• Title/Summary/Keyword: hole injection layer

Search Result 200, Processing Time 0.025 seconds

Effect on the Characteristics of Organic Light-Emitting Devices due to the PTFE buffer layer (유기발광소자 특성에 미치는 PTFE 버퍼층의 영향)

  • Jeong, J.;Oh, Y.C.;Chung, D.H.;Chung, D.K.;Kim, S.K.;Lee, S.W.;Hong, J.W.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2003.07b
    • /
    • pp.1070-1073
    • /
    • 2003
  • We have studied the characteristics of organic light-emitting diodes(OLEDs) with the PTFE buffer layer. The OLEDs have been based on the molecular compounds, N,N'-diphenyl-N,N'-bis (3-methylphenyl)-1, 1'- biphenyl-4, 4'-diamine (TPD) as a hole transport, tris(8-hydroxyquinolinoline) aluminum (III) ($Alq_3$) as an electron transport and the Polytetrafluoroethylene (PTFE) as a buffer layer. The devices of structure were fabricated ITO/PTFE/TPD(40nm)/$Alq_3$(60nm)/Al( 150nm) to see the effects of the PTFE buffer layer in organic EL devices. The thickness of the PTFE layer varied from 0.5 to 10[nm]. We were measured Current-Voltage-Luminance Characteristics and Luminance efficiency due to the variation of PTFE thickness. the PTFE layer was reported that helped to enhance the hole tunneling injection and effectively impede induim diffusion from the ITO electrode. We have obtained an improvement of luminance efficiency when the PTFE thickness is 0.5[nm] is used. The improvement of efficiency of is expected due to a function of hole-blocking of PTFE in OLEDs.

  • PDF

Efficiency Analysis of Buffer Layer Using UF on the Electrical Characteristics of OLED (불화리튬 버퍼층에 의한 유기 발광 소자의 전기적인 특성 및 효율 분석)

  • Bae, Sang-Ho;Park, Hyung-Jun;Nam, Eun-Kyoung;Jung, Dong-Geun;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2007.11a
    • /
    • pp.422-423
    • /
    • 2007
  • In this work, Organic Light Emitting Diodes using LiF as a electron-injecting interfacial have been fabricated for efficiency enhancements. This interfacial layer is interposed between Al/$Alq_3$ layer. The brightness and specific character as current density are higher than those of the device without it. To find best thickness of LiF layer, we used some samples with various thickness. The LiF interposition at the Al/$Alq_3$ interface encouraged the electrons injection and balances the injection numbers of hole and electron in the emission layer.

  • PDF

INVESTIGATIONS OF CONDUCTION MECHANISM OF ORGANIC MOLECULES USED AS BUFFER HOLE INJECTING LAYER IN OLEDS

  • Shekar, B. Chandar;Rhee, Shi-Woo
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2003.07a
    • /
    • pp.966-969
    • /
    • 2003
  • Thin film capacitors with Al-Polymer-Al sandwich structure were fabricated. The bottom and top aluminium (Al) electrodes were deposited by vacuum evaporation and copper phthalocyanine (CuPc), polyaniline-emeraldine base (Pani-EB) and cobalt phthalocyanine/polyaniline - emeraldine base (CoPc /Pani-EB) blend films (which can be used as buffer hole injection layer in OLEDs) were deposited by spin coating technique. X-ray diffractograms indicated amorphous nature of the polymer films whose thicknesses were measured by capacitance and Rutherford Backscattering Spectrometry (RBS) methods. AC conduction studies revealed that the conduction mechanism responsible in these films is variable range hopping of polarons. From D.C conduction studies, it is observed that, the nature of conduction is ohmic in the lower fields and at higher fields the dominating D.C conduction is of Poole-Frenkel type.

  • PDF

Research trend in the development of charge transport materials to improve the efficiency and stability of QLEDs (QLEDs 효율 및 안정성 향상을 위한 전하 수송 소재 개발 동향)

  • Gim, Yejin;Park, Sujin;Lee, Donggu;Lee, Wonho
    • Journal of Adhesion and Interface
    • /
    • v.23 no.2
    • /
    • pp.17-24
    • /
    • 2022
  • Colloidal quantum dots (QDs) have gained attention for applications in quantum dot light emitting diodes (QLEDs) due to their high photoluminescence quantum yield, narrow emission spectra, and tunable bandgap. Nevertheless, non-radiative recombination induced by electron and hole imbalance deteriorates the device efficiency and stability. To overcome the problem, researchers have been trying to enhance hole transport properties of hole transporting layers (HTL) and/or slow down the electron injection in electron transport layer (ETL). Here, we summarize two approaches: i) development of interfacial materials between QD and ETL (or HTL); ii) engineering of HTL by blending or multi-layer approaches.

