• Nuclear Engineering and Technology
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• 제38권3호
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• pp.293-300
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• 2006

A liquid metal reactor (LMR) operated at high temperatures is subjected to both cyclic mechanical loading and thermal loading; thus, creep-fatigue is a major concern to be addressed with regard to maintaining structural integrity. The Korea Advanced Liquid Metal Reactor (KALIMER), which has a normal operating temperature of $545^{\circ}C$ and a total service life time of 60 years, is composed of various cylindrical structures, such as the reactor vessel and the reactor baffle. This study focuses on the creepfatigue crack initiation for a cylindrical Y-junction structure made of 316 stainless steel (SS), which is subjected to cyclic axial tensile loading and thermal loading at a high-temperature hold time of $545^{\circ}C$. The evaluation of the considered creep-fatigue crack initiation was carried out utilizing the ${\sigma}_d$ approach of the RCC-MR A16 guide, which is the high-temperature defect assessment procedure. This procedure is based on the total accumulated strain during the service time. To confirm the evaluated result, a high-temperature creep-fatigue structural test was performed. The test model had a circumferential through wall defect at the center of the model. The defect front of the test model was investigated after the $100^{th}$ cycle of the testing by utilizing a metallurgical inspection technique with an optical microscope, after which the test result was compared with the evaluation result. This study shows how creep-fatigue crack initiation for a high-temperature structure can be predicted with conservatism per the RCC-MR A16 guide.

• 조명전기설비학회논문지
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• 제25권12호
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• pp.34-41
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• 2011

In order to understand the thermal performance of each LED chips in multi-chip LED package, a quantitative parametric analysis of the temperature evolution was investigated by thermal transient analysis. TSP (Temperature Sensitive Parameter) value was measured and the junction temperature was predicted. Thermal resistance between the p-n junction and the ambient was obtained from the structure function with the junction temperature evolution during the cooling period of LED. The results showed that, the thermal resistance of the each LED chips in 4 chip-LED package was higher than that of single chip- LED package.

• 전기전자학회논문지
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• 제17권3호
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• pp.360-364
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• 2013

The maximum breakdown voltage's characteristic within the Super Junction MOSFET structure comes from N-Drift and P-Pillar's charge balance. By developing P-Pillar from Planar MOSFET, it was confirmed that the breakdown voltage is improved through charge balance, and by setting the gate voltage at 10V, the characteristic comparisons of Planar MOSFET and Super Junction MOSFET are shown in picture 6. The results show that it had the same breakdown voltage as Planar MOSFET which increased temperature resistance by 87.4% at $.019{\Omega}cm^2$ which shows that by the temperature resistance increasing, the power module's power dissipation improved.

• JSTS:Journal of Semiconductor Technology and Science
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• 제6권1호
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• pp.16-21
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• 2006

A simple doping method to fabricate a very thin channel body of the p-type FinFETs with a 20 nm gate length by solid-phase-diffusion (SPD) process was developed. Using the poly-boron-films (PBF) as a novel diffusion source of boron and the rapid thermal annealing (RTA), the p-type sourcedrain extensions of the FinFET devices with a threedimensional structure were doped. The junction properties of boron doped regions were investigated by using the $p^+-n$ junction diodes which showed excellent electrical characteristics. Single channel and multi-channel p-type FinFET devices with a gate length of 20-100 nm was fabricated by boron diffusion process using PBF and revealed superior device scalability.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
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• pp.126-129
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• 2001

A p-n junction was obtained by the deposition of an n-type ZnO thin film on a p-type Zn-doped InP substrate. The Zn-doped InP substrate has been made by the diffusion of Zn with sealed ampoule technique. The ZnO deposition process was performed by pulsed laser deposition (PLD). The p-n junction was formed and showed a typical I-V characteristic. We will also discuss about the realization of an ultraviolet light-emitting diode (LED). The structure of n-ZnO/p-Zn-doped InP could be a good candidate for the realization of an ultraviolet light-emitting diode or an ultraviolet laser diode.

