• Proceedings of the Korea Institutes of Information Security and Cryptology Conference
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• 2003.12a
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• pp.141-145
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• 2003

We propose the model of Software Rejuvenation methodology, which is applicable for survivability. Software rejuvenation is a proactive fault management technique and being used in fault tolerant systems as a cost effective technique for dealing with software faults. Survivability focuses on delivery of essential services and preservation of essential assets, even systems are penetrated and compromised. Thus, our objective is to detect the intrusions in a real time and survive in face of such attacks. As we deterrent against an attack in a system level, the Intrusion tolerance could be maximized at the target environment. We address the optimal time to execute ad hoc software rejuvenation and we compute it by using the semi Markov process. This is one way that could be really frustrated and deterred the attacks, as the attacker can't make their progress. This Software Rejuvenation method can be very effective under the assumption of unknown attacks. In this paper, we compute the optimum time to perform an ad hoc Software Rejuvenation through intrusions.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.57 no.4
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• pp.377-382
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• 2008

For stator winding protection of AC generator, KCL(Kirchhoff's Current Law) is widely applied. Actually a CRDR(Current Ratio Differential Relay) based on DFT(Discrete Fourier Transform) has been used for protecting generator. It has been pointed out that defects can occur during the process of transforming a time domain signal into a frequency domain one which can lead to loss of time domain information. Wavelets techniques are proposed for the analysis of power system transients. This paper introduces an algorithm to choose a suitable Mother Wave1et for generator stator fault detection. For optimal selection, we analyzed db(Daubechies), sym(Symlets), and coif(Coiflects) of Mother Wavelet. And we compared with performance of the choice algorithm using detail coefficients energy and RMS(root mean square) error. It can be improved the reliability of the conventional DFT based CRDR. The feasibility and effectiveness of the proposed scheme is proved with simulation using collected data obtained from ATP (Alternative Transient Program) package.

• Journal of the Korean Institute of Telematics and Electronics
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• v.23 no.2
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• pp.197-205
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• 1986

In this paper, we present an efficient test algorithm for data processing function of MC68000 \ulcorner. The test vector for functional testing is determined by stuck-at, coupling and transition fault for data storage and transfer. But for data manipulation it is determined by a boolean function of micro-operation. This test algorithm is composed of 3 parts, choosing optimum test instructions for maximizing fault coverage and minimizing test process time, deciding the test order for minimizing test ambiguity, and processing the actual test.

• Journal of Information Processing Systems
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• v.18 no.6
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• pp.755-762
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• 2022

The existing electrical engineering design method and the dynamic objective function in the application process of automatic control system fail to meet the unbounded condition, which affects the control tracking accuracy. In order to improve the tracking control accuracy, this paper studies the electrical engineering design method based on neural network and the application of automatic control system. This paper analyzes the structure and working mechanism of electrical engineering automation control system by an automation control model with main control objectives. Following the analysis, an optimal solution of controllability design and fault-tolerant control is figured out. The automatic control power coefficient is distributed based on an ideal control effect of system. According to the distribution results, an automatic control algorithm is based on neural network for accurate control. The experimental results show that the electrical automation control method based on neural network can significantly reduce the control following error to 3.62%, improve the accuracy of the electrical automation tracking control, thus meeting the actual production needs of electrical engineering automation control system.

• IEMEK Journal of Embedded Systems and Applications
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• v.19 no.1
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• pp.57-64
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• 2024

In the industrial field, robots are used to increase productivity by replacing labors with dangerous, difficult, and hard tasks. However, failures of individual industrial robots in the entire production process may cause product defects or malfunctions, and may cause dangerous disasters in the case of manufacturing parts used in automobiles and aircrafts. Although requirements for early diagnosis of industrial robot failures are steadily increasing, there are many limitations in early detection. This paper introduces methods for diagnosing robot failures using sound-based data and deep learning. This paper also analyzes, compares, and evaluates the performance of failure diagnosis using various deep learning technologies. Furthermore, in order to improve the performance of the fault diagnosis system using deep learning technology, we propose a method to increase the accuracy of fault diagnosis based on an inference window. When adopting the inference window of deep learning, the accuracy of the failure diagnosis was increased up to 94%.

• Journal of Korean Institute of Industrial Engineers
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• v.36 no.3
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• pp.154-163
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• 2010

Process monitoring of output variables affecting final performance have been mainly executed in semiconductor manufacturing process. However, even earlier detection of causes of output variation cannot completely prevent yield loss because a number of wafers after detecting them must be re-processed or cast away. Semiconductor manufacturers have put more attention toward monitoring process inputs to prevent yield loss by early detecting change-point of the process. In the paper, we propose the method to efficiently monitor functional input variables in multi-phase semiconductor manufacturing process. Measured input variables in the multi-phase process tend to be of functional structured form. After data pre-processing for these functional input data, change-point analysis is practiced to the pre-processed data set. If process variation occurs, key variables affecting process variation are selected using contribution plot for monitoring efficiency. To evaluate the propriety of proposed monitoring method, we used real data set in semiconductor manufacturing process. The experiment shows that the proposed method has better performance than previous output monitoring method in terms of fault detection and process monitoring.

