• 제목/요약/키워드: mirror flatness

검색결과 16건 처리시간 0.061초

마이크로 UV성형을 통한 초소형 광픽업용 마이크로 미러 어레이 제작 (Fabrication of Micro Mirror Array for Small Form Factor Optical Pick-up by Micro UV-Molding)

  • 최용;임지석;김석민;손진승;김해성;강신일
    • 소성∙가공
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    • 제14권5호
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    • pp.477-481
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    • 2005
  • Wafer scale micro mirror array with high surface quality for small form factor (SFF) optical pick-up was fabricated by micro UV-molding. To replicate micro mirror array for SFF optical pick-up, a high- precision mold was fabricated using micro-machining technology. Wafer scale micro mirror array was UV-molded using the mold and then the process was optimized experimentally. The surface flatness and roughness of UV-molded micro mirror array were measured by white light scanning interferomety system and analyzed the transcribing characteristics. Finally, the measured flatness of UV-molded micro mirror away for SFF optical pick-up, which was fabricated in the optimum processing condition, was less than 70nm.

마이크로 UV 성형을 통한 초소형 광픽업용 마이크로 미러 어레이 제작 (Fabrication of micro mirror array for small form factor optical pick-up by micro UV-molding)

  • 최용;임지석;김석민;손진승;김해성;강신일
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2005년도 춘계학술대회 논문집
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    • pp.47-50
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    • 2005
  • In this study, micro mirror array for small form factor optical pick-up was replicated by micro UV-molding. First, mold for micro mirror array was fabricated using micromachining. Also, to analyze the characteristics of the surface quality, flatness of replicated mirror surface were measured by white light scanning inteferometry system. The results show that the micro mirror array with a sufficient surface quality can be obtained by polymer replication process.

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광학적 방법을 이용한 마이크로 구조물의 편평도 측정 (Flatness Measurement of Microstructures using an Optical Method)

  • 민성욱;정재훈;송민호;이병호
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1996년도 하계학술대회 논문집 C
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    • pp.1735-1737
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    • 1996
  • Using a modified Michelson interferometer configuration, the flatness of micro mirror cell surface was probed. Interferograms were captured at CCD camera plane by defocusing object beam onto the micro mirror with microscope objective lens. And these were compared with the interferograms made with the flat metallic mirror. Also, the theoretical analysis is presented.

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기판으로부터 수직 반사를 위한 실리콘 마이크로 미러의 설계와 제작 (Design and fabrication of a micromirror using silicon bulk micromachining for out-of-plane right angle reflection)

  • 장윤호;김용권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2002년도 하계학술대회 논문집 C
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    • pp.1985-1987
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    • 2002
  • Silicon bulk micromachined micromirrors are designed and fabricated for out-of-plane right angle reflection. The micromirror is comprised of a minor plate, springs, magnetic bars and electrodes. Single crystalline silicon is used for a flatness improvement of a mirror plate. Out-of-plane right angle reflection requires a 45 degree operation of the micromirror. The micromirrors are operated by applying a magnetic field, which is generated by a coil located below a substrate. For an individual mirror operation, each mirror is clamped using an electrostatic force against the electromagnetic force. Angular deflections are measured and compared with theoretical data. The micro mirror operates up to 45 degree when magnetic field is 4 kA/m which is generated by a 115 mA coil current Simple addressing is tested, and it is shown that a clamping voltage is less than 5V.

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비정질 실리콘을 이용한 미세 피치 적외선 이미지 센서 제조 및 특성 (Fabrication and characterization of fine pitch IR image sensor using a-Si)

  • 김경민;김병일;김희연;장원수;김태현;강태영
    • 센서학회지
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    • 제19권2호
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    • pp.130-136
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    • 2010
  • The microbolometer array sensor with fine pitch pixel array has been implemented to the released amorphous silicon layer supported by two contact pads. For the design of focal plane mirror with geometrical flatness, the simple beam test structures were fabricated and characterized. As the beam length decreased, the effect of beam width on the bending was minimized, Mirror deformation of focal plane in a real pixel showed downward curvature by residual stress of a-Si and Ti layer. The mirror tilting was caused by the mis-align effect of contact pad and confirmed by FEA simulation results. The properties of bolometer have been measured as such that the NETD 145 mK, the TCR -2 %/K, and thermal time constant 1.99 ms.

Measurement of a Mirror Surface Topography Using 2-frame Phase-shifting Digital Interferometry

  • Jeon, Seok-Hee;Gil, Sang-Keun
    • Journal of the Optical Society of Korea
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    • 제13권2호
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    • pp.245-250
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    • 2009
  • We propose a digital holographic interference analysis method based on a 2-frame phase-shifting technique for measuring an optical mirror surface. The technique using 2-frame phase-shifting digital interferometry is more efficient than multi-frame phase-shifting techniques because the 2-frame method has the advantage of a reduced number of interferograms, and then takes less time to acquire the wanted topography information from interferograms. In this measurement system, 2-frame phase-shifting digital interferograms are acquired by moving the reference flat mirror surface, which is attached to a piezoelectric transducer, with phase step of 0 or $\pi$/2 in the reference beam path. The measurements are recorded on a CCD detector. The optical interferometry is designed on the basis of polarization characteristics of a polarizing beam splitter. Therefore the noise from outside turbulence can be decreased. The proposed 2-frame algorithm uses the relative phase difference of the neighbor pixels. The experiment has been carried out on an optical mirror which flatness is less than $\lambda$/4. The measurement of the optical mirror surface topography using 2-frame phase-shifting interferometry shows that the peak-to-peak value is calculated to be about $0.1779{\mu}m$, the root-mean-square value is about $0.034{\mu}m$. Thus, the proposed method is expected to be used in nondestructive testing of optical components.