Residual stresses and viscoelastic deformation of an injection molded automotive part

  • Kim, Sung-Ho;Kim, Chae-Hwan;Oh, Hwa-Jin;Choi, Chi-Hoon;Kim, Byoung-Yoon;Youn, Jae-Ryoun
    • Korea-Australia Rheology Journal
    • /
    • v.19 no.4
    • /
    • pp.183-190
    • /
    • 2007
  • Injection molding is one of the most common operations in polymer processing. Good quality products are usually obtained and major post-processing treatment is not required. However, residual stresses which exist in plastic parts affect the final shape and mechanical properties after ejection. Residual stresses are caused by polymer melt flow, pressure distribution, non-uniform temperature field, and density distribution. Residual stresses are predicted in this study by numerical methods using commercially available softwares, $Hypermesh^{TM},\;Moldflow^{TM}\;and\;ABAQUS^{TM}$. Cavity filling, packing, and cooling stages are simulated to predict residual stress field right after ejection by assuming an isotropic elastic solid. Thermo-viscoelastic stress analysis is carried out to predict deformation and residual stress distribution after annealing of the part. Residual stresses are measured by the hole drilling method because the automotive part selected in this study has a complex shape. Residual stress distribution predicted by the thermal stress analysis is compared with the measurement results obtained by the hole drilling method. The molded specimen has residual stress distribution in tension, compression, and tension from the surface to the center of the part. Viscoelastic deformation of the part is predicted during annealing and the deformed geometry is compared with that measured by a three dimensional scanner. The viscoelastic stress analysis with a thermal cycle will enable us to predict long term behavior of the injection molded polymeric parts.

A Study on the Injection Characters of The Back Side Grouting Method by a Model Test (모형실험을 통한 배면지수 그라우팅기법에 관한 연구)

  • Chun, Byung-Sik;Choi, Choon-Sik
    • Journal of the Korea institute for structural maintenance and inspection
    • /
    • v.6 no.2
    • /
    • pp.175-182
    • /
    • 2002
  • The cement injection technology on the purpose of ground reinforcement and cut-off has been used in construction sites until now. However, recently it is applied to prevent leakage of underground structure. In this study, applicability of the back side waterproof grouting method was verified through performing field model tests and reviewing case histories. From the results of this study, injection shape of the back side waterproof grouting method was appeared to be root type, and waterproof effect by injection of cement grout material was excellent because grout material infiltrated into boundary between wall of structure and back side ground to be waterproof layer. Components influencing infiltration of injection material are type of soil and degree of compaction. For effective injection, injection pressure has to vary gradually from high pressure to low pessure and small quantity of injection material has to be injected for long times. Also, spacing of injection hole must be designed considering condition of back side ground, injection area, W/C ratio, the number of injection and injection pattern properly.

Role of a ZnO buffer layer for the formation of epitaxial NiO films

  • Gwon, Yong-Hyeon;Cheon, Seong-Hyeon;Lee, Ju-Ho;Lee, Jeong-Yong;Jo, Hyeong-Gyun
    • Proceedings of the Materials Research Society of Korea Conference
    • /
    • 2012.05a
    • /
    • pp.85-85
    • /
    • 2012
  • NiO는 니켈 공공과 침입형 산소 이온에 의한 비화학적양론 특성 때문에 자발적으로 p-형 반도체 특성을 나타내는 것으로 알려져 있다. NiO는 3.7 eV 의 넓은 밴드갭을 가지고 있어 투명소자를 위한 hole injection layer 나 hole transport layer로 사용하기 위한 연구가 많이 이루어지고 있다. 또한, 안정적인 p-형 반도체 특성은 n-형 산화물 반도체와의 접합을 통해 복합소자의 구현이 용이하기 때문에, ZnO 등과의 접합을 통한 소자 구현이 가능하다.[1] 하지만, 기존의 많은 연구에서는 내부의 결함이 많이 존재하는 다결정 박막을 사용하였기 때문에, 전하의 이동에 제한이 발생해, 충분한 소자 특성을 나타내지 못하였다. 최근 Dutta의 연구에 의하면, 결정질 사파이어 기판위에 박막을 성장할 경우 [111] 방향으로 우선 배향성을 가진 NiO 박막을 얻을 수 있다고 알려져 있다.[2] 본 실험에서는 NiO 박막을 이용한 PN 접합소자 구현을 위해 사파이어 위에 p-NiO 박막을 에피택셜하게 성장한 후 구조적 특성을 분석하였으며, n-ZnO 박막을 그 위에 성장하여 소자를 제작하였다. 그 결과 ZnO 또한 에피택셜한 성장을 하는 것을 확인할 수 있었다. 성장순서에 따른 PN 접합구조 특성을 확인하기 위해 사파이어 위에 ZnO 를 성장시킨 후 NiO 를 성장시킨 결과 NiO 박막의 우선성장 방향이 [100]으로 변하는 것을 확인할 수 있었다.

