• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.579-581
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• 2004

We wish to develop micro-total analysis system (TAS) on a chip, and to make a trial approach to solve the important problem that is to detect ions separated by the electric field. We propose an idea, which is as for rotational motions of dipolar ions, which are affected by the ion atmosphere in outer regions. This is a new kind of the ion-sensitive field effect transistor (ISFET). We wish to develop the ISFET chips, and give more effective, fast and sensitive, capillary electrophoresis is designed in near future.

• Structural Engineering and Mechanics
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• v.38 no.6
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• pp.767-802
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• 2011

Developers of new finite elements or nonlinear solution techniques rely on discriminative benchmark tests drawn from the literature to assess the advantages and drawbacks of new formulations. Buckling benchmark tests provide a rigorous evaluation of finite elements applied to thin structures, and a complete and detailed set of reference results would therefore prove very useful in carrying out such evaluations. Results are usually presented in the form of load-deflection curves that developers must reconstruct by extracting the points, a procedure which is often tedious and inaccurate. Moreover the curves are usually given without accompanying information such as the calculation time or number of iterations it took for the model to converge, even though this type of data is equally important in practice. This paper presents ten different limit-point buckling benchmark tests, and provides for each one the reference load-deflection curve, all the points necessary to recreate the curve in tabulated form, analysis data such as calculation time, number of iterations and increments, and all of the inputs used to obtain these results.

• Journal of Electrochemical Science and Technology
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• v.5 no.4
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• pp.115-127
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• 2014

Cd-Pb thin films were electrodeposited from a diluted chloride solution using stainless steel rotating disc electrode. The linear sweep voltammograms of the single metallic ions show that electrodeposition of these ions was mass transfer control due to the plateau observed for different rotations at concentration (50 and 200 ppm). The voltammograms of binary system elucidate that electrodeposition process always start at cathodic potential located between the potential of individual metals. Currents transients measurements, anodic linear sweep voltammetry (ALSV) and atomic force microscopy (AFM) were used to characterize the electrocryatalization process and morphology of thin films. ALSV profiles show a differentiation for the dissolution process of individual metals and binary system. Two peaks of dissolution Cd-Pb film were observed for the binary system with different metal ion concentration ratios. The model of Scharifker and Hills was used to analyze the current transients and it revealed that Cd-Pb electrocrystalization processes at low concentration is governed by three-dimensional progressive nucleation controlled by diffusion, while at higher concentration starts as a progressive nucleation then switch to instantaneous nucleation process. AFM images reveal that Cd-Pb film electrodeposited at low concentration is more roughness than Cd-Pb film electrodeposited at high concentrated solution.