• Proceedings of the Optical Society of Korea Conference
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• 2001.08a
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• pp.148-149
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• 2001

• Bulletin of the Korean Chemical Society
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• v.19 no.5
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• pp.506-507
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• 1998

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.05a
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• pp.641-642
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• 2010

• Proceedings of the Korean Society for Bioinformatics Conference
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• 2001.10a
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• pp.87-96
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• 2001

삼성종합기술원에서는 인간의 genomic DNA의 이상을 발견하여 이와 연관된 질병을 진단하는 DNA chip을 개발하고 있다. 이를 위하여 특정한 염기서열의 변화에 따라 민감하게 hybridization strength가 변화하는 oligomer를 선택해야 한다. 따라서, specificity가 가장 큰 probe를 골라내야 한다. 여기에는 열역학적인 고려와 여러가지 물리화학적인 approximation이 사용되며, DNA chip 생산 공정에 의존하는 요소도 포함되어 있다 모든 생산용 data와 결과의 분석은 database를 기반으로 이루어지며, 자동화된 통계적 분석법과 최적화 방법이 함께 사용된다.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.10a
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• pp.83-84
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• 2006

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.06a
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• pp.231-232
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• 2009

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.10a
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• pp.673-674
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• 2009

• Journal of the Semiconductor & Display Technology
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• v.14 no.4
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• pp.1-7
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• 2015

People are always pursuing the aesthetic feeling relentlessly. But some people have such problems with their hairs like alopecia, cancer chemotherapy, burns, and scalp injury. So the synthetic hair has played a very important role to make up for these deficiencies. But long term use can lead to adverse reactions or uncomfortable feeling. This is primarily caused by its properties differ with human hair. In particular, nanotribological characterizations (roughness, friction force and adhesive force) of synthetic hair surface are dissatisfy with the needs of normal hairs. This paper presents the experiments on nanotribological characterizations measurements of human hairs (coloring hair, permed hair and common hair) in shampooing condition or without shampooing condition. Using atomic force microscopy (AFM) to find out a range of synthetic hair nanotribological characterizations which can correspond with natural hair. The measurements of nanotribological characterizations focus on surface roughness, friction force and adhesive force, and a new design of AFM probe was used for measuring the nanotribological characterizations.

• Korean Journal of Materials Research
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• v.34 no.2
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• pp.105-110
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• 2024

Scanning probe microscopy (SPM) has become an indispensable tool in efforts to develop the next generation of nanoelectronic devices, given its achievable nanometer spatial resolution and highly versatile ability to measure a variety of properties. Recently a new scanning probe microscope was developed to overcome the tip degradation problem of the classic SPM. The main advantage of this new method, called Reverse tip sample (RTS) SPM, is that a single tip can be replaced by a chip containing hundreds to thousands of tips. Generally for use in RTS SPM, pyramid-shaped diamond tips are made by molding on a silicon substrate. Combining RTS SPM with Scanning spreading resistance microscopy (SSRM) using the diamond tip offers the potential to perform 3D profiling of semiconductor materials. However, damage frequently occurs to the completed tips because of the complex manufacturing process. In this work, we design, fabricate, and evaluate an RTS tip chip prototype to simplify the complex manufacturing process, prevent tip damage, and shorten manufacturing time.

• Journal of the Korean Society for Nondestructive Testing
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• v.17 no.4
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• pp.262-269
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• 1997

An eddy current probe ($8{\times}1$ multiple-element, surface scan) was successfully designed and fabricated at the KEPRI using the impedance equivalent circuit theory. The probe is intended for the detection of circumferential deformations (cross-section view) of the heat exchanger tubing that can occur due to corrosion, erosion, and denting. Optimum design parameters providing the highest sensitivity and signal-to-noise ratio, such as the coil dimensions, electrical characteristics, and test frequencies, were determined based on initial laboratory experiments conducted on the test specimen (SS304 tubing: OD : 9.68mm, wall-thickness : 0.47mm) containing artificial flaws (e.g., dents and corroded surface on tube OD) using the available Zetec-made probe. Using this parameters, a new probe was made and tested on an unknown specimen. The result indicated that the new probe is capable of detecting the circumferential deformation with the error of ${\pm}0.2%$ (0.022mm) of the tube O.D.