• Title/Summary/Keyword: probe

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Clinical Comparison Of Manual Probe With Florida Probe In Adult Periodontitis (성인형 치주염 환자에 있어 manual probe의 Florida probe의 임상적 비교)

  • Yu, Hyang-Mi;Chung, Chin-Hyung
    • Journal of Periodontal and Implant Science
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    • v.26 no.1
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    • pp.244-254
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    • 1996
  • The periodontal probe is a commonly used instrument to assess periodontal conditions. And so, there has been many studies to develop the accuracy and reproducibility of the periodontal probe. The purpose of this study was to compare two different periodontal probes for measurement reliability and time required to use in subjects with moderate periodontitis. It was done after evaluating reproducibility of probing depth by stent guiding for a Manual probe and a Florida probe in subjects with healthy periodontal condition. The results were as follows 1. In experiment to evaluate the reproducibility of probing depth by stent guiding for a Manual probe and Florida probe in subjects with healthy periodontal condition, there was no major significant difference between intraprobe and interprobe relationships. 2. There were reduced probing measuremint error by using the Florida probe for posterior teeth and by using the Manual probe for anterior teeth of subjects with moderate periodontitis. 3. At proximal area, there was higher measurement error by using the Manual probe than the Florida probe. 4. The mean of pocket depth measurement using Manual probe was signifi cantly higher than that using Florida probe(p<0.05). With increasing pocket depth, interprobe difference increased and reproducibility reduced. 5. There was no significant difference in time required to use between Manual probe and Florida probe(p<0.05). 6. There was slight probing measurement difference between Manual probe and Florida probe at different site, but both probes have similar degrees of reproducibility and similar time required to probe.

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Present Condition and View of Eddy Current Testing Probe for Nuclear Power Plant Steam Generator Tube Examination (원전 증기발생기 세관 검사를 위한 와전류 탐상 프로브의 현황 및 전망)

  • Kim Ji-Ho;Lee Hyang-Beom
    • 한국정보통신설비학회:학술대회논문집
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    • 2006.08a
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    • pp.241-245
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    • 2006
  • In the examination of Steam Generator (SG) tube in Nuclear Power Plant (NPP) Eddy Current Testing (ECT) probes play an Important role in detecting the defects. Bobbin probe and Rotating Pancake Coil (RPC) probe is usually used for the inspection of SG tube. Bobbin probe is good at high speed inspection, but ability of detection of circumferential defect is very weak. On the contrary RPC probe, which moves for inspection in the direction of axial and circumferential simultaneously, has very slow inspection speed, but it was excellent detection capability fur small cracks, which is hardly detected by bobbin probe. Many examinations of SG tube examination of NPP are achieved during short period. Therefore, solution about this must develop probe of new form for examination performance and examination time shortening of other probe. In this paper, analyzed technological present condition of Bob-bin probe and RPC probe been using in Nondestructive Testing (NDT) for SG tube defect detection and Appeared about background theory and view of developed probe newly.

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A study on fast langmuir probe driving circuit for measurement of plasma parameter and its application (플라즈마 파라메타 측정용 고속 langmuir프로브 구동회로 실현 및 적용)

  • 신중흥;고태언;김두환;박정후
    • Electrical & Electronic Materials
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    • v.9 no.5
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    • pp.506-511
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    • 1996
  • This paper deals with an inexpensive, simple and fast Langmuir probe sweeping circuit and its application. This sweeper completes a probe trace in a 1 ms order. Futhermore, the circuit drives a maximum probe voltage of $\pm$30V and has a maximum probe current capability of a few amperes. The plasma parameters are successfully determined using the fast Langmuir probe method.

