• 산업경영시스템학회지
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• 제42권2호
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• pp.78-85
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• 2019

High variance observed in the measurement system can cause high process variation that can affect process capability badly. Therefore, measurement system analysis is closely related to process capability analysis. Generally, the evaluation for measurement system and process variance is performed separately in the industry. That is, the measurement system analysis is implemented before process monitoring, process capability and process performance analysis even though these analyses are closely related. This paper presents the effective concurrent evaluation procedure for measurement system analysis and process capability analysis using the table that contains Process Performance (Pp), Gage Repeatability & Reproducibility (%R&R) and Number of Distinct Categories (NDC). Furthermore, the long-term process capability index (Pp), which takes into account both gage variance and process variance, is used instead of the short-term process capability (Cp) considering only process variance. The long-term capability index can reflect well the relationship between the measurement system and process capability. The quality measurement and improvement guidelines by region scale are also described in detail. In conclusion, this research proposes the procedure that can execute the measurement system analysis and process capability analysis at the same time. The proposed procedure can contribute to reduction of the measurement staff's effort and to improvement of accurate evaluation.

• 한국IT서비스학회지
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• 제10권4호
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• pp.229-242
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• 2011

It is necessary to have measurement and analysis activity for managing software project. At least, every project measures time and cost in order to figure it out whether it will finish within its deadline. CMMI has Measurement and Analysis process in Maturity Level 2. In Measurement and Analysis process, Indicators for decision making in project management are defined and analysis procedure of the measurements to get the indicators are specified. Also, the way of collecting the data and storing them is also planned. Establishing efficient and effective measurement and analysis process in the organization by improving existing process is very important for project success. In this paper, we provide a method for analyzing the measurement and analysis process and improving it based on IDEAL model. It will support the organizations which are trying to adopt CMMI to establish measurement and analysis process.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 1993년도 한국자동제어학술회의논문집(국제학술편); Seoul National University, Seoul; 20-22 Oct. 1993
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• pp.541-544
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• 1993

This paper attempts to propose new procedures to evaluate roughness of ground metallic surface in the range of 1-10.mu.m from data gained by an optical, in-process measurement of the surfaces. Studies are made to process the data of reflected lights pointed at the surface to be measured. Results obtained are compared with those of measurement by stylus roughness meter. Correlations between the two types of roughness measurement are well. The proposed method can be used as a sensor for a polishing robot.

• Journal of the Korean Statistical Society
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• 제29권3호
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• pp.319-336
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• 2000

A mixed model with a white noise process and an IMA(0,1,1) process is considered as a process model. It is assumed that the process is a white noise in the absence of a special cause and the process changes to an IMA(0,1,1) due to a special cause. One useful scheme in measuring the process level is to use the variable measurement interval (VMI) between measurement times according to the value of the previous chart statistic. The advantage of the VMI scheme is to measure the process level infrequently when in control to save the measurement cost and to measure frequently when out of control to save the off-target cost. This paper considers the VMI scheme in order to detect changes in the process model from a white noise to an IMA(0,1,1). The VMI scheme is shown to be effective compared to the standard fixed measurement interval (FMI) scheme in both statistical and economic contexts.

• 전기학회논문지
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• 제61권9호
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• pp.1330-1335
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• 2012

This paper proposes an automatic measurement sampling method for the semiconductor manufacturing process. The method recommends sampling rates using information of process capability indexes and production scheduling plan within the restricted metrology capacity. In addition, it automatically controls the measurement WIP (Work In Process) using measurement priority values to minimize the measurement risks and optimize the measurement capacity. The proposed sampling method minimizes measurement controls in the semiconductor manufacturing process and improves the fabrication productivity via reducing measurement TAT (Turn Around Time), while guaranteeing the level of process quality.

• 산업경영시스템학회지
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• 제30권3호
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• pp.28-36
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• 2007

Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.

• 품질경영학회지
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• 제47권4호
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• pp.713-723
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• 2019

Purpose: The purpose of this study is to develop a statistical program for capability analysis of measuring system and measurement process based upon KS Q ISO 22514-7. Methods: R is a powerful open source functional programming language that provides high level graphics and interfaces to other languages. Therefore, in this study, we will develop the statistical program using R language. Results: The R program developed in this study consists of the following five modules. ① Measuring system capability analysis with Type 1 study data: MSCA_Type1.R ② Measuring system capability analysis with Linearity study(Type 4 study) data: MSCA_Type4.R ③ Measurement process capability analysis with Type 1 study & Gage R&R study data: MPCA_T1GRR.R ④ Measurement process capability analysis with Type 4 study & Gage R&R study data: MPCA_T4GRR.R ⑤ Attribute measurement processes capability analysis : AttributeMP.R Conclusion: KS Q ISO 22514-7 evaluates measuring systems and measurement processes on the basis of the measurement uncertainty that was determined according to the GUM(KS Q ISO/IEC Guide 98-3). KS Q ISO 22514-7 offers precise procedures, however, computations are more intensive. The R program of this study will help to evaluate the measurement process.

• 품질경영학회지
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• 제51권4호
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• pp.633-642
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• 2023

Purpose: The variation of the internal diameters of gun barrel incurs a lot of reworks in gun barrel manufacturing process and the significant quality problem of gun barrel. And it is likely to stem from the current measurement system for the internal diameter of gun barrel and the related manufacturing process as well. The purpose of this study is to improve the gun barrel manufacturing process through improving measurement system. Methods: The improved measurement system using laser can measure the internal diameters of gun barrel more accurately, and the properly adjusted honing process reduces the variation of internal diameters of gun barrel. Results: Comparing the mean square error of internal diameters for 6 gun barrels measured before and after process improvement shows that the variation of gun barrel internal diameters was significantly reduced after the process improvement. Conclusion: The introduction of improved measurement system for the internal diameters of gun barrel and the adjustment of related honing process results in the reduction of reworks of gun barrels and their internal diameter variations.

• International Journal of Quality Innovation
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• 제1권1호
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• pp.97-105
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• 2000

In this paper, a two-section method for measuring is introduced and the variation sources of measurement process are analysed. Measuring is a special process in general process. Various variation source must be firstly decomposed so that the statistical distribution law of measuring process can be established, and then implement monitoring control of the measuring process. A special method to obtain the measuring variation is discussed, and a monitoring control technique for measuring process is studied based statistical distribution. Towards the end, we briefly introduce software design for the analysis and control of a measurement process.

• 산업경영시스템학회지
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• 제23권61호
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• pp.89-98
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• 2000

For statistical process control, the process data are collected by the measurement system. But, the measurement system may have instrument error or/and operator error. In the measured values of products, the total observed variance consists of process variance and variance due to error of measurement system. In this paper, we design more practical T-s control chart considering estimated measurement error The effects of measurement error on the expected total cost and design parameters are investigated.