• Title/Summary/Keyword: ion-beam

Search Result 1,652, Processing Time 0.027 seconds

OPTICAL PROPERTIES OF AMORPHOUS CN FILMS

  • Park, Sung-Jin;Lee, Soon-Il;Oh, Soo-Ghee;Bae, J.H.;Kim, W.M.;Cheong, B.;Kim, S.G.
    • Journal of the Korean institute of surface engineering
    • /
    • v.29 no.5
    • /
    • pp.556-562
    • /
    • 1996
  • Carbon nitride (CN) films were synthesized on silicon substrates by a combined ion-beam and laser-ablation method under various conditions; ion-beam energy and ion-beam current were varied. Raman spectroscopy and spectroscopic ellipsometry (SE) were employed to characterize respectively the structural and the optical properties of the CN films. Raman spectra show that all the CN films are amorphous independent of the ion-beam current and the ion-beam energy. Refractive indices, extinction coefficients and optical band gaps which were determined from the measured SE spectra exhibit a significant dependence on the synthesis conditions. Especially, the decrease of the refractive indices and the shrinkage of the optical band gap is noticeable as the ion-beam current and/or the ion-beam energy increase.

  • PDF

Analysis of Ion Beam-Solid Interactions for Nano Fabrication (나노 패터닝을 위한 이온빔-고체 상호작용 분석)

  • Kim H.B.;Hobler G.
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 2005.10a
    • /
    • pp.581-584
    • /
    • 2005
  • Ion beam processing is one of the key technologies to realize mastless and resistless sub 50nm nano fabrication. Unwanted effects, however, may occur since an energetic ion can interact with a target surface in various ways. Depending on the ion energy, the interaction can be swelling, deposition, sputtering, re-deposition, implantation, damage, backscattering and nuclear reaction. Sputtering is the fundamental mechanisms in ion beam induced direct patterning. Re-deposition and backscattering are unwanted mechanisms to avoid. Therefore understanding of ion beam-solid interaction should be advanced for further ion beam related research. In this paper we simulate some important interaction mechanisms between energetic incident ions and solid surfaces and the results are compared with experimental data. The simulation results are agreed well with experimental data.

  • PDF

Monte-Carlo Simulation for Exposure and Development of Focused Ion Beam Lithography (집속이온빔 리소그라피 (Focused Ion Beam Lithography)외 노출 및 현상에 대한 몬데칼로 전산 모사)

  • Lee, Hyun-Yong;Kim, Min-Su;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
    • /
    • 1994.07b
    • /
    • pp.1246-1249
    • /
    • 1994
  • Thin amorphous film of $a-Se_{75}Ge_{25}$ acts as a positive resist in ion beam lithography. Previously, we reported the optical characteristics of amorphous $Se_{75}Ge_{25}$ thin film by the low-energy ion beam exposure and presented analytically calculated values such as ion range, ion concentration and ion transmission coefficient, etc. As the calculated results of analytical calculation, the energy loss per unit distance by $Ga^+$ ion is about $10^3[keV/{\mu}m]$ and nearly constant for all energy range. Especially, the projected range and struggling for 80 [KeV] $Ga^+$ ion energy are 0.0425[${\mu}m$] and 0.020[${\mu}m$], respectively. Hear, we present the results of Monte-Carlo computer simulation of Ga ion scattering, exposure and development in $a-Se_{75}Ge_{25}$ resist film for focused ion beam(FIB) lithography. Monte-Carlo method is based on the simulation of individual particles through their successive collisions with resist atoms. By the summation of the scattering events occurring in a large number N(N>10000) of simulated trajectories within the resist, the distribution for the range parameters is obtained. Also, the deposited energy density and the development pattern by a Gaussian or a rectangular ion beam exposure can be obtained.

  • PDF

LC Orientation Characteristics Treated on Organic Hybrid Overcoat Layer with Ion Beam Irradiation

  • Lee, Sang-Keuk;Kim, Byoung-Yong;Kim, Young-Hwan;Lee, Kang-Min;Oh, Byeong-Yun;Han, Jeong-Min;Seo, Dae-Shik
    • Transactions on Electrical and Electronic Materials
    • /
    • v.9 no.5
    • /
    • pp.202-205
    • /
    • 2008
  • We have studied the liquid crystal (LC) orientation behavior on the organic hybrid overcoat layer with ion beam irradiation. Excellent LC alignments of the nematic liquid crystal (NLC) on the ion beam irradiated organic hybrid overcoat layers were observed in various intensities above 600 eV. Pretilt angles of the NLC on the organic hybrid overcoat layers for all ion beam energy intensities were observed from 0.2 to 0.5 degrees. Also, we used the atomic force microscopy (AFM) images for measuring the roughness of the organic hybrid overcoat layers with ion beam irradiation before and after. The surface of organic hybrid overcoat layers was leveled off by the ion beam irradiation. Finally, a good LC alignment thermal stability on the organic hybrid overcoat layer with ion beam irradiation can be achieved.

Development and characteristic study of high brightness ion source using inductively coupled plasma for focused ion beam (유도결합 플라즈마를 이용한 집속이온빔용 고휘도 이온원의 개발 및 특성연구)

  • Kim, Yoon-Jae;Park, Dong-Hee;Hwang, Yong-Seok
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
    • /
    • 2004.04a
    • /
    • pp.494-499
    • /
    • 2004
  • A ion source using inductively coupled plasma has been tested in order to test its feasibility as a high brightness ion source for focused ion beam. When operating the ion source with filter magentas in front of plasma electrode for a negative ion source, lower remittances are expected. Extracted beam remittances are measured with an Allison-type scanning device for various plasma parameters and extraction conditions. The normalized omittance has been measured to be around 0.2$\pi$mmmrad with beam currents of up to 0.55 ㎃. In particular, noting that multicusp magnets have a role in decreasing the remittance as well as increasing plasma discharge efficiency, transverse magnetic field has been confirmed to be a useful tool fur decreasing remittance via electron energy control.

