• Title/Summary/Keyword: fresnel relation

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FTIR and Moisture Effects on Optical Information Transfer at Interface of Air and Glass (공기-유리 계면에서 광학정보 전달에 미치는 불완전 반사 및 수분 효과)

  • Han, Won Heum;Han, Ji Heum;Kim, Jee Hyen;Jung, Hyung Sik;Lee, Moon Ho
    • Journal of Adhesion and Interface
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    • v.13 no.2
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    • pp.73-84
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    • 2012
  • The transfer mechanism of optical information at the interface of air and glass (the air-glass IF) has been investigated by thoroughly fulfilling the theoretical and experimental analyses regarding the FTIR (Frustrated Total Internal Reflection) and moisture effects on the fingerprint onto a glass cup with water. As for the fingerprint onto a glass cup with water its image was observed to be very vivid, which turned out to be due to the difference between the two light intensities reflected on the air-glass IF and the wet fingerprint ridge by manipulating the optical theories such as Fresnel relation, Snell's law, FTIR, GT (general transmission) and so on. In addition, the experimental inspection for FTIR and moisture effects on the fingerprint image also evidenced the fact that the vivid fingerprint image originated from the moisture effect rather than the FTIR phenomenon.

Effects of Multiple Reflections of Polarized Beam in Laser Grooving (레이저 홈가공에서 편광빔의 다중반사 효과)

  • Bang Se-Yoon;Seong Kwan-Je
    • Journal of Welding and Joining
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    • v.23 no.2
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    • pp.81-89
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    • 2005
  • A numerical model for multiple reflection effects of a polarized beam on laser grooving has been developed. The surface of the treated material is assumed to reflect laser irradiation in a fully specular fashion. Combining electromagnetic wave theory with Fresnel's relation, the reflective behavior of a groove surface can be obtained as well as the change of the polarization status in the reflected wave field. The material surface is divided into a number of rectangular patches using a bicubic surface representation method. The net radiative flux far these patch elements is obtained by standard ray tracing methods. The changing state of polarization of the electric field after reflection was included in the ray tracing method. The resulting radiative flux is combined with a set of three-dimensional conduction equations governing conduction losses into the medium, and the resulting groove shape and depth are found through iterative procedures. It is observed that reflections of a polarized beam play an important role not only in increasing the material removal rate but also in forming different final groove shapes. Comparison with available experimental results for silicon nitride shows good agreement for the qualitative trends of the dependence of groove shapes on the electric field vector orientation.