• 한국동물학회지
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• 제39권2호
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• pp.223-230
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• 1996

Fine structure of the neuromuscular junction in the venomous organ of the spider, Agelena li'mbutq, was studied using high magnification electron microscope. The motor nerve endings at neuromuscular contact area composed of neurons and neuroslial cells were located between musculature and extracellular sheath of the venom gBand. At the synaptic contact between a motor axon and a muscle fiber in the musculature, spherical synaptic vesicles were prominent in the nerve terminal. The sarcoplasm beneath the neuromuscular synapse has a granular appearance and lacks mvofilaments. And the main axon gives off a branch between the muscle fibers. The synaptic regions of this organ are located close to the myofilaments unlike to other chelicerate classes. Moreover the postsvnaptic complex of vesicles and membrane invasinations present in other synaptic legions are absent from these legions in this venomous organ.

• Transactions on Electrical and Electronic Materials
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• 제3권1호
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• pp.1-3
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• 2002

A p-n junction was obtained by the deposition of an n-type ZnO thin film on a p-type Zn-doped InP substrate. The Zn-doped InP substrate has been made by the diffusion of Zn with sealed ampoule technique. The ZnO deposition process was performed by pulsed laser deposition (PLD). The p-n junction was formed and showed typical I-V characteristics. We will also discuss about the realization of an ultraviolet light-emitting diode (LED). The structure of n-ZnO/p-Zn-doped InP could be a good candidate for the realization of an ultraviolet light-emitting diode or an ultraviolet laser diode.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 추계학술대회 논문집
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• pp.126-129
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• 2001

A p-n junction was obtained by the deposition of an n-type ZnO thin film on a p-type Zn-doped InP substrate. The Zn-doped InP substrate has been made by the diffusion of Zn with sealed ampoule technique. The ZnO deposition process ws performed by pulsed laser deposition (PLD). The p-n junction was formed and showed a typical I-V characteristic. We will also discuss about the realization of an ultraviolet light-emitting diode (LED). The structure of n-ZnO/p-Zn-doped InP could be a good candidate for the realization of an ultraviolet light-emitting diode or an ultraviolet laser diode.

• 한국정보통신학회논문지
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• 제20권4호
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• pp.793-798
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• 2016

본 연구에서는 1T-DRAM 응용을 위해 Bipolar Junction Transistor 모드 (BJT mode)에서 비대칭 소스/드레인 수직형 나노와이어 소자의 순방향 및 역방향 메모리 윈도우 특성을 분석하였다. 사용된 소자는 드레인 농도가 소스 농도보다 높으며 소스 면적이 드레인 면적보다 큰 사다리꼴의 수직형 gate-all-around (GAA) MOSFET 이다. BJT모드의 순방향 및 역방향 이력곡선 특성으로부터 순방향의 메모리 윈도우는 1.08V이고 역방향의 메모리 윈도우는 0.16V이었다. 또 래치-업 포인트는 순방향이 역방향보다 0.34V 큰 것을 알 수 있었다. 측정 결과를 검증하기 위해 소자 시뮬레이션을 수행하였으며 시뮬레이션 결과는 측정 결과와 일치하는 것을 알 수 있었다. 1T-DRAM에서 BJT 모드를 이용하여 쓰기 동작을 할 때는 드레인 농도가 높은 것이 바람직함을 알 수 있었다.

• 대한전자공학회논문지
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• 제21권1호
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• pp.62-70
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• 1984

비저항이 10Ω-cm, 두께가 13∼15mi1인 <111> oriented, p형 Si기판을 이용하여 N+PP+ BSF 전지와 에미터 영역이 N+N 고저 접합으로 이루어진 N+NPP+ HELEBSF(high low emitter bach surface field) 전지를 설계 제작하였다. 접합형 태양전지의 에미터 영역에서 고저 접합구조가 효율 개선에 미치는 영향을 검토하기 위해 HLEBSF 전지의 N영역을 제외하고는 같은 마스크와 동시 공정을 통해 N+PP-전지와 N+NPP+ 전지의 가영역에서 물리적 파라미터들(불순물 농도, 두께)을 동일하게 만들었다. 100mW/㎠의 인공조명에서 측정한 결과 N+PP+ 전지들의 전면적 (유효 수광면적) 평균 변환효율이 10.94%(12.16%)이었고, N+NPP+ 전지들의 평균 변환효율은 12.07% (13.41%)로 나타났다. N+NPP+ 전지의 효율개선은 N+N-고저 접합 에미터 구조가 N+ 에미터 영역에서 나타나는 heavy doping effects를 제거함으로써 에미터 재결합 전류의 증가를 억제하고 나아가 개방전압(Voc)과 단락전류(Ish)의 값을 증가시켜 준 결과로 볼 수 있다.