• Title/Summary/Keyword: on-resistor

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Design and Analysis of a NMOS Gate Cross-connected Current-mirror Type Bridge Rectifier for UHF RFID Applications (UHF RFID 응용을 위한 NMOS 게이트 교차연결 전류미러형 브리지 정류기의 설계 및 해석)

  • Park, Kwang-Min
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.6
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    • pp.10-15
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    • 2008
  • In this paper, a new NMOS gate cross-connected current-mirror type bridge rectifier for UHF RFID applications is presented. The DC converting characteristics of the proposed rectifier are analyzed with the high frequency equivalent circuit and the gate capacitance reduction technique for reducing the gate leakage current due to the increasing of operating frequency is also proposed theoretically by circuitry method. As the results, the proposed rectifier shows nearly same DC output voltages as the existing NMOS gate cross-connected rectifier, but it shows the gate leakage current reduced to less than 1/4 and the power consumption reduced more than 30% at the load resistor, and it shows more stable DC supply voltages for the valiance of load resistance. In addition, the proposed rectifier shows high enough and well-rectified DC voltages for the frequency range of 13.56MHz HF(for ISO 18000-3), 915MHz UHF(for ISO 18000-6), and 2.45 GHz microwave(for ISO 18000-4). Therefore, the proposed rectifier can be used as a general purpose one to drive RFID transponder chips on various RFID systems which use specified frequencies.

Effect of Annealing Conditions on Properties of Ni-Cr Thin Film Resistor (Ni-Cr 박막 저항의 특성에 미치는 열처리 조건의 영향)

  • 류승목;명성재;구본급;강병돈;류제천;김동진
    • Journal of the Microelectronics and Packaging Society
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    • v.11 no.1
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    • pp.37-42
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    • 2004
  • In the electronic components and devices fabrication, thin film resistors with low TCR (temperature coefficient of resistance) and high precision have been used over 3 ㎓ microwave in recent years. Ni-Cr alloys thin films resistors is one of the most commonly used resistive materials because they have low TCR and highly stable resistance. In this work, we fabricated thin film resistors using Evanohm alloys target(72Ni-20Cr-3Al-4Mn-Si) of S-type with excellent resistors properties by RF-sputtering. Also we reported the best annealing condition of thin film resistors for microwave to observe microstructure and electronic properties of thin film according to annealing conditions($200^{\circ}C$, $300^{\circ}C$, $400^{\circ}C$, $500^{\circ}C$)

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Development of active discharge tester for high capacity lithium-ion battery (대용량 리튬 이온 배터리용 Active 방전시험기의 개발)

  • Park, Joon-Hyung;Yunana, Gani Dogara;Park, Chan Won
    • Journal of Industrial Technology
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    • v.40 no.1
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    • pp.13-18
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    • 2020
  • Lithium-ion batteries have a small volume, light weight and high energy density, maximizing the utilization of mobile devices. It is widely used for various purposes such as electric bicycles and scooters (e-Mobility), mass energy storage (ESS), and electric and hybrid vehicles. To date, lithium-ion batteries have grown to focus on increasing energy density and reducing production costs in line with the required capacity. However, the research and development level of lithium-ion batteries seems to have reached the limit in terms of energy density. In addition, the charging time is an important factor for using lithium-ion batteries. Therefore, it was urgent to develop a high-speed charger to shorten the charging time. In this thesis, a discharger was fabricated to evaluate the capacity and characteristics of Li-ion battery pack which can be used for e-mobility. To achieve this, a smart discharger is designed with a combination of active load, current sensor, and temperature sensor. To carry out this thesis, an active load switching using sensor control circuit, signal processing circuit, and FET was designed and manufactured as hardware with the characteristics of active discharger. And as software for controlling the hardware of the active discharger, a Raspberry Pi control device and a touch screen program were designed. The developed discharger is designed to change the 600W capacity battery in the form of active load.