Piezo-electrically Actuated Micro Corner Cube Retroreflector (CCR) for Free-space Optical Communication Applications

  • Lee, Duk-Hyun;Park, Jae-Y.
    • Journal of Electrical Engineering and Technology
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    • 제5권2호
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    • pp.337-341
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    • 2010
  • In this paper, an extremely low voltage operated micro corner cube retroreflector (CCR) was fabricated for free-space optical communication applications by using bulk silicon micromachining technologies. The CCR was comprised of an orthogonal vertical mirror and a horizontal actuated mirror. For low voltage operation, the horizontal actuated mirror was designed with two PZT cantilever actuators, torsional bars, hinges, and a mirror plate with a size of $400{\mu}m{\times}400{\mu}m$. In particular, the torsional bars and hinges were carefully simulated and designed to secure the flatness of the mirror plate by using a finite element method (FEM) simulator. The measured tilting angle was approximately $2^{\circ}$ at the applied voltage of 5 V. An orthogonal vertical mirror with an extremely smooth surface texture was fabricated using KOH wet etching and a double-SOI (silicon-on-insulator) wafer with a (110) silicon wafer. The fabricated orthogonal vertical mirror was comprised of four pairs of two mutually orthogonal flat mirrors with $400{\mu}m4 (length) $\times400{\mu}m$ (height) $\times30{\mu}m$ (thickness). The cross angles and surface roughness of the orthogonal vertical mirror were orthogonal, almost $90^{\circ}$ and 3.523 nm rms, respectively. The proposed CCR was completed by combining the orthogonal vertical and horizontal actuated mirrors. Data transmission and modulation at a frequency of 10 Hz was successfully demonstrated using the fabricated CCR at a distance of approximately 50 cm.

NOVEL SURFACE PROFILER SYTSTEM FOR INSPECTION OF FLAT PANEL DISPLAY

  • Kimura, Munehiro;Akahane, Tadashi;Iwata, Tetsuya
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.325-327
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    • 2004
  • Novel surface profiler system for inspection of the display components is demonstrated In the case of the liquid crystal display, for example, not only the flatness of the alignment film but also the quality of rubbing can be inspected. Furthermore, the shape of the component such as the color filter, electrode and mirror can be inspected without removing each component.

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Effects of Form Errors of a Micromirror Surface on the Optical System of the TMATM(Thin-film Micromirror ArrayTM) Projector

  • Jo, Yong-Shik;Kim, Byoung-Chang;Kim, Seung-Woo;Hwang, Kyu-Ho
    • International Journal of Precision Engineering and Manufacturing
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    • 제1권1호
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    • pp.98-105
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    • 2000
  • The projectors using liquid crystal display(LCD) have faults such as low optical efficiency, low brightness and even heat generation. To solve these problems reflective-type spatial light modulators based on MEMS (Microelectromechanical Systems) technology have emerged. Digital Micromirror DeviceTM(DMDTM), which was already developed by Texas Instruments Inc., and Thin-film Micromirror ArrayTM(TMATM), which has been recently developed by Daewoo Electronics Co., are the representative examples. The display using TMATM has particularly much higher optical efficiency than other projectors. But the micromirrors manufactured by semiconductor processes have inevitable distortion because of the limitations of the manufacturing processes, so that the distortions of their surfaces have great influence on the optical efficiency of the projector. This study investigated the effects of mirror flatness on the optical performance, including the optical efficiency, of the TMATM projector. That is to say, as a part of the efforts to enhance the performance of the TMATM projector, how much influence the form errors of a micromirror surface exert on the optical efficiency and the modulation of gray scale of the projector were analyzed through a pertinent modeling and simulations.

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거친 표면 형상측정을 위한 큰 등가파장 회절격자 간섭계 (Diffraction grating interferometer of large equivalent wavelength for flatness testing of rough surfaces)

  • 황태준;김승우
    • 한국광학회지
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    • 제15권1호
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    • pp.56-62
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    • 2004
  • 거친 표면의 형상을 측정하기 위해서 큰 등가파장 회절격자간섭계를 구성하였다. 제안된 시스템은 두 개의 투과회적격자를 사용해서 두 광을 측정물체에 각각 다른 각으로 경사지게 입사시켜서, 그 입사각에 따른 큰 등가파장의 간섭무늬를 얻는다. 이런 등가파장 간섭계는 기존의 광학 간섭계보다 넓은 영역에 걸쳐서 거친 표면을 빠른 시간에 측정할 수 있다. 제안된 시스템은 편광광속분할기와, 광속분할기, 프리즘을 사용해서, 불필요한 광을 제거하는 부분을 설계하여, 회절격자의 불필요한 회절광을 최소화하고, 회절격자의 형상으로 인한 시스템 오차를 줄였다. 뿐만 아니라, 큰 작동거리를 가지며 정렬이 쉽다. 측정정밀도를 향상시키기 위하여 위상편이법을 도입하였고, 등가파장보정법을 제안하였다. 실험을 통해서 측정시스템을 평가해보았다.