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Oligonucleotide Probe Selection using Evolutionary Computation in Large Target Genes (다수의 목표 유전자에서 진화연산을 이용한 Oligonucleotide Probe 선택)

  • Shin, Ki-Roo;Kim, Sun;Zhang, Byung-Tak
    • Proceedings of the Korean Information Science Society Conference
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    • 2003.04c
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    • pp.455-457
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    • 2003
  • DNA microarray는 분자생물학에서 널리 사용되고 있는 실험 도구로써 크게 cDNA와 oligonucleotide microarray로 나뉘어진다. DNA microarray는 일련의 DNA 서열로 이루어진 probe들의 집합으로 구성되며 알려지지 않은 서열과의 hybridization 과정을 통해 특정 서열을 인식할 수 있게 된다. O1igonucieotide microarray는 cDNA 방법과는 다르게 probe를 구성하는 서열을 제작자가 임의로 구성할 수 있기 때문에 목표 서열이 가지는 고유한 부분만을 probe 서열로 사용함으로써 비용절감과 실험의 정확도를 높일 수 있다는 장점이 있다. 그러나 현재 목표 유전자 서열에 대해 probe 집합을 생성하는 결정적인 방법은 존재하지 않으며, 따라서 넓은 해 공간에서 효과적으로 최적 해를 찾아 주는 진화 연산이 probe 선택을 위한 좋은 대안으로 사용될 수 있다[1.2]. 그러나 진화연산을 이용한 probe 선택방법에 있어서 인식하고자 하는 목표 서열의 개수가 많아질 경우, 해 공간의 크기가 커짐으로 인해 문제점이 발생할 수 있다. 따라서 본 논문에서는 다수의 목표 유전자 서열을 대상으로 한 probe 선택 방법에 일어서 보다 효율적인 진화연산 접근 방법을 소개한다. 제시된 방법은 인식하고자 하는 목표 서얼의 일부를 선택해 이를 probe 집합의 후보로 사용하며. 유전 연산자를 이용한 진화과정을 통해 최적에 가까운 probe 집합을 찾는다. 본 논문은 GenBank로부터 유전자 서열을 대상으로 제안된 방법을 실험하였으며, 축소된 목표 서열만을 이용해 probe 집합을 선택하더라도 적합한 probe 집합을 찾을 수 있었다.

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Calibration/Compensation of Errors of the Touch Probe (접촉식 프로브의 오차교정 및 보정기술)

  • 박희재;이교일
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.18 no.8
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    • pp.2081-2087
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    • 1994
  • Touch trigger probes are widely used for inspection purposed in the CMM(Coordinate meauring machine) or machine tool. The errors introduced by measurement probe are fairy systematic, thus can be calibrated and compensated properly. This paper presents a technique for the error calibration and compensation of the probe errors, which can be easily applicable to the manufacturers and users of the measurement probe. The probe coordinate system is defined for the probe error assessment, and a reference sphere ball is measured, and the probe errors are calibrated. The calibrated probe errors are represented in the 3D error map and 2D error map along probing direction. Detail algorithms for the error compensation are proposed.

Nano-wear Characteristics of Silicon Probe Tip for Probe Based Data Storage Technology (탐침형 정보저장 기술을 위한 실리콘 탐침의 나노 마멸 특성에 관한 연구)

  • 이용하;정구현;김대은;유진규;홍승범
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.10a
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    • pp.552-555
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    • 2004
  • The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, the tribological characteristics of the probe/media interface were investigated by performing wear tests using an AFM. The ranges of applied normal load and sliding velocity for the wear test were 10 to 50nN and 2 to 20$\mu$m/s respectively. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis and calculated based on Archard s wear equation. It was shown that the wear coefficient of the probe tip was in the order of 10$^{-4}$ ~ 10$^{-3}$ , and significant contamination at the end of the probe tip was observed. Thus in order to implement the AFM-based recording technology, tribological optimization of the probe/media interface must be achieved.

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A Study on Applying Array Probe for Steam Generator Tube Inspection (배열형 탐촉자를 이용한 증기발생기 세관 검사 적용성 검토)

  • Kim, In Chul;Cheon, Keun Young;Lee, Young Ho
    • Transactions of the Korean Society of Pressure Vessels and Piping
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    • v.5 no.1
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    • pp.25-31
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    • 2009
  • Steam Generator(SG) tube is an important component of Nuclear Power Plant(NPP), which comprises of the pressure boundary of primary system. The integrity of SG tube has been confirmed by the eddy current test every outage. In Korea, Bobbin probe and MRPC probe have been generally used for the eddy current test. Meanwhile the usage of Array probe has gradually increased in U.S., Japan and other countries. In this study, we investigated the defect detection capability of the Array probe through its preliminary application to SG tube inspection. The Array probe has the equivalent capability in the defect detection and sizing as the conventional methods. Thus it is desirable that the Array probe is generally applied to SG tube inspection in the domestic NPPs.