• Industrial Engineering and Management Systems
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• v.12 no.2
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• pp.112-117
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• 2013

The $\overline{x}$ control chart for the process mean and either the R or s control chart for the process dispersion have been used together to monitor the manufacturing processes. However, it has been pointed out that this procedure is flawed by a fault that makes it difficult to capture the behavior of process condition visually by considering the relationship between the shift in the process mean and the change in the process dispersion because the respective characteristics are monitored by an individual control chart in parallel. Then, the ($\overline{x}$, s) control chart has been proposed to enable the process managers to monitor the changes in the process mean, process dispersion, or both. On the one hand, identifying which process parameters are responsible for out-of-control condition of process is one of the important issues in the process management. It is especially important in the ($\overline{x}$, s) control chart where some parameters are monitored at a single plane. The previous literature has proposed the multiple decision method based on the statistical hypothesis tests to identify the parameters responsible for out-of-control condition. In this paper, we propose how to identify parameters responsible for out-of-control condition using the information criterion. Then, the effectiveness of proposed method is shown through some numerical experiments.

• Journal of the Semiconductor & Display Technology
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• v.18 no.1
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• pp.5-9
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• 2019

Optical emission spectroscopy is used to identify chemical species and monitor the changes of process results during the plasma process. However, plasma process monitoring or fault detection by using emission signal variation monitoring is vulnerable to background signal fluctuations. IR heaters are used in semiconductor manufacturing chambers where high temperature uniformity and fast response are required. During the process, the IR lamp output fluctuates to maintain a stable process temperature. This IR signal fluctuation reacts as a background signal fluctuation to the spectrometer. In this research, we evaluate the effect of infrared background signal fluctuation on plasma process monitoring and improve the plasma process monitoring accuracy by using simple infrared background signal subtraction method. The effect of infrared background signal fluctuation on plasma process monitoring was evaluated on $SiO_2$ PECVD process. Comparing the $SiO_2$ film thickness and the measured emission line intensity from the by-product molecules, the effect of infrared background signal on plasma process monitoring and the necessity of background signal subtraction method were confirmed.

• Journal of the Mineralogical Society of Korea
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• v.25 no.1
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• pp.23-36
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• 2012

Morphological and mineralogical characteristics of laumontite and adularia in the breccia zone in a fault, Yangbuk-myeon, Gyeongju, Korea suggest that they formed by reaction with hydrothermal alteration related to fault activity. Laumontite commonly occurring in the breccia zone is related to the presence of hydrothermal fluids bearing alkaline elements in the zone. Laumonite is characterized by elongated columnar form with aspect ratio varying 5~10. Laumontite and adularia whose characteristic euhedral forms are indicative of the latest product formed as rapid precipitation from fluids or replacements of Ca-plagioclase. Hydrothermal fluids reacted with intensively fractured granite, typical with high permeability, leached alkaline elements such as Ca, K, allowing laumontite and adularia to be precipitated under neutral to weak alkaline conditions. It is noteworthy that the formation process and genesis of low temperature minerals such as laumontite and adularia are very similar to those formed by wallrock alteration or hydrothermal alteration that occurred in epithermal deposits. Taking into account its characteristic morphology and chemistry, authigenic K-feldspar that commonly forms at low temperature in many fault zones must be adularia.

• Transactions on Electrical and Electronic Materials
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• v.14 no.2
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• pp.71-77
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• 2013

Advanced semiconductor manufacturing technology requires methods to maximize tool efficiency and improve product quality by reducing process variability. Real-time plasma process monitoring and diagnosis have become crucial for fault detection and classification (FDC) and advanced process control (APC). Additional sensors may increase the accuracy of detection of process anomalies, and optical monitoring methods are non-invasive. In this paper, we propose the use of a chromatic data acquisition system for real-time in-situ plasma process monitoring called the Plasma Eyes Chromatic System (PECS). The proposed system was initially tested in a six-inch research tool, and it was then further evaluated for its potential to detect process anomalies in an eight-inch production tool for etching blanket oxide films. Chromatic representation of the PECS output shows a clear correlation with small changes in process parameters, such as RF power, pressure, and gas flow. We also present how the PECS may be adapted as an in-situ plasma arc detector. The proposed system can provide useful indications of a faulty process in a timely and non-invasive manner for successful run-to-run (R2R) control and FDC.