• 전기학회논문지
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• 제56권1호
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• pp.156-160
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• 2007

Surface plasmon resonance(SPR) has been widely studied for biological and chemical sensing applications. The present study conducts numerical simulation for the single and bimetallic layer SPR configurations by using the multiple beam interference matrix(MBIM) method to investigate the influence of wave interference and complex refractive indices of materials on optical characteristics such as reflectance and optical phase shift which are used for sensing. First, calculated reflectances are compared with experimental data for validation. In addition, in the single film structures this study finds out the appropriate film thicknesses with minimum reflectance for cases of gold film and silver film. For a bimetallic silver-gold film structure, in particular, the bimetallic film thicknesses that has the minimum reflectance are found 36 nm for silver and 5 nm for gold. From the results, the use of phase shift would be useful compared to reflectance in determining the SPR configuration because the phase shift becomes more sensitive than reflectance.

• 한국지구과학회지
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• 제40권3호
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• pp.212-226
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• 2019

극궤도 위성(Aura)에 탑재되어 운용 중인 Ozone Monitoring Instrument (OMI)를 이용하여 동아시아 지역에 대한 등가 람버시안 반사도(Lambertian Equivalent Reflectance; LER)를 유도하였다. 본 연구의 LER 기후값(2004년 10월-2007년 9월)은 기존 OMI 및 MODIS 결과와 다음 대기환경 변수의 관점에서 비교분석되었다. 파장(자외선, 가시광선), 지표 특성(육지, 해양), 그리고 구름 제거. 자외선 및 가시광선 파장역(328-500 nm)에서 산출된 LER은 최소 반사도뿐만 아니라 세 종류 하위 평균(1, 5, 10% 이내)으로 산출되었다. 이들 중에 10% 평균값이 OMI 결과와 가장 잘 일치하였다. 여기서 상관계수는 0.88, 평균 제곱근 오차는 1.0%. 그리고 평균 편차는 -0.3%이었다. 10% 평균값과 기존 OMI LER값은 해양에서 가시광선에 비하여 자외선 영역에서 큰(~2%) 반면에 육지에서는 작게(~1%) 나타났다. 또한 파장 및 지표 특성에 따른 LER 변동폭은 육지 및 가시광선 조건에서, 특히 만년설 및 사막 지역에서 크게 나타났다(~3%). 최소 반사도값은 해양 및 육지의 표본 지역에서 MODIS에 비하여 약 1.4% 과대 산출되었다. 이러한 원인은 고해상도 MODIS 자료에서의 효과적인 구름 제거에 있다고 분석되었다. MODIS에 대한 10% 평균값의 상대 오차는 기존 OMI 산출물에 비하여 해양에서 작았으나(-0.6%) 육지에서는 컸다(1.5%). OMI 산출물 경우에 육지에서의 작은 상대 오차는 Landsat 자료 이용한 효과적인 구름 제거에 있다고 추정되었다. 본 연구는 정지궤도 환경위성(예, GEMS) 관측을 이용한 지면반사도 산출에 기여할 것으로 기대된다.

• 대한원격탐사학회지
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• 제30권5호
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• pp.627-639
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• 2014

인공위성의 가시 영역 관측으로부터 에어로솔의 정량적인 정보를 산출하는데 있어, 지표면 반사도의 보정은 매우 중요한 역할을 한다. 이에 본 연구에서는 두 가지 방법을 이용하여 천리안위성의 기상탑재체로부터 관측된 가시채널의 반사도로부터 지표면 반사도를 산출하고, 상호 비교 하여 정확도를 검증하고자 하였다. 첫 번째 방법은 최소 반사도법으로, 동일한 화소에서 일정 기간 동안 관측된 반사도 중 최소값이 에어로솔에 의한 영향 없이 지표반사에 의한 영향만을 포함한다는 가정을 기반으로, 대기산란 효과를 보정하여 지표면 반사도를 산출하는 방법이다. 두 번째 방법은 미리 알고 있는 에어로솔 정보를 고려하여 대기-에어로솔 효과를 보정함으로써 지표면 반사도를 얻는 것으로 본 연구에서 대기 보정법 이라 칭한다. 두 번째 방법을 적용하기 위해서는 정확한 에어로솔 정보가 요구되므로, 에어로솔 광학두께의 오차범위가 0.01 (${\geq}440nm$) 이내인 것으로 알려진 AERONET의 산출물을 이용하였다. 본 연구의 주요 목적은 최소 반사도법을 통하여 산출되는 지표면 반사도가 어느 정도의 정확도를 가지는지를 파악하는데 있어, 대기 보정법을 통하여 산출되는 값을 기준 값으로 두고 비교 분석을 수행하였다. 또한, 대기 중 존재하는 배경광학두께가 최소 반사도법의 정확도에 미치는 영향을 분석해보고자 하였다. 서울 지역에서 2012년 봄철 기간(3월 ~ 5월)동안 AERONET 관측지점에서 산출된 결과를 분석 한 결과, 대기 보정법을 통해 산출된 지표면 반사도의 평균이 0.108로 나타났고, 배경광학두께에 대한 고려 없이 최소 반사도법을 통하여 산출된 지표면 반사도는 그에 비해 약 0.012 높은 값을 보였다. 한 편 배경광학두께를 고려하였을 경우 그 차이는 0.010으로 감소하여, 정확도 향상에 기여하였음을 확인하였다.

