• Title/Summary/Keyword: organic thin-film transistors

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Enhanced hole injection by oxygen plasma treatment on Au electrode for bottom-contact pentacene organic thin-film transistors

  • Kim, Woong-Kwon;Hong, Ki-Hyon;Kim, Soo-Young;Lee, Jong-Lam
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.74-77
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    • 2006
  • Thin $AuO_x$ layer was formed by $O_2$ plasma treatment on Au electrode. The surface work function of plasma treatment showed higher by 0.5 eV than that of bare Au, reducing the hole injection barrier at the Au/pentacene interface. Using $O_2$ plasma-treated Au source-drain electrodes, the field-effect mobility of bottom-contact pentacene-OTFT was increased from 0.05 to 0.1 $cm^2/Vs$.

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Transparent conducting ZnO thin films deposited by a Sol-gel method (솔젤법으로 제작한 ZnO 박막의 광전도특성 연구)

  • Kim, Gyeong-Tae;Kim, Gwan-Ha;Kim, Jong-Gyu;U, Jong-Chang;Kim, Chang-Il
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.320-320
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    • 2007
  • Nowadays, ZnO thin films are investigated as transparent conductive electrodes for use in optoelectronics devices including flat displays, thin films transistors, solar cells because of their unique optical and electrical properties. For the use as transparent conductive electrodes, a film has to have low resistivity, high absorption in the ultra violent light region and high optical transmission in the visible region. Different technologies such as electron beam evaporation, chemical vapor deposition, laser evaporation, DC and RF magnetron sputtering and have been reported to produce thin films of ZnO with adequate performance for applications. However, highly transparent and conductive doped-ZnO thin films deposited by a metal-organic decomposition method have not been reported before. In this work, the effect of dopant concentration, heating treatment and annealing in areducing atmosphere on the structure, morphology, electrical and optical properties of ZnO thin films deposited on glass substrates by a Sol-gel method are investigated.

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One step facile synthesis of Au nanoparticle-cyclized polyacrylonitrile composite films and their use in organic nano-floating gate memory applications

  • Jang, Seok-Jae;Jo, Se-Bin;Jo, Hae-Na;Lee, Sang-A;Bae, Su-Gang;Lee, Sang-Hyeon;Hwang, Jun-Yeon;Jo, Han-Ik;Wang, Geon-Uk;Kim, Tae-Uk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.307.2-307.2
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    • 2016
  • In this study, we synthesized Au nanoparticles (AuNPs) in polyacrylonitrile (PAN) thin films using a simple annealing process in the solid phase. The synthetic conditions were systematically controlled and optimized by varying the concentration of the Au salt solution and the annealing temperature. X-ray photoelectron spectroscopy (XPS) confirmed their chemical state, and transmission electron microscopy (TEM) verified the successful synthesis, size, and density of AuNPs. Au nanoparticles were generated from the thermal decomposition of the Au salt and stabilized during the cyclization of the PAN matrix. For actual device applications, previous synthetic techniques have required the synthesis of AuNPs in a liquid phase and an additional process to form the thin film layer, such as spin-coating, dip-coating, Langmuir-Blodgett, or high vacuum deposition. In contrast, our one-step synthesis could produce gold nanoparticles from the Au salt contained in a solid matrix with an easy heat treatment. The PAN:AuNPs composite was used as the charge trap layer of an organic nano-floating gate memory (ONFGM). The memory devices exhibited a high on/off ratio (over $10^6$), large hysteresis windows (76.7 V), and a stable endurance performance (>3000 cycles), indicating that our stabilized PAN:AuNPs composite film is a potential charge trap medium for next generation organic nano-floating gate memory transistors.

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Pixel Circuit with Threshold Voltage Compensation using a-IGZO TFT for AMOLED

  • Lee, Jae Pyo;Hwang, Jun Young;Bae, Byung Seong
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.5
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    • pp.594-600
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    • 2014
  • A threshold voltage compensation pixel circuit was developed for active-matrix organic light emitting diodes (AMOLEDs) using amorphous indium-gallium-zinc-oxide thin-film transistors (a-IGZO-TFTs). Oxide TFTs are n-channel TFTs; therefore, we developed a circuit for the n-channel TFT characteristics. The proposed pixel circuit was verified and proved by circuit analysis and circuit simulations. The proposed circuit was able to compensate for the threshold voltage variations of the drive TFT in AMOLEDs. The error rate of the OLED current for a threshold voltage change of 3 V was as low as 1.5%.

A Study of Soluble Pentacene Films for Organic Transistors (유기 트랜지스터 제작을 위한 Soluble Pentacene 박막의 특성연구)

  • Lim, Hun-Seong;Gong, Su-Cheol;Shin, Ik-Sub;Chang, Ho-Jung
    • Proceedings of the KAIS Fall Conference
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    • 2007.05a
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    • pp.136-138
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    • 2007
  • 본 연구에서는 유기박막트랜지스터 (OTFT, Organic Thin film Transistor) 제작을 위한 채널막으로 pentacene의 soluble 공정 과 soluble 공정 올 통하여 제작된 pentacene 박막의 특성 을 분석 하여 유기박막트랜지스터에 적용 여부를 조사하였다. Pentacene을 용해시키기 위한 용제로는 toluene과 chloroform을 사용하였으며, 각각의 용제에 대하여 열처리를 하여 pentacene 용액을 준비하였다. Spin-coating 법으로 pentacene 유기 박막을 제작하여 각 박막의 결정화 특성을 관찰하였다. XRD 회절 분석 결과 chloroform 올 이용한 pentacene 박막에서만 결정화가 된 것이 확인이 되었다. Hall effect measurement 분석 결과 chloroform올 이 용한, pentacene 박막의 전하농도 (Carrier Concentration)는 $-3.225{\times}1014(c{\cdot}cm^{-3})$를 나타내었고, 이동도 (Mobility)는 $3.5{\times}10^{-l}(cm^2{\cdot}V^{-1}{\cdot}S^{-1})$를 각각 나타내었다.

