the experimental data image reconstructions were performed by ML-EM algorithm. The result showed that the CsI detector system can be a suitable component for transportable gamma-ray CT system.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.20 no.8
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• pp.99-106
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• 2021

Scientists at the International Space Station have been studying space life sciences to prepare for future manned space explorations, and require experimental specimen such as rodents for mass measurement. However, it is challenging to use mass measurement systems in space owing to the errors caused by factors such as mechanical-electronic noise. Therefore, to minimize the measurement errors, we propose a new algorithm called multiple calibration, which divides the mass range and calculates the sample weight by using the correction equation of each interval. We performed tests to evaluate and compare the performance of the proposed method to that of normal methods. As a result, the measurement accuracy improved by over two times using the multiple calibration method. Furthermore, we conducted mass measurements on various samples and confirmed that our method is valid for mass measurements.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2003.10a
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• pp.107-110
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• 2003

The sheet metal shearing process is normally used in the precision elements such as semi-conductor components. In precision elements, burrs usually reduce the quality of machined parts and cause interference, jamming and misalignment during assembly procedures and because of their sharpness, they can be safety hazard to personnel. Furthermore, not only burrs are hard to predict and avoid, but also deburring, the process of removing burrs, is time-consuming and costly. In order to get the burr-free parts, therefore, we developed the precise burr measuring system using the laser. Using the X-Y precious table, we used vertical measuring method. Through the laser measurement system, we gain the minute analog signal, so this signal was amplified by the electric circuit. Finally, we gained the realtime burr data using A/D converter, PC. By introducing the novel laser measuring method which employing vertical measurement mechanism, we could get fast and precious burr data. Through the experiments, the accuracy of the developed system is proved. The burr height measured during the punching process can be used for automatic deburring and in-situ aligning.

• Journal of the Korean Society for Precision Engineering
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• v.4 no.2
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• pp.36-46
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• 1987

An optical technique using laser for non-contact measurement of surface roughness and form accuracy of ground surfaces is presented. It is found that, when a ground surface is illuminated by a beam of laser light, the roughness height and slope distribution has significant influence on the pattern of reflection and it maintains an unique Gaussian distribution relationship with the surface roughness. The principle idea of the optical measurement system is therefore monitor the radiation, and then calibrate it in process against surface roughness by means of necessary digital data processing. On the other hand, measuring the form accuracy of a ground surface is accomplished by using a triangular method, which is based on observing the movement of an image of a spot of light projected onto the surface. The image is focused, through a series of lenses for magnification, on a photodetector array lf line configur- ation. Then the relative movement of image and consequently the form accuracy of the surface can be obtained through appropriate calibration procedures. Experimental test showed that the optical roughness measurement technique suggested in this work is very efficient for most industrial applications being capable of monitoring the roughness heights ranging 0.1 to 0.6 .$\mu$m CLA values. And form accuracy can be measured in process with a resolution of 10 .$\mu$m.

• Current Optics and Photonics
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• v.2 no.2
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• pp.153-164
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• 2018

In semiconductor manufacturing, critical dimensions indicate the features of patterns formed by the semiconductor process. The purpose of measuring critical dimensions is to confirm whether patterns are made as intended. The deposition process for an organic light emitting diode (OLED) forms a luminous organic layer on the thin-film transistor electrode. The position of this organic layer greatly affects the luminescent performance of an OLED. Thus, a system for measuring the position of the organic layer from outside of the vacuum chamber in real-time is desired for monitoring the deposition process. Typically, imaging from large stand-off distances results in low spatial resolution because of diffraction blur, and it is difficult to attain an adequate industrial-level measurement. The proposed method offers a new superresolution single-image using a conversion formula between two different optical systems obtained by a deep learning technique. This formula converts an image measured at long distance and with low-resolution optics into one image as if it were measured with high-resolution optics. The performance of this method is evaluated with various samples in terms of spatial resolution and measurement performance.

• Proceedings of the Korea Society of Design Studies Conference
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• 2001.10a
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• pp.37.1-37
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• 2001

• Journal of Internet Computing and Services
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• v.8 no.5
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• pp.151-160
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• 2007

A datawarehouse which extracts and saves the massive analysis data is used for marketing and decision support of business. However, the datawarehouse has the problem of increasing the process time and cost as well as has a high risk of process errors because it integrates vast amount of data from distributed environments. Thus, we propose a metrics for measurement in the area of productivity, process quality and data quality. Also through the evaluation using the proposed metrics, we show that our proposal provides productivity enhancement and process improvement.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.10 no.6
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• pp.795-802
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• 1998

For measuring the thermal diffusivity by laser flash method, raw data have to be calibrated using temperature data. We have developed in-process calibration method and polynomial calibration in which thermal diffusivity can be calibrated during measuring, This method is different from existing temperature pre-process calibration method and exponential calibration having various source of error. Using this new calibration method, measurement accuracy was improved about 1∼2% compare to the value by the existing method. We also studied more accurate fitting curve as in Figure 4 was shown the result of measuring output characteristics of IR radiometer with temperature. As illustrated in data, in-process calibration method and polynomial calibration equation is proper than pre-process calibration method and exponential calibration.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.19 no.37
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• pp.53-61
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• 1996

Recently the business transformaton of a company is achieved through the business process re-design and total quality management concept. This paper focused on the decision of the critical measurement point(CMP) for maximizing the effectiveness of the business process reengineering. In general, the types of business processes can be classified into two kinds, serial processes with IPO(input/process/output) type and non-serial processes with workflow type. The traditional method of selecting the CMP relies on the experiences and intuitions of the process owners. We suggest a mathematical method for more objective selection of CMP by using Dynamic Programming.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.47
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• pp.211-218
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• 1998

In start-up process control applications it may be necessary to limit the sample size to one measurement. A control chart for individual measurements is used whenever it is desirable to examine each individual value from the process immediately. A possible option would be to use an exponential weighted moving(EWM), using modifying statistics with individual measurement, chart for monitoring the process center, and using a moving range (MR) chart for monitoring process variability. In this paper it is shown that there is scheme in using the EWM procedure based on average run length. An expression for the ARL is given in terms of an integral equation, approximated using numerical quadrature. In this case, where it is reasonable to assume normality and negligible autocorrelation in the observations, provide graphs that simplify the design of EWM-MR chart and taking method of exponential smoothing constant(λ) and constant(K) are suggested. The charts suggested above evaluate using the conditional probability.