• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2011년도 제41회 하계 정기 학술대회 초록집
• /
• pp.293-294
• /
• 2011

It is known that semiconductor quantum-dot (QD) heterostructures have superior zero-dimensional quantum confinement, and they have been successfully applied to semiconductor laser diodes (QDLDs) for optical communication and infrared photodetectors (QDIPs) for thermal images [1]. The self-assembled QDs are normally formed at Stranski-Krastanov (S-K) growth mode utilizing the accumulated strain due to lattice-mismatch existing at heterointerfaces between QDs and cap layers. In order to increase the areal density and the number of stacks of QDs, recently, sub-monolayer (SML)-thick QDs (SQDs) with reduced strain were tried by equivalent thicknesses thinner than a wetting layer (WL) existing in conventional QDs (CQDs) by S-K mode. Despite that it is very different from CQDs with a well-defined WL, the SQD structure has been successfully applied to QDIP[2]. In this study, optical characteristics are investigated by using photoluminescence (PL) spectra taken from self-assembled InAs/GaAs QDs whose coverage are changing from submonolayer to a few monolayers. The QD structures were grown by using molecular beam epitaxy (MBE) on semi-insulating GaAs (100) substrates, and formed at a substrate temperature of 480$^{\circ}C$ followed by covering GaAs cap layer at 590$^{\circ}C$. We prepared six 10-period-stacked QD samples with different InAs coverages and thicknesses of GaAs spacer layers. In the QD coverage below WL thickness (~1.7 ML), the majority of SQDs with no WL coexisted with a small amount of CQDs with a WL, and multi-peak spectra changed to a single peak profile. A transition from SQDs to CQDs was found before and after a WL formation, and the sublevel of SQDs peaking at (1.32${\pm}$0.1) eV was much closer to the GaAs bandedge than that of CQDs (~1.2 eV). These revealed that QDs with no WL could be formed by near-ML coverage in InAs/GaAs system, and single-mode SQDs could be achieved by 1.5 ML just below WL that a strain field was entirely uniform.

• 마이크로전자및패키징학회지
• /
• 제9권3호
• /
• pp.49-56
• /
• 2002

본 연구에서는 평탄형 (exact) GaAs 기판과 $2^{\circ}$, $6^{\circ}$, $10^{\circ}$ 경사형 (offcut) GaAs 기판 등 네 종류의 기판에 유기금속 기상성장장치를 이용하여 InGaP 에피막을 성장시켰고, 기판경사도에 따른 계면의 탄성특성이 InGaP 에피막의 전위밀도에 미치는 영향에 대하여 최초로 연구하였다. 탄성변형은 TXRD의 격자부정합과 격자 misfit등을 고려하여 산출되었고, 전위밀도는 에피막의 x-선 반치폭을 이용하여 계산되었다. 기판경사도가 $6^{\circ}$일 때 계면의 탄성특성이 가장 양호하였고, x-선 반치폭은 가장 낮았다. 11 K PL측정 결과, 기판경사도 증가에 따라 PL 발진파장은 감소하였고, 기판경사도가 $6^{\circ}$에서 PL 강도 역시 가장 높았다. 에피막의 TEM 관측 결과, 회절패턴은 전형적인 zincblende 구조를 보였고, 기판경사도 $6^{\circ}$에서 전위밀도가 가장 낮게 관측되어 TXRD 및 저온 PL측정 결과와 부합되었다. 본 연구의 결과와 소자제작 특성 및 빔특성을 종합적으로 고려해 볼 대, 광전소자용 InGaP/GaAs 이종접합구조에서 최적의 기판경사도는 $6^{\circ}$임을 밝혔다.