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Development of IGZO TFTs and Their Applications to Next-Generation Flat-Panel Displays

  • Hsieh, Hsing-Hung;Lu, Hsiung-Hsing;Ting, Hung-Che;Chuang, Ching-Sang;Chen, Chia-Yu;Lin, Yusin
    • Journal of Information Display
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    • v.11 no.4
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    • pp.160-164
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    • 2010
  • Organic light-emitting devices (OLEDs) have shown superior characteristics and are expected to dominate the nextgeneration flat-panel displays. Active-matrix organic light-emitting diode (AMOLED) displays, however, have stringent demands on the performance of the backplane. In this paper, the development of thin-film transistors (TFTs) based on indium gallium zinc oxide (IGZO) on both Gen 1 and 6 glasses, and their decent characteristics, which meet the AMOLED requirements, are shown. Further, several display prototypes (e.g., 2.4" AMOLED, 2.4" transparent AMOLED, and 32" AMLCD) using IGZO TFTs are demonstrated to confirm that they can indeed be strong candidates for the next-generation TFT technology not only of AMOLED but also of AMLCD (active-matrix liquid crystal display).

Capacitance-Voltage Characteristics of MIS Capacitors Using Polymeric Insulators

  • Park, Jae-Hoon;Choi, Jong-Sun
    • Journal of Information Display
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    • v.9 no.2
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    • pp.1-4
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    • 2008
  • In this study, we investigate the capacitance-voltage (C-V) characteristics of metal-insulator-semiconductor (MIS) capacitors consisting of pentacene, as an organic semiconductor, and polymeric insulators such as poly(4-vinylphenol) (PVP) orpolystyrene (PS) prepared by spin-coating process, to analyze the interfacial characteristics between pentacene and polymeric insulators. Compared with the device with PS, the MIS capacitor with PVP exhibited a pronounced shift in the flat-band voltage according to the bias sweep direction. This hysteric feature in the C-V characteristics is thought to be attributed to the trapped charges at the interface between pentacene and PVP owing to the hydrophilicity of PVP. From the experimental results, we can conclude that surface polarity of polymeric insulator has a critical effect on the interfacial properties, thereby affecting the bias stability of organic thin-film transistors.

The Photosensitive Insulating Materials as a Passivation Layer on a-Si TFT LCDs

  • Lee, Liu-Chung;Liang, Chung-Yu;Pan, Hsin-Hua;Huang, G.Y.;Gan, Feng-Yuan
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.695-698
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    • 2006
  • The photosensitive poly-siloxane material used as the passivation layers for the conventional back channel etched (BCE) thin film transistors (TFTs) has been investigated. Through the organic material, the TFT array fabrication process can be reduced and higher aperture ratio can be achieved for higher LCD panel performance. The interface between the organic passivation layer and the back channel of the amorphous active region has been improved by the back channel oxygen treatment and the devices exhibits lower leakage current than the conventional silicon nitride passivation layer of BCE TFTs. The leakage currents between Indium-tin-oxide (ITO) pixels and the TFT devices and its mechanism have also been investigated in this paper.

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Electrical Characteristics of Pentacene-based TFTs with Stacked Gate Dielectrics

  • Kang, Chang-Heon;Park, Jae-Hoon;Lee, Yong-Soo;Kim, Yeon-Ju;Choi, Jong-Sun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.653-655
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    • 2003
  • Using stacked organic gate insulators and active layer of pentacene deposited at elevated temperatures, pentacene-based organic thin-film transistors(OTFTs) with improved electrical characteristics have been fabricated. Stacked PVP(Polyvinylphenol)-polystyrene gate insulators could compensate the demerits and take advantage of the merits of each other [1]. Also, for the better device performance, moderate substrate heating and high deposition rate of pentacene active layer was adopted [2, 3].

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A STUDY ON THE ELECTRICAL CHARACTERISTICS IMPROVEMENTS OF PENTACENE-BASED ORGANIC THIN FILM TRANSISTORS (Pentacene을 이용한 유기 TFT의 전기적 특성 향상에 관한 연구)

  • Lee, Jong-Hyuk;Park, Jae-Hoon;Ryu, Se-Won;Kim, Hyung-Joon;Choi, Jong-Sun
    • Proceedings of the KIEE Conference
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    • 2001.07c
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    • pp.1515-1517
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    • 2001
  • In this work the electrical characteristics of organic TFTs with the semiconductor-insulator interfaces have been interested. Pentacene is used as an active semiconducting layer. The semiconductor layer of pentacene was thermally evaporated in vacuum at a pressure of about $2{\times}10^{-6}$ Torr and at a deposition rate of 0.3$\AA$/sec. Aluminium and gold were used for gate and source/drain electrodes. before pentacene is deposited on the insulator, the gate dielectric surfaces of two samples were rubbed with lateral and perpendicular to direction of the channel length respectively.

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