• Title/Summary/Keyword: in-circuit test

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A study on circuit design of synthetictest facilities of capacitive current switching tests (합성 진상전류 개폐 시험설비의 회로설계에 관한 연구)

  • Kim, M.H.;Suh, Y.T.;Yoon, H.D.;Shin, Y.J.;Kang, Y.S.;Koh, H.S.
    • Proceedings of the KIEE Conference
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    • 2002.07a
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    • pp.38-40
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    • 2002
  • A study on the test method and the test facilities of synthetic capacitive current tests have been very slight and the direct test method with the short-circuit generator and power transformer only used up to now. However, according to the development of analysis technique of power system and design and manufacture technique we are realized that direct testing method is not satisfactory to evaluate the performance of circuit-breaker because it is difficult to simulate precisely the conditions of power system. Therefore, in order to solve these problem this paper deals with the tests methods and the design technique of the tests facilities of the synthetic capacitive current based on the same theory with the synthetic short-circuit tests.

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Test Technology of Digital Circuit Board Based on Serial Signature Analysis Technique in Production Line (생산라인에서 SSA 기법에 근거한 디지털 회로 보오드 검사 기술)

  • Ko, Yun-Seok
    • Proceedings of the KIEE Conference
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    • 2001.07d
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    • pp.2193-2195
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    • 2001
  • This paper proposes test strategy detecting the faulted digital device or the faulted digital circuit on the digital circuit board using signature analysis technique based on the polynoimal division theory. SSA(serial Signature Analysis) identifies the faults by comparing the reminder from good device and reminder from the tested device, which reminder is obtained by enforcing the data stream outputed from output pins of tested device on LFSR(Linear Feedback Shift Resister) representing the characteristic equation.

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Equivalent Circuit Constants and Characteristics Calculation of LIM by Lock test (구속시험에 의한 선형 유도 전동기의 등가회로 정수 산정 및 특성 계산)

  • 김규탁;강규홍;최태희;이정규
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.43 no.4
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    • pp.580-586
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    • 1994
  • The equivalent circuit of linear induction motor is generally expressed as the same that of rotary induction motor. However, it is almost impossible to perform the no-load test for LIM, because it needs a special equipment for synchronous speed. Therefore, a new method is reqnired to calculate the performance of the LIM without the no-load test. In this paper, The new method which does not need no-load test for the chanracteristics analysis of LIM is proposed. The equivalent circuit of LIM is chosen and the method if determining its constants from results of the lock test is discussed. The calculated results were satisfied by compare with experimental and conventional method results.

Determination of Parameters of Equivalent Circuit Taking No-Load Losses Into Account for Single-Phase Induction Motors (단상 유도전동기의 무부하손실을 고려한 등가회로 정수의 결정)

  • Jwa, Chong-Keun;Kim, Do-Jin
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.59 no.4
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    • pp.358-363
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    • 2010
  • This paper proposes a step-by-step method of determining the parameters of equivalent circuit which is considered the no load losses for the single phase induction motor which has the starting winding. This method is comprised of three steps, and the stator resistance which is measured by the method of voltage drop is treated as constant and the stator and the rotor leakage reactances are assumed to be the same in every step. The test results of no load and locked rotor test are used in the 1st and 2nd step, and the ratings of name plate of the motor are needed in the 3rd step. In the 1st step, the traditional equivalent circuit parameters are directly calculated by no load and locked rotor conditions. In the next step, five nonlinear simultaneous equations for five unknown parameters can be set up by no load and locked rotor equivalent circuits. These equations are solved by using the initial parameters obtained by the 1st step parameters. In the final step, three nonlinear simultaneous equations for rotor winding resistance, leakage reactance and no load losses component resistance can be set up by equivalent circuit under the rated operation. Three parameters are solved by using the 2nd step parameters. Thus, equivalent circuit parameters are gradually refined step by step. The validity of the proposed method is evaluated by comparing the computed values obtained by the equivalent circuit parameters with the experimental values of the load test.

Proposal of the Energy Recovery Circuit for Testing High-Voltage MLCC (고전압 MLCC 시험을 위한 에너지 회수 회로 제안)

  • Kong, So-Jeong;Kwon, Jae-Hyun;Hong, Dae-Young;Ha, Min-Woo;Lee, Jun-Young
    • The Transactions of the Korean Institute of Power Electronics
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    • v.27 no.3
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    • pp.214-220
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    • 2022
  • This paper proposes a test device designed for developing a high-voltage multilayer ceramic capacitor (MLCC). The proposed topology consists of an energy recovery circuit for charging/discharging capacitor, a flyback converter, and a boost converter for supplying power and a bias voltage application to the energy recovery circuit. The energy recovery circuit designed with a half-bridge converter has auxiliary switches operating before the main switches to prevent excessive current from flowing to the main switches. A prototype has been designed to verify the reliability of target capacitors following the voltage fluctuation with a frequency range below 65 kHz. To conduct high root mean square (RMS) current to the capacitor as a load, the MLCC test was conducted after the topology verification was completed through the film capacitor as a load. Through the agreement between the RMS current formula proposed in this paper and the MLCC test results, the possibility of its use was demonstrated for high-voltage MLCC development in the future.