Modeling for Memristor and Design of Content Addressable Memory Using Memristor (멤리스터의 모델링과 연상메모리(M_CAM) 회로 설계)

  • Kang, Soon-Ku;Kim, Doo-Hwan;Lee, Sang-Jin;Cho, Kyoung-Rok
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.7
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    • pp.1-9
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    • 2011
  • Memristor is a portmanteau of "memory resistor". The resistance of memristor is changed depends on the history of electric charge that passed through the device and it is able to memorize the last resistance after turning off the power supply. This paper presents this device that has a high chance to be the next generation of commercial non-volatile memory and its behavior modeling using SPICE simulation. The memristor MOS content addressable memory (M_CAM) is also designed and simulated using the proposed behavioral model. The proposed M_CAM unit cell area and power consumption show an improvement around 40% and 96%, respectively, compare to the conventional SRAM based CAMs. The M_CAM layout is also implemented using 0.13${\mu}m$ mixed-signal CMOS process under 1.2 V supply voltage.

In-situ P-doped LPCVD Poly Si Films as the Electrodes of Pressure Sensor for High Temperature Applications (고온용 압력센서 응용을 위한 in-situ 인(P)-도핑 LPCVD Poly Si 전극)

  • Choi, Kyeong-Keun;Kee, Jong;Lee, Jeong-Yoon;Kang, Moon Sik
    • Journal of Sensor Science and Technology
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    • v.26 no.6
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    • pp.438-444
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    • 2017
  • In this paper, we focus on optimization of the in-situ phosphorous (P) doping of low-pressure chemical vapor deposited (LPCVD) poly Si resistors for obtaining near-zero temperature coefficient of resistance (TCR) at temperature range from 25 to $600^{\circ}C$. The deposited poly Si films were annealed by rapid thermal anneal (RTA) process at the temperature range from 900 to $1000^{\circ}C$ for 90s in nitrogen ambient to relieve intrinsic stress and decrease the TCR in the poly Si layer and get the Ohmic contact. After the RTA process, a roughness of the thin film was slightly changed but the grain size and crystallinity of the thin film with the increase in anneal temperature. The film annealed at $1,000^{\circ}C$ showed the behavior of Schottky contact and had dislocations in the films. Ohmic contact and TCR of $334.4{\pm}8.2$ (ppm/K) within 4 inch wafer were obtained in the measuring temperature range of 25 to $600^{\circ}C$ for the optimized 200 nm thick-poly Si film with width/length of $20{\mu}m/1,800{\mu}m$. This shows the potential of in-situ P doped LPCVD poly Si as a resistor for pressure sensor in harsh environment applications.

Fabrication and Characterization of Low Noise Amplifier using MCM-C Technology (MCM-C 기술을 이용한 저잡음 증폭기의 제작 및 특성평가)

  • Cho, H.M.;Lim, W.;Lee, J.Y.;Kang, N.K.;Park, J.C.
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2000.11a
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    • pp.61-64
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    • 2000
  • We fabricated and characterized Low Noise Amplifier (LNA) using MCM-C (Multi-Chip-Module-Cofired) technology for 2.14 GHz IMT-2000 mobile terminal application. First, We designed LNA circuits and simulated it's high frequency characteristics using circuits simulator. For the simulation, we adopted high frequency libraries of all the devices used in LNA samples. By the simulation, Gain was 17 dB and Noise Figure was 1.4 dB. We used multilayer process of LTCC (Low Temperature Co-fired Ceramics) substrate and conductor, resistor pattern for the MCM-C LNA fabrication. We made 2 buried inductors, 2 buried capacitors and 3 buried resistors. The number of the total layers was 6. On the top layer, we patterned microstrip line and pads for the SMT device. We measured the high frequency characteristics, and the results were 14.7 dB Gain and 1.5 dB Noise Figure.

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Effect of Annealing Conditions on Properties of Ni-Cr Thin Film Resistor (Ni-Cr 박막 저항의 특성에 미치는 열처리 조건의 영향)

  • Ryu Sung-Rok;Myung Sung-Jea;Koo Bon-Keup;Kang Beong-Don;Ryu Jei-Chun;Kim Dong-Jin
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2003.11a
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    • pp.145-150
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    • 2003
  • In the electronic components and devices fabrication, thin film resistors with low TCR(temperature coefficient of resistance) and high precision have been used over 3 GHz microwave in recent years. Ni-Cr alloys thin films resistors is one of the most commonly used resistive materials because it has low TCR and highly stable resistance. In this work, we fabricated thin film resistors using Evanohm alloys target(72Ni-20Cr-3Al-4Mn-Si) of s-type with excellent resistors properties by RF-sputtering. Also we reported best annealing conditions of thin film resistors for microwave to observe microstructure and electronic properties of thin film according to annealing conditions$(200^{\circ}C,\;300^{\circ}C,\;400^{\circ}C,\;500^{\circ}C)$.