  • PDF

Enhancement of Emission Efficiency of Multilayer White Light Organic Electroluminescent Device (다층구조를 적용한 백색 전계발광소자의 발광효율 향상)

  • Kim, Ju-Seung;Gu, Hal-Bon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2001.05a
    • /
    • pp.27-31
    • /
    • 2001
  • We fabricated organic electroluminescent(EL) devices with mixed emitting layer of poly(N-vinylcarbazole)(PVK), 2,5-bis(5'-tert-butyl-2-benzoxazoly)thiophene(BBOT), N,N'-diphenyl-N,N'-(3-methyphenyl)-1,1'-biphenyl-4, 4'-diarnine(TPD) and poly(3-hexylthiophene)(P3HT). To improve the external quantum efficiency of EL devices, we added the functional layer to the devices such as LiF insulating layer, carrier confinement layer(BBOT) and hole injection layer(CuPc). In the ITO/emitting layer/Al device, the maximum quantum efficiency at 15V was $1.88{\times}10^{-5}%$. And then, it is increased by a factor of 27 to $5.2{\times}10^{-3}%$ in ITO/CuPc/emitting layer/BBOT/LiF/Al device at 15V.

  • PDF

The Microscopic Surface Properties of Rhodamine Derivatives in EL System (EL시스템의 Rhodamine 유도체화합물의 표면특성)

  • 박수길;조성렬;손원근;조병호;임기조;이주성
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1997.04a
    • /
    • pp.265-268
    • /
    • 1997
  • Electroluminescent(EL) devices are constructed using multilayer organic thin film. A cell structure of glass substrate/Indium-Tinoxide/TPD as a hole transporting layer/Alq3+Rhodamine 101 perchrolate(Red3) as an emitting layer/Alq3 as an electrron transporting layer/Al as an electrode was employed. Optimal thickness of emitting layer in EL cell was performed from the viewpoint of the electronics properties of emitting layers. The general vapor-deposition method was used to control the thickness of omitting layer in EL devices and electro-optical characteristics were measured. It is clarified that controlling thickness of emitting layer in vapor-deposition film had an effect on the change of carrier injection and EL spectrum. The intensity of red omission with luminance of 81cd/$m^2$ was achived at 11V driving voltage. The surface morphology of emitting layer in EL devices was investigated.

  • PDF

Use of Self Assembled Monolayer in the Cathode/Organic Interface of Organic Light Emitting Devices for Enhancement of Electron Injection

  • Manna, U.;Kim, H.M.;Gowtham, M.;Yi, J.;Sohn, Sun-young;Jung, Dong-Geun
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2005.07b
    • /
    • pp.1343-1346
    • /
    • 2005
  • Self assembled monolayers (SAM) are generally used at the anode/organic interface to enhance the carrier injection in organic light emitting devices, which improves the electroluminescence performance of organic devices. This paper reports the use of SAM of 1-decanethiol (H-S(CH2)9CH3) at the cathode/organic interface to enhance the electron injection process for organic light emitting devices. Aluminum (Al), tris-(8-hydroxyquionoline) aluminum (Alq3), N,N'-diphenyl-N,N'-bis(3 -methylphenyl)-1,1'- diphenyl-4,4'-diamine (TPD) and indium-tin-oxide (ITO) were used as bottom cathode, an emitting layer (EML), a hole-transporting layer (HTL) and a top anode, respectively. The results of the capacitancevoltage (C-V), current density -voltage (J-V) and brightness-voltage (B-V), luminance and quantum efficiency measurements show a considerable improvement of the device performance. The dipole moment associated with the SAM layer decreases the electron schottky barrier between the Al and the organic interface, which enhances the electron injection into the organic layer from Al cathode and a considerable improvement of the device performance is observed. The turn-on voltage of the fabricated device with SAM layer was reduced by 6V, the brightness of the device was increased by 5 times and the external quantum efficiency is increased by 0.051%.

  • PDF