Study on the analysis of impulse test wave in the short coil (layer)of transformer winding (변압기 권선(층간)단락시의 충격파시험파형분석에 관한 연구)

  • 박민호
    • 전기의세계
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    • v.25 no.5
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    • pp.75-78
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    • 1976
  • The most difficult problem encountered in impulse test of transformer is the determination of exact fauly for coil layer short. This paper is to establish one of improved standards in the above case by means of wave form analysis, based on the equivalent circuits and experimental investigation. During the fault occurs, the local oscillation in fault circuit is applicable where as the reflection wave is utilized to the main circuit. The result current wave form at neutral impeadance point is similar to the wave form by impulse test and has the singular wave form respectively.

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TRV Pattern Classification and Parameter Calculation Method for Double-Frequency Synthetic Test Circuit (2중주파 합성시험회로의 TRV 패턴 분류 및 파라미터 계산 방법)

  • Lee Yong Han
    • Proceedings of the KIEE Conference
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    • summer
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    • pp.587-589
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    • 2004
  • In this paper analytical pattern classification of TRV waves created by double-frequency synthetic test circuit was proposed. According to the classified patterns of the TRV wave, calculation methods of 3 reference lines and 4 parameters characterizing the TRV wave wire proposed. These methods can be utilized to optimize test facility and to standardize test quality.

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A Study on LCL Circuit for Satellite Power System Applying WBG Device (WBG 소자를 적용한 위성 전력 시스템용 LCL 회로에 관한 연구)

  • Yoo, Jeong Sang;Ahn, Tae Young;Gil, Yong Man;Kim, Hyun Bae;Park, Sung Woo;Kim, Kyu Dong
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.2
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    • pp.101-106
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    • 2022
  • In this paper, WBG semiconductor such as SiC and GaN were applied as power switches for LCL circuit that can be applied to satellite power systems and the test results of the LCL circuit are reported. P-channel MOSFET and N-channel MOSFET, which were generally used in the conventional LCL circuit, were applied together to expand the utility of the test results. The design and stability evaluation were performed using a Micro Cap circuit simulation program. For the test circuit, a module using each switch was manufactured, and a total of 5 modules were manufactured and the steady state and transient state characteristics were compared. From the experimental results, the LCL circuit for power supply of the satellite power system constructed in this paper satisfied the constant current and constant voltage conditions under various operating conditions. The P-channel MOSFET showed the lowest efficiency characteristics, and the three N-channel switches of Si, SiC and GaN showed relatively high efficiency characteristics of up to 99.05% or more. In conclusion, it was verified that the on-resistor of the switch had a direct effect on the efficiency and loss characteristics.

Short Circuit Electromagnetic Force Prediction by Coupled Electromagnetic-Mechanical Field Analysis of Dry-Type Transformer (전자계-기계계 결합해석에 의한 건식변압기의 단락강도 예측)

  • Ahn, Hyun-Mo;Hahn, Sung-Chin
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.60 no.2
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    • pp.301-308
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    • 2011
  • This paper deals with the coupled electromagnetic-mechanical field analysis for short-circuit electromagnetic force of the dry-type transformer. The short-circuit currents are calculated using external circuit in accordance with short-circuit test equipment. According to short-circuit current, the generated magnetic leakage flux density in dry-type transformer model is calculated by finite element method. The radially-directed electromagnetic forces in windings are calculated using electromagnetic field analysis and then axially-directed electromagnetic forces in windings are calculated using electromagnetic-mechanical field analysis. The calculated axially-directed electromagnetic forces in high voltage winding are compared to those of measured ones and showed good agreement with experimental results.

A Synthetic Test Circuit for HVDC Thyristor Valve Test with Simplified Turn-Off Circuit of Auxiliary Thyristor (보조 사이리스터의 턴-오프 회로를 간소화한 HVDC 사이리스터 밸브 시험용 합성시험회로)

  • Jung, Jae-Hun;Goo, Beob-Jin;Jeo, Han-Je;Nho, Eui-Cheol;Han, Byung-Moon;Chung, Yong-Ho;Baek, Seung-Taek
    • The Transactions of the Korean Institute of Power Electronics
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    • v.19 no.5
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    • pp.475-480
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    • 2014
  • This study proposes a new synthetic test circuit (STC) for HVDC thyristor valve tests. The conventional STC with a 2-phase chopper requires a 3-phase transformer, a 3-phase diode rectifier, and an IGBT to facilitate the off state of an auxiliary thyristor. In the proposed STC, these three components are replaced with one diode and one resistor, which result in the simplified implementation of the hardware of the STC. Simulation and experimental results demonstrate the validity of the proposed scheme.