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Design of a 1.2V 7-bit 800MSPS Folding-Interpolation A/D Converter with Offset Self-Calibration (Offset Self-Calibration 기법을 적용한 1.2V 7-bit 800MSPS Folding-Interpolation A/D 변환기의 설계)

  • Kim, Dae-Yun;Moon, Jun-Ho;Song, Min-Kyu
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.47 no.3
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    • pp.18-27
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    • 2010
  • In this paper, a 1.2V 7-bit 1GSPS A/D converter with offset self-calibration is proposed. The proposed A/D converter structure is based on the folding-interpolation whose folding rate is 2, interpolation rate is 8. Further, for the purpose of improving the chip performance, an offset self-calibration circuit is used. The offset self-calibration circuit reduce the variation of the offset-voltage,due to process mismatch, parasitic resistor, and parasitic capacitance. The chip has been fabricated with a 1.2V 65nm 1-poly 6-metal CMOS technology. The effective chip area is $0.87mm^2$ and the power dissipates about 110mW at 1.2V power supply. The measured SNDR is about 39.1dB when the input frequency is 250MHz at 800MHz sampling frequency. The measured SNDR is 3dB higher than the same circuit without any calibration.

Active Damping of LCL Filter for Three-phase PWM Inverter without Additional Hardware Sensors (추가적인 센서가 필요 없는 3상 PWM 인버터의 LCL 필터 능동댐핑)

  • An, Byoung-Woong;Shin, Hee-Keun;Kim, Hag-Wone;Cho, Kwan-Yuhl;Han, Byoung-Moon
    • The Transactions of the Korean Institute of Power Electronics
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    • v.18 no.1
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    • pp.10-17
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    • 2013
  • In this paper, a new active damping method of LCL filter without capacitor voltage sensors is proposed for 3 phase PWM Inverter. Normally, L filter or LCL filter is used as an output filter of grid connected PWM inverter. An LCL filter has more excellent performance than L filter to reduce harmonic current, so the small inductance value can be used. However, the resonance problem in LCL filter is happen due to the zero impedance by the addition of LC branch. To solve the resonance problem, the various active damping method has been proposed so far. Generally, the virtual resistor active damping methods is required to additional hardware sensors for measurement of capacitor voltage and current. In this paper, the new active damping method is proposed without any capacitor voltage or current sensors. In the proposed method, the resonance component of the capacitor voltage of LCL filter can be observed by a simple MRAS(Model Reference Adaptive System) observer without additional hardware sensors, and this component is suppressed by feedforward compensation. The validity of the proposed method is proven by simulation and experiment on the 3-phase PWM inverter system.

Plasma control by tuning network modification in 4MHz ionized-physical vapor deposition (4MHz I-PVD장치에서 정합회로를 이용한 플라즈마 제어)

  • 주정훈
    • Journal of the Korean Vacuum Society
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    • v.8 no.1
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    • pp.75-82
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    • 1999
  • Ion energy is one of the crucial property in thin film deposition by internal ICP assisted I-PVD. As ion energy is determined by the difference between the plasma potential and the substrate bias potential, ICP excitation frequency was tested with medium frequency of 4 MHz and two types of tuning circuits, alternate and floating LC network with a biasing resistor, were tested. The results showed that plasma potential was less than 5 V in a range of Ar pressures, 5mTorr to 30 mTorr, at 4 MHz RF 600 W and 60 V of maximum RF antenna voltage was maintained either at RF input or output terminal. By proper control of RLC circuit installed after after RF antenna, 50V of RF induced voltage on RF antenna was obtained at 500W input power. The total impedance of RF antenna and plasma was around 10$\Omega$, and minimum RF voltage was obtained with a condition of lowest reactance at most 0.05$\Omega$.

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