• Journal of the Korea Society of Computer and Information
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• v.20 no.11
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• pp.1-8
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• 2015

Flash memory has advantages in that it is fast access speed, low-power, and low-price. Therefore, they are widely used in electronics industry sectors. However, the flash memory has weak points, which are the limited number of erase operations and non-in-place update problem. To overcome the limited number of erase operations, many wear leveling techniques are studied. They use many tables storing information such as erase count of blocks, hot and cold block indicators, reference count of pages, and so on. These tables occupy some space of main memory for the wear leveling techniques. Accordingly, they are not appropriate for low-power devices limited main memory. In order to resolve it, a wear leveling technique using bit array and Bit Set Threshold (BST) for flash memory. The proposing technique reduces the used space of main memory using a bit array table, which saves the history of block erase operations. To enhance accuracy of cold block information, we use BST, which is calculated by using the number of invalid pages of the blocks in a one-to-many mode, where one bit is related to many blocks. The performance results illustrate that the proposed wear leveling technique improve life time of flash memory to about 6%, compared with previous wear leveling techniques using a bit array table in our experiment.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.17 no.4
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• pp.143-148
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• 2017

Flash Memory which is light and strong external shock as storage of small electronics like smartphone, digital camera, car black box has been widely used. Since the operation speed of the read operation and the write operation are different from each other, and the flash memory has the feature that it is not possible to overwrite, the delete operation is added to solve these problems. Wear-leveling must also be considered, since the number of erase times of the flash memory is limited. Many studies have been conducted on the substitutional algorithms of flash memory based on these characteristics of recent flash memories. So, to solve the problem that has existing buffer replacement algorithm this thesis divide page into 6 groups and when proposed algorithm select victim page, it consider reference page frequency and page recency.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.2
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• pp.286-291
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• 2015

For highly scalable NAND flash memory applications, a compact ($4F^2/cell$) nonvolatile memory architecture is proposed and investigated via three-dimensional device simulations. The back-channel program/erase is conducted independently from the front-channel read operation as information is stored in the form of charge at the backside of the channel, and hence, read disturbance is avoided. The memory cell structure is essentially equivalent to that of the fully-depleted transistor, which allows a high cell read current and a steep subthreshold slope, to enable lower voltage operation in comparison with conventional NAND flash devices. To minimize memory cell disturbance during programming, a charge depletion method using appropriate biasing of a buried back-gate line that runs parallel to the bit line is introduced. This design is a new candidate for scaling NAND flash memory to sub-20 nm lateral dimensions.

• Journal of IKEEE
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• v.25 no.4
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• pp.778-781
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• 2021

In this paper, we propose the 16-layer 3D NAND Flash memory compact modeling using SPICE. In the same structure and simulation conditions, the channel potential about Down Coupling Phenomenon(DCP) and Natural Local Self Boosting (NLSB) were simulated and analyzed with Technology Computer Aided Design(TCAD) tool Atlas(Silvaco^TM) and SPICE, respectively. As a result, it was confirmed that the channel potential of TCAD and SPICE for the two phenomena were almost same. The SPICE can be checked the device structure intuitively by using netlist. Also, its simulation time is shorter than TCAD. Therefore, using SPICE can be expected to efficient research on 3D NAND Flash memory.

• International Journal of Internet, Broadcasting and Communication
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• v.14 no.3
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• pp.161-170
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• 2022

Recently, NAND-type flash memory has been regarded to be new promising storage media for large-scale database systems. For flash memory to be employed for that purpose, we need to reduce its expensive update cost caused by the inablity of in-place updates. To remedy such a drawback in flash memory, we propose a new flash-aware buffering scheme that enables virtual flushing of dirty pages. To this end, we slightly alter the tradional algorithms used for the logging scheme and buffer management scheme. By using the mechanism of virtual flushing, our proposed buffering scheme can efficiently prevent the frequenct occureces of page updates in flash storage. Besides the advantage of reduced page updates, the proposed viurtual flushing mechanism works favorably for shorneing a recocery time in the presense of failure. This is because it can reduce the time for redo actions during a recovry process. Owing to those two benefits, we can say that our scheme couble be very profitable when it is incorporated into cutting-edge flash-based database systems.

