• Journal of Welding and Joining
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• v.13 no.1
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• pp.115-126
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• 1995

Vision sensors using the optical triangulation have been widely used for automatic welding systems in various ways, but their reliability is seriously affected by presence of the arc noise. The reliability of vision sensors was analyzed with variation of the arc noise by considering the reflectance of the base metal. first, the properties of the base metal's reflection were modelled by using the Bidirectional Reflectance-Distribution Function(BRDF), and then the variation of the reflected arc intensity was formulated for various configurations of the torch, base metal, and sensor. The experimental data of the gray level of the reflected arc light were obtained for two materials, mild steel and stainless steel. It was found that the results calculated from the proposed model were in good agreement with the experimental data.

• Journal of Biomedical Engineering Research
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• v.16 no.2
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• pp.139-148
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• 1995

In this paper we report the device of a multi-channel clinical instrument developed for determi¬nation of the levels of the urinary urobilinogen, glucose, ketone, bilirubin, protein, ascorbic acid, nitrite, pH, occult-blood, specific gravity, and leukocytes semiquantitatively. The test parameters are expressed on the dry test strips as a range of color intensities by chemical reactions. The instrument measures the value of each substance by reading the reflectance light emanated from the test strips. We also designed the reagent strip cassette and loader in order to intercept the outside interference. The loader can be operated semi-automatically. The light source is consisted on light emitting diodes at three specific wavelengths (560 nm, 610 nm, 650 nm). Precision of the system was evaluated by testing a series of commercial control urine samples. Furthermore, the performance of the instrument was compared with two other test methods on the urine samples from 100 persons. Our results showed a good repeatability between tests and a satisfactory agreement between the readings by our instrument and visual evaluation.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.7
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• pp.414-423
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• 2016

In the present study, the $CuN_x-Cu-CuN_x$ layer the partial pressure ratio Cu metal of Ar and $N_2$ gas using a DC magnetron sputtering device, was generated by the In-situ method. $CuN_x$ layer was able to obtain a surface reflectance reduction effect from the advantages of the process and the external light. $CuN_x$ layer is gas partial pressure, DC the Power, the deposition time variable transmittance in response to the thickness and partial pressure ratio, the reflectance was measured. $Ar:N_2$ gas ratio 10:10(sccm), DC power 0.35 A, was derived Deposition time 90 sec optimum conditions. Thus, according to the optimal thickness and the composition ratio was derived surface reflectance of 20.75%. In addition, to derive the value of ${\Delta}$ Ra surface roughness of 0.467. It was derived $CuN_x$ band-gap energy of about 2.2 eV. Thus, to ensure a thickness and process conditions can be absorbed to maximize the light in a wavelength band in the visible light region. As a result, the implementation of the $12k{\Omega}$ base line resistance of using the Cu metal. This is, 5 inch Metal mesh TSP(L/S: $4/270{\mu}m$) is in the range of the reference operation.

• Journal of the Semiconductor & Display Technology
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• v.7 no.3
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• pp.41-43
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• 2008

The electro-optical characteristics of the Liquid Crystal on Silicon (hereinafter "LCOS") micro-display on vertically alignment (VA) mode were studied depending on various cell gaps. 5 different cell gaps, such as $1.4{\mu}m,\;1.8{\mu}m,\;2.1{\mu}m,\;2.4{\mu}m$ and $2.8{\mu}m$, were selected. The reflectance-voltage (R-V) characteristics, distributions of reflected light and reflectance were calculated with 3-dimmensional LC code. At the center of cell, the smallest $1.4{\mu}m$ cell gap showed the lowest reflectance and the largest $2.8{\mu}m$ cell gap showed the highest reflectance due to the surface anchoring effect. In case of $2.1{\mu}m$ cell gap, the sum of reflectance overall cell was the highest value. Considering the reflectance and RV curve characteristic, the optimized cell gap was $2.1{\mu}m$.

• Korean Journal of Optics and Photonics
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• v.21 no.2
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• pp.46-52
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• 2010

A theory of bidirectional reflectance-distribution function (BRDF), a newly developed BRDF measurement system, and a method for evaluating the uncertainty of BRDF measurements are presented. The BRDF measurement system which measures BRDF in a wavelength range of (380~1500) nm with an angle range of $(-75{\sim}75)^{\circ}$ was installed. The measurement uncertainties, consisting of correlated terms and uncorrelated terms, were evaluated for the BRDF measurement system, resulting in the relative expanded uncertainty less than 3% (k=2).

