• Title/Summary/Keyword: microscopy (electron, scanning)

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Formation and Characterization of Silicon Carbide Whiskers by Acheson Method (에치슨법에 의한 탄화규소 휘스카의 성장과 특성분석)

  • 주한용;김형준
    • Journal of the Korean Ceramic Society
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    • v.27 no.1
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    • pp.136-146
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    • 1990
  • Whiskers of SiC were grown from the mixture of silica and graphite powders by Acheson method(direct heating method). The structrua, morphological and chemical characterizations have been performed by X-ray diffractometer(XRD), transmission electron microscopy(TEM), optical microscopy(OM), scanning electron microscopy(SEM), X-ray photoelectron spectroscopy(XPS) and energy dispersive spectrometer(EDS). The growth mechanism of SiC whiskers is also discussed.

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Analysis of BNNT(Boron Nitride Nano Tube) synthesis by using Ar/N2/H2 60KW RF ICP plasma in the difference of working pressure and H2 flow rate

  • Cho, I Hyun;Yoo, Hee Il;Kim, Ho Seok;Moon, Se Youn;Cho, Hyun Jin;Kim, Myung Jong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.179-179
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    • 2016
  • A radio-frequency (RF) Inductively Coupled Plasma (ICP) torch system was used for boron-nitride nano-tube (BNNT) synthesis. Because of electrodeless plasma generation, no electrode pollution and effective heating transfer during nano-material synthesis can be realized. For stable plasma generation, argon and nitrogen gases were injected with 60 kW grid power in the difference pressure from 200 Torr to 630 Torr. Varying hydrogen gas flow rate from 0 to 20 slpm, the electrical and optical plasma properties were investigated. Through the spectroscopic analysis of atomic argon line, hydrogen line and nitrogen molecular band, we investigated the plasma electron excitation temperature, gas temperature and electron density. Based on the plasma characterization, we performed the synthesis of BNNT by inserting 0.5~1 um hexagonal-boron nitride (h-BN) powder into the plasma. We analysis the structure characterization of BNNT by SEM (Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy), also grasp the ingredient of BNNT by EELS (Electron Energy Loss Spectroscopy) and Raman spectroscopy. We treated bundles of BNNT with the atmospheric pressure plasma, so that we grow the surface morphology in the water attachment of BNNT. We reduce the advancing contact angle to purity bundles of BNNT.

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Geometrical and Electronic Structure of Epitaxial Graphene on SiC(0001) : A Scanning Tunneling Microscopy Study

  • Ha, Jeong-Hoon;Yang, Hee-Jun;Baek, Hong-Woo;Chae, Jung-Seok;Hwang, Beom-Yong;Kuk, Y.
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.368-368
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    • 2010
  • Monolayers of graphite can be grown by fine controlled surface graphitization on the surfaces of various metallic and semiconducting materials. Epitaxial graphene grown on polished silicon carbide crystal surfaces has drawn much attention due to well known vacuum annealing procedures from surface analysis methods, especially scanning tunneling microscopy(STM) and scanning tunneling spectroscopy(STS). In this study, we have grown single layer and few layer graphene on silicon terminated 6H-SiC(0001) crystals. The growth of graphene layers were observed by low energy electron diffraction(LEED) patterns. Scanning tunneling microscopy and spectroscopy measurements were performed to illustrate the electronic structure which may display some clue on the influence of the underlying structure. Spatially resolved STS results acquired at the edges of epitaxial graphene show in detail the electron density of states, which is compared to theoretical calculations. STM measurements were also done on graphene films grown by chemical vapor deposition(CVD) and transferred onto a SiC(0001) crystal. These observations may provide a hint for the understanding of carrier scattering at the edges.

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Synthesis and characterization of starch$^Na+$-montmorillonite clay nanocomposites

  • Na, Seong-Ki;Park, Jong-Shin
    • Proceedings of the Korean Fiber Society Conference
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    • 2003.10a
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    • pp.67-68
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    • 2003
  • Native corn starch and montmorillonite caly nanocomposites were prepared using the glycerol as the plasticizer. These were characterized by mechanical analysis, X-ray diffraction, infrared spectroscopy, differential scanning calorimetry, and scanning electron microscopy. The tensile strength increased with the clay content to a maximum point and then decreased due to gapping between the two phases. Dispersion of the layered silicate within the starch was verified using X-ray diffraction pattern. Examination of these materials by scanning electron showed that intercalates have good wetting to the starch surface.