  • PDF

Ion Optical Study on the $He^{++}$ Beam Transport System of the SNU 1.5-MV Tandem Van do Graaff Accelerator (SNU 1.5-MV 직렬형 반데그라프 가속기의 $He^{++}$ 빔 소송계에 대한 이온광학적 고찰)

  • Hyen-Cheol JO;Young-Dug BAE;Hae-iLL BAK
    • Nuclear Engineering and Technology
    • /
    • v.23 no.4
    • /
    • pp.426-437
    • /
    • 1991
  • The $He^{++}$ beam transport system of the SNU 1.5-MV Tandem Van de Graaff accelerator is analysed by ion optical approach. The program OPTRANS is developed to determine the optimum operating conditions of each ion optical component and to simulate ion beam transport. First order matrix formalism is used and the space charge effect is neglected. Optimum operating conditions for the transport of 0.5~3.0 MeV $He^{++}$ beam are determined by the use of the program OPTRANS. Initial ion beam omittance is assumed to be 0.5$\times$80.0 mm.mrad from the structure of the extraction electrode and the experiment of ion beam extraction. ion beam transport characteristics of each ion optical component according to the variation of the operating conditions are investigated, and operating conditions to minimize the beam size at each slit, stripping foil, and target are calculated. Optimum operating conditions obtained from the experiment of ion beam transport show a discrepancy of less than 15% compared with the calculated ones. From the simulation and experiment of ion beam trans-port, the validity of the calculated optimum operating conditions and the usefulness of the program OPTRANS are verified.

  • PDF

Study on ZnO Thin Film Irradiated by Ion Beam as an Alignment Layer (배향막 응용을 위한 이온 빔 조사된 ZnO 박막에 관한 연구)

  • Kang, Dong-Hoon;Kim, Byoung-Yong;Kim, Jong-Yeon;Kim, Young-Hwan;Kim, Jong-Hwan;Han, Jeong-Min;Ok, Chul-Ho;Lee, Sang-Keuk;Seo, Dae-Shik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2007.06a
    • /
    • pp.430-430
    • /
    • 2007
  • In this study, the nematic liquid crystal (NLC) alignment effects treated on the ZnO thin film layers using ion beam irradiation were successfully studied for the first time. The ZnO thin films were deposited on indium-tin-oxide (ITO) coated glass substrates by rf-sputter and The ZnO thin films were deposited at the three kinds of rf power. The used DuoPIGatron type ion beam system, which can be advantageous in a large area with high density plasma generation. The ion beam parameters were as follows: energy of 1800 eV, exposure time of 1 min and ion beam current of $4\;mA/cm^2$ at exposure angles of $15^{\circ}$, $30^{\circ}$, $45^{\circ}$, and $60^{\circ}$. The homogeneous and homeotropic LC aligning capabilities treated on the ZnO thin film surface with ion beam exposure of $45^{\circ}$ for 1 min can be achieved. The low pretilt angle for a NLC treated on the ZnO thin film surface with ion beam irradiation for all incident angles was measured. The good LC alignment treated on the ZnO thin film with ion beam exposure at rf power of 150 W can be measure. For identifying surfaces topography of the ZnO thin films, atomic force microscopy (AFM) was introduced. After ion beam irradiation, test samples were fabricated in an anti-parallel configuration with a cell gap of $60{\mu}m$.

  • PDF

Monte Carlo Calculation for Production Cross-Sections of Projectile's Isotopes from Therapeutic Carbon and Helium Ion Beams in Different Materials

  • Quazi Muhammad Rashed Nizam;Asif Ahmed;Iftekhar Ahmed
    • Journal of Radiation Protection and Research
    • /
    • v.48 no.4
    • /
    • pp.204-212
    • /
    • 2023
  • Background: Isotopes of the projectile may be produced along the beam path during the irradiation of a target by a heavy ion due to inelastic interactions with the media. This study analyzed the production cross-section of carbon (C) and Helium (He) projectile's isotopes resulting from the interactions of these beams with different materials along the beam path. Materials and Methods: In this study, we transport C and He ion beams through different materials. This transportation was made by the Monte Carlo simulation. Particle and Heavy Ion Transport code System (PHITS) has been used for this calculation. Results and Discussion: It has been found that 10C, 11C, and 13C from the 12C ion beam and 3He from the 4He ion beam are significant projectile's isotopes that have higher flux than other isotopes of these projectiles. The 4He ion beam has a higher projectile's isotope production cross-section along the beam path, which adds more impurities to the beam than the 12C ion beam. These projectile's isotopes from both the 12C and 4He ion beams have higher production cross-sections in hydrogenous materials like water or polyethylene. Conclusion: It is important to distinguish these projectile's isotopes from the primary beam particles to obtain a precise and accurate cross-section result by minimizing the error during measurement with a nuclear track detector. This study will show the trend of the production probability of projectile's isotopes for these ion beams.

Formation of Silicon nanocrystallites by ion beam assisted electron beam deposition

  • Won Chel Choi
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 1998.02a
    • /
    • pp.68-69
    • /
    • 1998
  • Nano-crystalline silicon(nc-Si) thin films were directly depposited by ion beam assisted electron beam depposition (IBAED) method. The visibe luminescence in IBAED sampples were originated from not an oxygen bond but Si nano-crystallites. And we can conclude that the ion beam would be contribute to the suppression of the Si-O bond formation.

  • PDF