• Title/Summary/Keyword: focused-ion-beam (FIB) circuit editing

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Asymmetric Signal Scanning Scheme to Detect Invasive Attacks (침투 공격 검출을 위한 비대칭 신호 스캐닝 기법)

  • Da Bin Yang;Ga Young Lee;Young-woo Lee
    • Smart Media Journal
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    • v.12 no.1
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    • pp.17-23
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    • 2023
  • Design-For-Security (DFS) methodology is to protect integrated circuits from physical attacks, and that can be implemented by adding a security circuit to detect abnormal external access. Among the abnormal accesses called invasive attack, microprobing and FIB circuit editing are classified as the most powerful methods because they have direct access. Microprobing deliberately inject defects into the wire of circuit through probes, or reads and changes data. FIB circuit editing is methods of reconnecting or destroying circuits to neutralize security circuits or to access data. Previous DFS methodology have responded to the attacks by detecting arrival time asymmetry between the two signals or by comparing input/output data based on encrypted communication. This study conducted to reduce hardware overhead, and the proposed circuit detects the reflected signal asymmetry generated through probe or FIB circuit editing and detects the attacks through comparison. Since the proposed security circuit reduces the size and test cycle of the circuit compared to previous studies, the cost used for security can be reduced.