• 센서학회지
• /
• 제22권4호
• /
• pp.244-248
• /
• 2013

The discovery of a two-dimensional electron gas (2DEG) in $LaAlO_3$ (LAO)/$SrTiO_3$ (STO) heterostructure has stimulated intense research activity. We suggest a new structure model based on $KNbO_3$ (KNO) material. The KNO thin films were grown on $TiO_2$-terminated STO substrates as a p-type structure ($NbO_2/KO/TiO_2$) to form a two-dimensional hole gas (2DHG). The STO thin films were grown on KNO/$TiO_2$-terminated STO substrates as an n-type structure to form a 2DEG. Oxygen pressure during the deposition of the KNO and STO thin films was changed so as to determine the effect of oxygen vacancies on 2DEGs. Our results showed conducting behavior in the n-type structure and insulating properties in the p-type structure. When both the KNO and STO thin films were deposited on a $TiO_2$-terminated STO substrate at a low oxygen pressure, the conductivity was found to be higher than that at higher oxygen pressures. Furthermore, the heterostructure formed at various oxygen pressures resulted in structures with different current values. An STO/KNO heterostructure was also grown on the STO substrate, without using the buffered oxide etchant (BOE) treatment, so as to confirm the effects of the polar catastrophe mechanism. An STO/KNO heterostructure grown on an STO substrate without BOE treatment did not exhibit conductivity. Therefore, we expect that the mechanics of 2DEGs in the STO/KNO heterostructures are governed by the oxygen vacancy mechanism and the polar catastrophe mechanism.

• 접착 및 계면
• /
• 제24권3호
• /
• pp.100-104
• /
• 2023

본 Van der Waals heterostructure 기반의 트랜지스터의 경우 표면에 불포화 결함(dangling bond) 없이 Van der Waals 힘으로만 결합되어 있어 우수한 전자특성을 보이기 때문에 최근 많이 연구되고 있다. 하지만, 트랜지스터에 사용되는 2차원 물질들은 대부분 스카치테이프(mechanical exfoliation) 방법을 기반으로 하는 기초 연구에 머물러 있다. 그렇기 때문에 이를 발전시키기 위해 반데르발스 수직이종접합 전계효과 트랜지스터를 제작하는 데 사용되는 모든 소재를 CVD (chemical vapor deposition)에서 성장된 소재를 사용하였다. 전극으로는 CVD로 성장된 그래핀을 포토리소그래피 공정을 통해 패터닝하여 사용하였으며, CVD로 성장된 MoSe₂를 픽업/전사하는 방식으로, 둘 사이의 반데르발스 이종접합 전계효과 트랜지스터를 제작하였다. 본 연구에서는 이를 통해 제작된 소자의 특성을 보았으며 MoSe₂의 결함 유무에 따라 트랜지스터의 특성에 변화가 있음을 확인하였다.

• 마이크로전자및패키징학회지
• /
• 제31권1호
• /
• pp.43-48
• /
• 2024

SrTiO₃ (STO) 기판 위에 성장된 LaAlO₃ (LAO) 계면에서의 이차원 전자 가스 (2DEG)의 발견은 복합 산화물 이종 구조를 기반으로 한 혁신적인 전자소자 연구의 장을 제공함으로써 많은 관심을 받아왔다. 하지만 LAO 박막을 형성하기 위하여, 일반적으로 물리기상증착법(PVD)을 기반으로 하는 펄스 레이저 증착 (PLD) 등의 기법이 주로 사용되어 왔으나, 공정 비용이 많이 들며 LAO 내 La와 Al의 정밀한 조성 제어가 어려운 단점이 있다. 본 연구에서는 PVD에 비해 경제적인 대안인 용액 기반 공정을 사용하여 LAO 박막을 제조하였고, 그 전기적 특성을 평가하였다. LAO 전구체 용액의 농도를 다르게 하여 LAO의 두께를 2에서 65 nm까지 변화시켰으며, 각 두께에 따른 면저항 및 캐리어 농도를 도출하였다. 진공 열처리 후 형성된 전도성 채널의 면저항 값은 0.015에서 0.020 Ω·sq^-1 범위로 나타났으며, 이러한 결과는 기존 문헌과 비교하였을 때 LAO와 STO 사이의 계면에서의 전자 이동뿐만 아니라 계면으로부터 떨어져 있는 STO bulk 영역으로의 전자 전도를 시사한다. 본 연구 결과는 용액 기반 공정을 통한 2DEG 형성 및 제어를 구현한 것으로, 공정 비용을 줄이고 전자 소자 제조에서 보다 광범위한 응용 가능성을 제시한다는 점에 그 의의가 있다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
• /
• pp.284-284
• /
• 2016

