• Title/Summary/Keyword: nanophotonics

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Effect of Cavity Material on the Q-Factor Measurement of Microwave Dielectric Materials (캐비티 재질이 마이크로파 유전체 공진기의 Q값 측정에 미치는 영향)

  • Park, Jae-Hwan;Park, Jae-Gwan
    • Journal of the Microelectronics and Packaging Society
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    • v.18 no.3
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    • pp.39-43
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    • 2011
  • Effects of cavity material on the Q-factor measurement of microwave dielectric materials were studied by HFSS simulation and the measurements using metal cavity. $TE_{01\delta}$ mode resonant frequency was determined from the electric and magnetic field patterns and the loaded Q-factor was calculated from 3dB bandwidth of $S_{21}$ spectrum. When the cavity metal materials were Cu, SUS and Au cavity, the level of Q-factor was similar. However, Q-factor was significantly decreased when the cavity metal material was CuO. The Q-factor measurements of dielectric resonator by network analyzer using various metal cavity exhibits consistent behavior.

하이퍼볼릭 메타물질: 깊은 서브파장 나노포토닉스를 위한 신개념 플랫폼

  • No, Jun-Seok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.78-78
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    • 2015
  • Metamaterials, artificially structured nanomaterials, have enabled unprecedented phenomena such as invisibility cloaking and negative refraction. Especially, hyperbolic metamaterials also known as indefinite metamaterials have unique dispersion relation where the principal components of its permittivity tensors are not all with the same signs and magnitudes. Such extraordinary dispersion relation results in hyperbolic dispersion relations which lead to a number of interesting phenomena, such as super-resolution effect which transfers evanescent waves to propagating waves at its interface with normal materials and, the propagation of electromagnetic waves with very large wavevectors comparing they are evanescent waves and thus decay quickly in natural materials. In this abstract, I will focus discussing our efforts in achieving the unique optical property overcoming diffraction limit to achieve several extraordinary metamaterials and metadevices demonstration. First, I will present super-resolution imaging device called "hyperlens", which is the first experimental demonstration of near- to far-field imaging at visible light with resolution beyond the diffraction limit in two lateral dimensions. Second, I will show another unique application of metamaterials for miniaturizing optical cavity, a key component to make lasers, into the nanoscale for the first time. It shows the cavity array which successfully captured light in 20nm dimension and show very high figure of merit experimentally. Last, I will discuss the future direction of the hyperbolic metamaterial and outlook for the practical applications. I believe our efforts in sub-wavelength metamaterials having such extraordinary optical properties will lead to further advanced nanophotonics and nanooptics research.

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Error Analysis for Microwave Permittivity Measurement using Post Resonator Method (Post Resonator 방법에 의한 마이크로파 유전율 측정에서의 오차 분석)

  • Cho, Mun-Seong;Lim, Donggun;Park, Jae-Hwan;Park, Jae-Gwan
    • Journal of the Microelectronics and Packaging Society
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    • v.19 no.3
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    • pp.43-48
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    • 2012
  • Errors of relative permittivity calculation caused by the variation of sample aspect ratio (diameter/height) and measuring geometry were analyzed by computer simulation and measurement. Firstly, the $S_{21}$ spectrum of the sample (permittivity 38) was simulated in the post resonator measuring apparatus by HFSS simulation. Then, the relative permittivity was calculated from the $TE_{011}$ mode resonant frequency. The relative permittivity varied by ca. 0.3% with sample aspect ratio variation (D/H=0.8~1.6). The relative permittivity varied by ca. 1~10% when the 1~10% of air-gap was introduced in between the dielectric disk and upper conductor. All the simulation results showed consistent tendency with real measurement.

Periodically Aligned Metal Nanoparticle Array for a Plasmonic Absorber and Its Fabrication Technique (플라즈모닉 흡수체를 위한 금속 나노입자 주기구조 제작 기술)

  • Choi, Minjung;Ryu, Yunha;Bae, Kyuyoung;Kang, Gumin;Kim, Kyoungsik
    • Korean Journal of Optics and Photonics
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    • v.28 no.6
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    • pp.361-365
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    • 2017
  • In this paper, we demonstrate a facile fabrication technique for a periodically aligned metal nanoparticle array, for a narrow-band plasmonic absorber. The metal nanoparticles are fabricated by e-beam evaporation and heat treatment processes on top of a periodic aluminum groove template. The plasmonic absorber is constructed with the transferred metal nanoparticle array, sputtered 33-nm-thick $Al_2O_3$, and 200-nm-thick metal reflector layers on silicon substrate. 46-nm-diameter and 76-nm-lattice metal-nanoparticle-array-based plasmonic absorber has performed as a narrow-band absorber with a central wavelength of 572 nm and full width at half maximum (FWHM) of 109.9 nm.

Influence of InGaAs Capping Layers on the Properties of InAs/GaAs Quantum Dots (InAs/GaAs 양자점의 발광특성에 대한 InGaAs 캡층의 영향)

  • Kwon, Se Ra;Ryu, Mee-Yi;Song, Jin Dong
    • Journal of the Korean Vacuum Society
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    • v.21 no.6
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    • pp.342-347
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    • 2012
  • The optical properties of InAs quantum dots (QDs) grown on a GaAs substrates by migration enhanced molecular beam epitaxy method have been investigated by using photoluminescence (PL) and time-resolved PL measurements. The luminescence properties of InAs/GaAs QDs have been studied as functions of temperature, excitation laser power, and emission wavelength. The PL peak of InAs QDs capped with $In_{0.15}Ga_{0.85}As$ layer (QD2) measured at 10 K is redshifted about 80 nm compared with that of InAs QDs with no InGaAs layer (QD1). This redshift of QD2 is attributed to the increase in dot size due to the diffusion of In from the InGaAs capping layer. The PL decay times of QD1 and QD2 at 10 K are 1.12 and 1.00 ns taken at the PL peak of 1,117 and 1,197 nm, respectively. The reduced decay time of QD2 can be explained by the improved carrier confinement and enhanced wave function overlap due to increased QD size. The PL decay times for both QD1 and QD2 are independent on the emission wavelength, indicating the uniformity of dot size.