• Proceedings of the KSRS Conference
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• 2003.11a
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• pp.4-6
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• 2003

Optical signals from an object may vary at different conditions caused by differences in light source and sensor position. Knowledge of these variations is necessary to enable calibration of the satellite images and confirmation of the sun and sensor angles influences of the spectral signals from the objects. With the use high -resolution Ikonos$^{TM}$ multi-angular images, the bi- directional reflectance effects of mangrove trees were observed when three datasets were compared. The influence of bi- directional reflectance may affect the accuracy of interpreting satellite imagery and obtaining biophysical parameters mangrove and other vegetation by indirect means.

• Proceedings of the Korean Society of Potoscience Conference
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• spring
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• pp.41-41
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• 1997

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.176-177
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• 2013

Surface plasmon polaritons (SPPs) have attracted the attention of scientists and engineers involved in a wide area of research, microscopy, diagnostics and sensing. SPPs are waves that propagate along the surface of a conductor, usually metals. These are essentially light waves that are trapped on the surface because of their interaction with the free electrons of conductor. In this interaction, the free electrons respond collectively by oscillating in resonance with the light wave. The resonant interaction between the surface charge oscillation and the electromagnetic field of the light constitutes the SPPs and gives rise to its unique properties. In this papers, we studied theoretical and experimental extraordinary transmittance (T) and reflectance (R) of 2 dimensional metal hole array (2D-MHA) on GaAs in consideration of the diffraction orders. The 2d-MHAs was fabricated using ultra-violet photolithography, electron-beam evaporation and standard lift-off process with pitches ranging from 1.8 to $3.2{\mu}m$ and diameter of half of pitch, and was deposited 5-nm thick layer of titanium (Ti) as an adhesion layer and 50-nm thick layer of gold (Au) on the semiinsulating GaAs substrate. We employed both the commercial software (CST Microwave Studio: Computer Simulation Technology GmbH, Darmstadt, Germany) based on a finite integration technique (FIT) and a rigorous coupled wave analysis (RCWA) to calculate transmittance and reflectance. The transmittance was measured at a normal incident, and the reflectance was measured at variable incident angle of range between $30^{\circ}{\sim}80^{\circ}$ with a Nicolet Fourier transmission infrared (FTIR) spectrometer with a KBr beam splitter and a MCT detector. For MHAs of pitch (P), the peaks ${\lambda}$ max in the normal incidence transmittance spectra can be indentified approximately from SP dispersion relation, that is frequency-dependent SP wave vector (ksp). Shown in Fig. 1 is the transmission of P=2.2 um sample at normal incidence. We attribute the observation to be a result of FTIR system may be able to collect the transmitted light with higher diffraction order than 0th order. This is confirmed by calculations: for the MHAs, diffraction efficiency in (0, 0) diffracted orders is lower than in the (${\pm}x$, ${\pm}y$) diffracted orders. To further investigate the result, we calculated the angular dependent transmission of P=2.2 um sample (Fig. 2). The incident angle varies from 30o to 70o with a 10o increment. We also found the splitting character on reflectance measurement. The splitting effect is considered a results of SPPs assisted diffraction process by oblique incidence.

• Journal of the Korean Graphic Arts Communication Society
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• v.18 no.2
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• pp.41-54
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• 2000

Photochemical modulation of Bragg-reflection wavelengths based on isomerization of an azobenzene (Azo) and subsequent change in reflectance was investigated in cholesteric liquid crystals (ChLCs) which reflect light in visible wavelength region. Irradiation at 366 nm, which causes an efficient transcis isomerization of Azo, led to change in reflected color of ChLCs toward shorter wavelengths with a concomitant lowering of phase transition. Reversible change in color was induced all-optically by alternate irradiation at effective wavelengths for reversible isomerization of Azo. A considerable variation in reflectance was also observed when the photoinduced change in color was measured by a probe light with the same handedness as the ChLCs. The spectral Position of selective light reflection in the initial states played an important role to produce a normal-mode and a reverse-mode switching in photoinduced modulation of reflectance of the ChLCs with respect to the probe light.

• Journal of Korean Ophthalmic Optics Society
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• v.5 no.1
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• pp.31-37
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• 2000

In order to color analyze of in Farnsworth Test Panel D-15 using a Protan, Deutan and Tritan test, we introduced the CIE system so that measured the reflectance light spectrum intensity in the 380~780 nm wavelength regions. The color difference of Panel D-15 was depended on the intensity of reflectance ratio in the 400~450 nm, 500~600 nm and more than 650 nm wavelength regions. From the reflectance spectra, we obtained the tristimulus X, Y, Z values, the $L^*a^*b^*$ and $L^*ab$ values of the 3-Dimension CIELAB system in a complement plane and light-darkness axis, the $U^*V^*$ values and the x, y values of chromaticity coordinates.