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Electrical Properties of a Single ZnO Nanowire in a four-probe Configuration (단일 ZnO 나노선 4단자 소자의 전기적 특성)

  • Kim, Kang-hyun;Kang, Hae-yong;Yim, Chan-young;Jeon, Dae-young;Kim, Hye-young;Kim, Gyu-Tae;Lee, Jong-Soo;Kang, Woun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.12
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    • pp.1087-1091
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    • 2005
  • Four-probe device of single ZnO nanowire was fabricated by electron beam lithography. Electrical characterizations in a two-probe and a four-probe configuration with a back-gate were carried out to clarify the relative contribution of the contact and the intrinsic part in a ZnO nanowire. I-V characteristic in four-probe measurement showed an ohmic behavior with a high conductivity, 100 S/cm, which was better than those of two-probe measurement by 10 times. At the same values of the current between two-probe and four-probe, the net voltage applied inside the nanowire were extracted with calculated voltages at the contact. Four-probe current-gate voltage characteristics showed bigger tendencies than those of two-probe measurement at low temperatures, indicating the reduced gate dependence in two-Probe measurements by the existence of the contact resistance.

The Study on Reliability Improvement in Eddy Current Inspection by Signal Characteristic Optimization of Multi-coil Array Probe (다중센서 신호특성 최적화를 통한 와전류검사 신뢰성 개선연구)

  • Ahn, Y.S.;Gil, D.S.;Park, S.G.
    • Journal of Power System Engineering
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    • v.14 no.2
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    • pp.60-64
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    • 2010
  • This paper introduces reliability improvement and time saving in eddy current inspection by signal characteristic optimization of multi-coil eddy current array probe. In the past, Multi-coil array probe and single probe were used for the gas turbine rotor surface inspection & defect evaluation. The multi-coil array probe was used for the broad area inspection. But the signal deviations among multi-coil array probe are maximum 28% in commercial probe. This differences were considered to impedance differences among coils, so it is very difficult to evaluate exact defect size. The signal deviations among multi-coil array probe are maximum 28% in commercial probe. So, single coil inspection was used for exact defect sizing. The purpose of this study is to improve signal deviations of multi-coil array probe. The introduced new technology can improves this deviation by adjusting input voltage in each coil. At first, apply same voltage in each coil and collect signal amplitude of each coil. And calculate new input voltage based on signal amplitude of each coil. If the signal amplitude deviation is within 5% among multi-coil array probe, the signal amplitude of multi-coil array probe is reliable. The proposed technology gives 2% signal deviation among multi-coil array probe. The proposed new technology gives reliability improvement and inspection time saving in eddy current inspection.

Fabrication and Characterization of Silicon Probe Tip for Vertical Probe Card Using MEMS Technology

  • Kim, Young-Min;Yu, In-Sik;Lee, Jong-Hyun
    • KIEE International Transactions on Electrophysics and Applications
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    • v.4C no.4
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    • pp.149-154
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    • 2004
  • This paper presents a silicon probe tip for vertical probe card application. The silicon probe tip was fabricated using MEMS technology such as porous silicon micromachining and deep- RIE (reactive ion etching). The thickness of the silicon epitaxial layers was 5 ${\mu}{\textrm}{m}$ and 7 ${\mu}{\textrm}{m}$, respectively. The width and length were 40 ${\mu}{\textrm}{m}$ and 600 ${\mu}{\textrm}{m}$, respectively. The probe structure was a multilayered structure and was composed of Au/Ni-Cr/Si$_3$N$_4$/n-epi layers. The height of the curled probe tip was measured as a function of the annealing temperature and time. Resistance characteristics of the probe tip were measured using a touchdown test.