• 전자공학회논문지A
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• 제29A권3호
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• pp.41-46
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• 1992

In this paper we report how to design integrated-mirror etalons for surface-emitting lasers and photonic switching without time-consuming numerical calculation. It consists of the following two-step process (step 1) find the minimum reflectance to achieve the maximum allowable linewidth. (step 2) find the number of the quarter-wave layers in each mirror to realize the reflectance given by step 1. The condition for maximum transmission in an integrated- mirror etalon is also derived. Under this condition we can achieve the required linewidth with the minimum number of quarterwave layers.

• 한국인쇄학회지
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• 제16권3호
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• pp.121-131
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• 1998

The object color does not look same under the different light source. It depends on the surface spectral reflectance and the spectral distribution of light source. Therefore we should find the surface spectral reflectance of object color and the spectral distribution of light source for color reproduction. Using Wiener estimation, we can estimate the spectral reflectance from low dimensional images obtained with multi-band image acquisition system. The kind and the number of imaging filters have the effect on the estimation of the spectral reflectance. Therefore it is important that optimal filters are selected to minimize the error of the result. In this paper, we describe methods to select optimal filters with minimum error between measured and estimated surface spectral reflectance and to estimate surface spectral reflectance of Munsell color chart from six multi-band images by using Wiener estimation.

• 한국인쇄학회:학술대회논문집
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• 한국인쇄학회 1998년도 추계 논문 발표회 논문집
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• pp.1-6
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• 1998

The object color does not look same under the different light source. It depends on the surface spectral reflectance and the spectral distribution of light source. Therefore we should find the surface spectral reflectance of object color and the spectral distribution of light source for color reproduction. Using Winer estimation, we can reconstruct the spectral reflectance from low dimensional images obtained with a few filters. The kind and the number of filters have the effect on the estimation of the spectral reflectance. Therefore it is important that optimal filters are selected to minimize the error of the result. In this paper, we describe methods to select optimal filters with minimum error between measured and estimated surface spectral reflectance and to estimate surface spectral reflectance of Munsell color from six band images by using Wiener estimation.

• 대한원격탐사학회지
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• 제23권1호
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• pp.1-5
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• 2007

Relatively simplified method for determination of surface reflectance has been used by using the ratio between SWIR and VIS band reflectance over land surface. The surface reflectance ratios (SWIR/VIS) were estimated over land in Korea from Terra Moderate Resolution Imaging Spectre-radiometer (MODIS) L1 data. The ratios by using the minimum reflectance technique were lower than those by MODIS operational aerosol retrieval algorithm. Although the comparison between MODIS and sunphotometer Aerosol Optical Thickness (AOT) has a good correlation coefficient (R=0.84), slightly overestimated MODIS AOTs were shown with a slope of linear regression line of 0.89. The comparison between the ratio and AOT dearly exhibit that the error of MODIS AOT could be originated from the underestimated surface reflectances by MODIS operational algorithm.

• 한국전기전자재료학회논문지
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• 제21권2호
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• pp.99-103
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• 2008

To improve efficiency of solar cells, it is important to make a light trapping structure to reduce surface reflectance for increasing absorption of sun light within the solar cells. One of the promising methods that can reduce surface reflectance is isotropic texturing with acid solution based on hydrofluoric acid(HF), nitric acid($HNO_3$), and organic additives. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its different grain orientation. Isotropic texturing with acid solution can uniformly etch multicrystalline silicon wafers unrelated with grain orientation, so we can get low surface reflectance. In this paper, the acid texturing solution is made up of only HF and $HNO_3$ for easy controlling the concentration and low cost compared to acid solution with organic additives. $HNO_3$ concentration and dipping time were varied to find the condition of minimum surface reflectance. Textured surfaces were observed Scanning Electron Microscope(SEM) and surface reflectance were measured. The best result of arithmetic mean(wavelength from 400 nm to 1000 nm) reflectance with acid texturing is 4.64 % less than alkali texturing.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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• pp.16-17
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• 2007

To improve efficiency of solar cells, it is important to make a light trapping structure to reduce surface reflectance for increasing absorption of sun light within the solar cells. One of the promising methods that can reduce surface reflectance is isotropic texturing with acid solution based on hydrofluoric acid(HF), nitric acid($HNO_3$), and organic additives. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its different grain orientation. Isotropic texturing with acid solution can uniformly etch multicrystalline silicon wafers unrelated with grain orientation, so we can get low surface reflectance. In this paper, the acid texturing solution is made up of only HF and $HNO_3$ for easy controling the concentration and low cost compared to acid solution with organic additives. $HNO_3$ concentration and dipping time were varied to find the condition of minimum surface reflectance. Textured surfaces were observed Scanning Electron Microscope(SEM) and surface reflectance were measured. The best result of arithmetic mean(wavelength from 400nm to 1000nm) reflectance with acid texturing is 4.64% less than alkali texturing.

• 한국전기전자재료학회논문지
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• 제31권7호
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• pp.437-442
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• 2018

This work reports the preparation of Al-Ti based oxide thin films and their optical properties. Although the transmittance of a $TiO_2/Al2O_3$ bilayer structure was as high as 90% at wavelengths of 600 nm or larger, the reflectance of the bilayer reached its minimum at wavelengths of around 360 nm. The transmittance of an 89-nm-thick $TiO_2$ thin film rapidly increased and then decreased at a critical wavelength because of destructive interference. The wavelength corresponding to the reflectance minimum increased after an increase in $TiO_2$ film thickness. The smooth surface morphology of the AlTiO thin film was retained up to a film thickness of 65 nm, and the transmittance of the film was inversely proportional to film thickness, in accordance with the general tendency for optical films. The reflectance of the AlTiO film at visible light wavelengths was lower than that of the $TiO_2$ film, which implies that the AlTiO film is suitable for applications as an optical thin film layer in semitransparent solar cells.