• Journal of the Korea Society of Computer and Information
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• v.16 no.10
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• pp.1-10
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• 2011

There are the large overhead of block erase and page write operations in NAND flash memory, though it has low power consumption, cheap prices and a large storage. Due to the physical characteristics of NAND flash memory, overwrite operations are not permitted at the same location, so rewriting operation require after erase operation. it cause performance decrease of NAND flash memory. Using SRAM buffer in traditional NAND flash memory, it can not only reduce effective write operation but also guarantee fast memory access time. In this paper, we proposed the small SRAM buffer management system for reducing overhead of NAND flash memory, that is, erase and write operations. The proposed buffer system in a NAND flash memory consists of two parts, i.e., a fully associative temporal buffer with the small fetching block size and a fully associative spatial buffer with the large fetching block size. The temporal buffer have small fetching blocks that referenced from spatial buffer. When it happen write operations or erase operations in NAND flash memory, the related fetching blocks in temporal buffer include a page or a block are written in NAND flash memory at the same time. The writing and erasing counts in NAND flash memory can be reduced. According to the simulation results, although we have high miss ratios, write and erase operations can be reduced approximatively 58% and 83% respectively. Also the average memory access times are improved about 84% compared with the fully associative buffer with two sizes.

• JSTS:Journal of Semiconductor Technology and Science
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• v.11 no.2
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• pp.121-129
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• 2011

It is progressing as new advents and remarkable developments of mobile device every year. On the upper line reason, NAND FLASH large density memory demands which can be stored into portable devices have been dramatically increasing. Therefore, the cell size of the NAND Flash memory has been scaled down by merely 50% and has been doubling density each per year. [1] However, side effects have arisen the cell distribution and reliability characteristics related to coupling interference, channel disturbance, floating gate electron retention, write-erase cycling owing to shrinking around 20nm technology. Also, FLASH controller to manage shrink effect leads to speed and current issues. In this paper, It will be introduced to solve cycling, retention and fail bit problems of sub-deep micron shrink such as Virtual negative read used in moving read, randomization. The characteristics of retention, cycling and program performance have 3 K per 1 year and 12.7 MB/s respectively. And device size is 179.32 $mm^2$ (16.79 mm ${\times}$ 10.68 mm) in 3 metal 26 nm CMOS.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.6
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• pp.122-130
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• 2013

The demand and the supply are increasing sharply in accordance with the growth of the Memory Semiconductor Industry. The Flash Memory above all is being utilized substantially in the Industry of smart phone, the tablet PC and the System on Chip (SoC). The Flash Memory is divided into the NOR-type Flash Memory and the NAND-type Flash Memory. A lot of study such as the Built-In Self Test (BIST), the Built-In Self Repair (BISR) and the Built-In Redundancy Analysis (BIRA), etc. has been progressed in the NOR-type fash Memory, the study for the Built-In Self Test of the NAND-type Flash Memory has not been progressed. At present, the pattern test of the NAND-type Flash Memory is being carried out using the outside test equipment of high price. The NAND-type Flash Memory is being depended on the outside equipment as there is no Built-In Self Test since the erasure of block unit, the reading and writing of page unit are possible in the NAND-type Flash Memory. The Built-In Self Test equipped with 2 kinds of finite state machine based structure is proposed, so as to carry out the pattern test without the outside pattern test equipment from the NAND-type Flash Memory which carried out the test dependant on the outside pattern test equipment of high price.

• The KIPS Transactions:PartD
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• v.13D no.3 s.106
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• pp.377-382
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• 2006

Advantageous features of flash memory are stimulating its exploitation in mobile and ubiquitous related devices. The hardware characteristics of flash memory however place restrictions upon this current trend. In this paper, a cleaning policy for flash memory is proposed in order to decrease the necessary penally for recycling of memory minimizing the degradation of performance at the same time. The proposed cleaning algorithm is based on partitioning of candidate memory regions, to be reclaimed as free, into a number of groups. In addition, in order to improve the balanced utilization of the entire flash memory space in terms of 'wearing-out', a free segment selection algorithm is discussed. The impact of the proposed algorithms is evaluated through a number of experiments. Moreover, the composition of the optimal configuration featuring the proposed methods is tested through experiments.

• Journal of KIISE:Computer Systems and Theory
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• v.32 no.11_12
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• pp.587-597
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• 2005

Flash memory based embedded computing systems are becoming increasingly prevalent.These systems typically have to provide an instant start-up time. However, we observe that mounting a file system toy flash memory takes 1 to 25 seconds mainly depending on the flash capacity. Since the flash chip capacity is doubled in every year, this mounting time will soon become the most dominant reason of the delay of system start-up time Therefore, in this paper, we present instant mounting techniques for flash file systems by storing the In-memory file system metadata to flash memory when unmounting the file system and reloading the stored metadata quickly when mounting the file system. These metadata snapshot techniques are specifically developed for NOR- and NAND-type flash memories, while at the same time, overcoming their physical constraints. The proposed techniques check the validity of the stored snapshot and use the proposed fast trash recovery techniques when the snapshot is Invalid. Based on the experimental results, the proposed techniques can reduce the flash mounting time by about two orders of magnitude over the existing de facto standard flash file system, JFFS2.