Topological insulator (TI) is a bulk-insulating material with topologically protected Dirac surface states in the band gap. In particular, $Bi_2Se_3$ attracted great attention as a model three-dimensional TI due to its simple electronic structure of the surface states in a relatively large band gap (~0.3 eV). However, experimental efforts using $Bi_2Se_3$ have been difficult due to the abundance of structural defects, which frequently results in the bulk conduction being dominant over the surface conduction in transport due to the bulk doping effects of the defect sites. One promising approach in avoiding this problem is to reduce the structural defects by heteroepitaxially grow $Bi_2Se_3$ on a substrate with a compatible lattice structure, while also preventing surface degradation by encapsulating the pristine interface between $Bi_2Se_3$ and the substrate in a clean growth environment. A particularly promising choice of substrate for the heteroepitaxial growth is hexagonal boron nitride (h-BN), which has the same two-dimensional (2D) van der Waals (vdW) layered structure and hexagonal lattice symmetry as $Bi_2Se_3$. Moreover, since h-BN is a dielectric insulator with a large bandgap energy of 5.97 eV and chemically inert surfaces, it is well suited as a substrate for high mobility electronic transport studies of vdW material systems. Here we report the heteroepitaxial growth and characterization of high quality topological insulator $Bi_2Se_3$ thin films prepared on h-BN layers. Especially, we used molecular beam epitaxy to achieve high quality TI thin films with extremely low defect concentrations and an ideal interface between the films and substrates. To optimize the morphology and microstructural quality of the films, a two-step growth was performed on h-BN layers transferred on transmission electron microscopy (TEM) compatible substrates. The resulting $Bi_2Se_3$ thin films were highly crystalline with atomically smooth terraces over a large area, and the $Bi_2Se_3$ and h-BN exhibited a clear heteroepitaxial relationship with an atomically abrupt and clean interface, as examined by high-resolution TEM. Magnetotransport characterizations revealed that this interface supports a high quality topological surface state devoid of bulk contribution, as evidenced by Hall, Shubnikov-de Haas, and weak anti-localization measurements. We believe that the experimental scheme demonstrated in this talk can serve as a promising method for the preparation of high quality TI thin films as well as many other heterostructures based on 2D vdW layered materials.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
• /
• pp.298-298
• /
• 2014

Quantum dot infrared photodetectors (QDIPs) based on Stranski-Krastanov (SK) quantum dots (QDs) have been widely explored for improved device performance using various designs of heterostructures. However, one of the biggest limitations of this approach is the "pancake" shape of the dot, with a base of 20-30 nm and a height of 4-6 nm. This limits the 3D confinement in the quantum dot and reduces the ratio of normal incidence absorption to the off-axis absorption. One of the alternative growth modes to the formation of SK QDs is a sub-monolayer (SML) deposition technique, which can achieve a much higher density, smaller size, better uniformity, and has no wetting layer as compared to the SK growth mode. Due to the advantages of SML-QDs, the SML-QDIP design has attractive features such as increased normal incidence absorption, strong in-plane quantum confinement, and narrow spectral wavelength detection as compared with SK-DWELL. In this study, we report on the improved device performance of InAs/InGaAs SML-QDIP with different composition of $Al_xGa1-_xAs$ barrier. Two SML-QDIPs (x=0.07 for sample A and x=0.20 for sample B) are grown with the 4 stacks 0.3 ML InAs. It is investigated that sample A with a confinement-enhanced (CE) $Al_{0.22}Ga_{0.78}As$ barrier had a single peak at $7.8{\mu}m$ at 77 K. However, sample B with an $Al_{0.20}Ga_{0.80}As$ barrier had three peaks at (${\sim}3.5{\mu}m$, ${\sim}5{\mu}m$, ${\sim}7{\mu}m$) due to various quantum confined transitions. The measured peak responsivities (see Fig) are ~0.45 A/W (sample A, at $7.8{\mu}m$, $V_b=-0.4V$ bias) and ~1.3 A/W (sample B, at $7{\mu}m$, $V_b=-1.5V$ bias). At 77 K, sample A and B had a detectivity of $1.2{\times}10^{11}cm.Hz^{1/2}/W$ ($V_b=-0.4V$ bias) and $5.4{\times}10^{11}cm.Hz^{1/2}/W$ ($V_b=-1.5V$ bias), respectively. It is obvious that the higher $D^*$ of sample B (than sample A) is mainly due to the low dark current and high responsivity.