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TDEAT single source를 사용한 TiN막의 특성평가

  • 김재호;이재갑;박상준;신현국;황찬용
    • Journal of the Korean Vacuum Society
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    • v.4 no.S1
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    • pp.28-33
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    • 1995
  • TiN 박막은 저온(<$500^{\circ}C$), 저압(1Torr)에서 Tetrakis(diethylamido)titanium[TDEAT, Ti(NEt2)4]single precursor를 사용하여 증착하였다. 증차고딘 박막은 SEM(Scanning Electron Microscopy)으로 surface morphology와 step coverage를 측정하였고, TEM(Transmission Electron Microscopy)분석결과 microcrystalline의 TiN을 확인하였다. XPS(X-ray Photoelectron Spectroscopy)분석결과에 따르면 $200-500^{\circ}C$구간에서는 $\beta$-hydogen elimination에 의한 반응이 일어나고 $600-700^{\circ}C$구간에서는 thermal decomposition에 의한 반응이 일어나고 있음을 알 수 있다. Carbon과 oxygen의 농도는 AES(Auger Electron Spectroscopy)를 사용하여 측정하였으며 온도가 감소할수록 carbon의 농도가 감소하는 경향을 보여주고 있다.

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Microstructural Evolution and Recrystallization Behavior Traced by Electron Channeling Contrast Imaging

  • Oh, Jin-Su;Yang, Cheol-Woong
    • Applied Microscopy
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    • v.48 no.4
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    • pp.130-131
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    • 2018
  • Electron channeling contrast imaging (ECCI) is one of the imaging techniques in scanning electron microscopy based on a variation in electron backscattering yield depending on the direction of the primary electron beam with respect to the crystal lattice. The ECCI provides not only observation of the distribution of individual grains and grain boundaries but also identification of the defects such as dislocations, twins, and stacking faults. The ECCI at the interface between recrystallized and deformed region of shot peening treated nickel clearly demonstrates the microstructural evolution during the recrystallization including original grain boundaries, and thus can provide better insight into the recrystallization behavior.

Electron Microscopy Observation of Protoplast Formation of Streptomyces mitakaensis (Streptomyces mitakaensis의 원형질체 형성과정의 전자현미경적 연구)

  • 한순옥;정미경;이형환
    • Microbiology and Biotechnology Letters
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    • v.15 no.2
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    • pp.95-97
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    • 1987
  • The protoplast formation of Streptomyces mitakaensis was monitored with scanning electron microscopy and transmission electron microscopy. The normal cells formed regular mycelium and spore, and their cell wall and cell membrane appeared to be normal, but the cell wall of the lysozyme treated cells (1 mg/$m\ell$) was damaged, which was finally disappeared from cells to become protoplast in 30 to 60 minutes.

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Characterization of Two-Dimensional Transition Metal Dichalcogenides in the Scanning Electron Microscope Using Energy Dispersive X-ray Spectrometry, Electron Backscatter Diffraction, and Atomic Force Microscopy

  • Lang, Christian;Hiscock, Matthew;Larsen, Kim;Moffat, Jonathan;Sundaram, Ravi
    • Applied Microscopy
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    • v.45 no.3
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    • pp.131-134
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    • 2015
  • Here we show how by processing energy dispersive X-ray spectrometry (EDS) data obtained using highly sensitive, new generation EDS detectors in the AZtec LayerProbe software we can obtain data of sufficiently high quality to non-destructively measure the number of layers in two-dimensional (2D) $MoS_2$ and $MoS_2/WSe_2$ and thereby enable the characterization of working devices based on 2D materials. We compare the thickness measurements with EDS to results from atomic force microscopy measurements. We also show how we can use electron backscatter diffraction (EBSD) to address fabrication challenges of 2D materials. Results from EBSD analysis of individual flakes of exfoliated $MoS_2$ obtained using the Nordlys Nano detector are shown to aid a better understanding of the exfoliation process which is still widely used to produce 2D materials for research purposes.

Comparison of Cell Wall Ultrastructures of Aspergillus nidulans in Presence and Absence of a MnpAp Mannoprotein

  • Jeong, Hyo-Yong;Whang, Sung-Soo;Chae, Keon-Sang
    • Animal cells and systems
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    • v.10 no.3
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    • pp.131-135
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    • 2006
  • The ultrastructure of Aspergillus nidulans cell wall in relation to a mannoprotein was studied by scanning and transmission electron microscopy. An mnpAp null-mutant, DMPV1, was used as a negative control of a wild type VER7. To analyze whether the mannoprotein in the cell wall during the development of an mnpAp null-mutant is present or not, immunogold microscopy was also adopted. The surface sculpturing of various cell types - hyphae, conidium, Hulle cell, and ascospore - were not very different between the wild type and the mnpAp-null mutant (DMPV1) as examined by scanning electron microscopy. These results were comparable to those examined by transmission electron microscopy, in that the hyphal cell wall was not indentical between two strains, probably caused by the MnpA protein (MnpAp). MnpAp was absent in both the hyphal cell wall of the DMPV1 strain and the conidial cell wall of a wide type, but clearly recognized in the hyphal cell wall of a wild type.