• Title/Summary/Keyword: excess Pb

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Structural and Dielectric Properties of PLT Thin Plates (PLT 박편의 구조 및 유전특성)

  • Lee, Jae-Man;Park, Ki-Cheol
    • Journal of Sensor Science and Technology
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    • v.7 no.1
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    • pp.51-60
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    • 1998
  • La-modified $PbTiO_{3}$(PLT) thin plates were prepared for the fabrication of PLT pyroelectric IR sensors. The effects of the preparation parameters such as tile sintering temperature, the La content, and the ambient powder quantity, on the microstructural and dielectric properties of PLT thin plates were investigated by X-ray diffraction, scanning electron microscope, and measurements of relative density and dielectric properties. With an increased La content, the tetragonality c/a was decreased but the densification and the grain size were increased, which is considered to be due to the increased Pb vacancy concentration to maintain charge neutrality at the increased of La content. When the quantity of the ambient powder wvas increased, the tetragonality was slightly increased, which is believed io be due to the reduced evaporation of PbO. But the e(fect is insignificant compared to that of La content. The dielectric constant at room temperature was increased and the Curie temperature was decreased in accordance with the decreased tetragonality ratio c/a with the increase of La content. The dielectric constant and tan ${\delta}$ of $500{\mu}m$ thick PLT thin plate with 10 wt% excess PbO and 10 mol% La contant sintered at $1250^{\circ}C$ for 2 hours in ambient powder of $0.02\;g/cm^{3}$ were 360 and 0.02, respectively.

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The Properties of Pb(Zr,Ti)$\textrm{O}_3$ Thin Films Fabricated by 2-Step Method (2단계 증착법으로 제조된 Pb(Zr,Ti)$\textrm{O}_3$ 박막의 특성)

  • Nam, Hyo-Jin;No, Gwang-Su;Lee, Won-Jong
    • Korean Journal of Materials Research
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    • v.8 no.12
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    • pp.1152-1157
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    • 1998
  • The PZT films were deposited on the Pt/Ti/$SiO_2$/Si substrates using multi- target DC magnetron reactive sputtering. The perovskite single phase with the composition close to the stoichiometric one, was obtained even at high substrate temperature of $540^{\circ}C$ by 2-step method, which is that PZT film was deposited for a short time at low substrate temperature ($480^{\circ}C$) to promote the nucleation of perovskite phase by reducing the volatility of Pb oxide molecules, followed by the deposition at the elevated temperature to suppress the excess incorporation of Pb component in the PZT film. This two-step method, in combination with the RTA treatment, gives rise to good electrical properties of the deposited PZT films: remanent polarifaion,$18\mu$C/$\textrm{cm}^2$; coercive field, 45kV/cm; leakage current of 10$^{-4}$ A/$\textrm{cm}^2$ at high electric field of -500kV/cm.

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Ferroelectric properties of $Pb[(Zr,Sn)Ti]NbO_3$ Thin Films by Annealing (열처리에 따른 $Pb[(Zr,Sn)Ti]NbO_3$ 박막의 강유전 특성)

  • 최우창;최혁환;이명교;권태하
    • Proceedings of the IEEK Conference
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    • 2000.06b
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    • pp.24-27
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    • 2000
  • Ferroelectric P $b_{0.99}$〔(Z $r_{0.6}$S $n_{0.4}$)$_{0.9}$ $Ti_{0.1}$$_{0.98}$N $b_{0.02}$ $O_3$(PNZST) thin films were deposited by a RF magnetron sputtering on (L $a_{0.5}$S $r_{0.5}$)Co $O_3$(LSCO)/Pt/Ti/ $SiO_2$/Si substrate using a PNZST target with excess PbO of 10 mole%. The thin films deposited at the substrate temperature of 500 $^{\circ}C$ were crystallized to a perovskite phase after rapid thermal annealing(RTA) The thin films annealed at 650 $^{\circ}C$ for 10 seconds in air exhibited the good crystal structures and ferroelectric properties. The remanent polarization and coercive field of the PNZST capacitor were about 20 $\mu$C/$\textrm{cm}^2$ and 50 kV/cm, respectively. The reduction of the polarization after 2.2$\times$10$^{9}$ switching cycles was less than 10 %.0 %.%.0 %.0 %.

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Observation of Carrier Multiplication via Internal Quantum Efficiency Exceeding 100% in PbS QDs Monolayer Solar Cells

  • Park, So Yeon;Chung, Hyun Suk;Han, Gill Sang;Su, Jang Ji;Jung, Hyun Suk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.467.1-467.1
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    • 2014
  • Quantum dots (QD) solar cells has received considerable attention due to their potential of improving the overall conversion efficiency by harvesting excess energy via multiple excitons generation (MEG). Although there have been many reports which show MEG phenomena by using optical measurement of quantum dots themselves, carrier multiplication in real QD photovoltaic devices has been sparsely reported due to difficulty in dissociation of excitons and charge collection. In this reports, heterojunction QD solar cells composed of PbS QD monolayer on highly crystalline $TiO_2$ thin films were fabricated by using Langmuir-Blodgett deposition technique to significantly reduce charge recombination at the interfaces between each QD. The PbS CQDs monolayer was characterized by using UV-vis, transmission electron microscopy (TEM) and atomic force microscopy (AFM). The internal quantum efficiency (IQE) for the monolayer QD solar cells was obtained by measurement of external quantum efficiency and determining light absorption efficiency of active layer. Carrier multiplication was observed by measuring IQE greater than 100% over threshold photon energy. Our findings demonstrate that monolayer QD solar cell structure is potentially capable of realizing highly efficient solar cells based on carrier multiplication.

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Electrical Characteristics of the High Power Piezoelectric transformer Using PSN-PZT system ceramics (PSN-PZT계 세라믹스를 이용한 고출력 압전 트랜스포머의 전기적 특성)

  • 이용우;류주현;윤광희;정회승;서성재;김종선
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.13 no.4
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    • pp.286-293
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    • 2000
  • In this paper we investigated the structural dielectric and piezoelectric properties of 0.03Pb(Sb$\_$1/2//Nb$\_$1/2/)-0.97Pb(Zr$\_$0.495//Ti$\_$0.505/)O$_3$+0.5 wt% excess PbO + wt% MnO(X=0, 0.1, 0.3, 0.5, 0.7) ceramics to develop the high-power piezoelectric transformer. The piezoelectric transformers with dimension of 27.5$\times$27.5$\times$2.5[mm$^3$]were fabricated and their electrical properties were measured. Maxima of piezoelectric properties such as electro-mechanical coupling factor of 0.534 and mechanical quality factor of 1487 were obtained for the PSN-PZT with 0.3wt% MnO. voltage step-up ratios of piezoelectric transformers at 500[Ω]and no load were 0.78, 12.82, respectively. The maximum efficiency of piezoelectric transformer was 98.6% at 800[Ω]. While the 14W fluorescent lamp were driven by the piezoelectric transformer for more than 20[min], increment of temperature in the piezoelectric transformer was 7[$\^{C}$].

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Pyroelectric Properties of PLT Thin Films Prepared by Sol-Gel Method (Sol-Gel 법으로 제조한 PLT박막의 초전특성)

  • Chung, Jang-Ho;Lee, Moon-Kee;Park, In-Gil;Lee, Young-Hie
    • Proceedings of the KIEE Conference
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    • 1997.07d
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    • pp.1488-1490
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    • 1997
  • $(Pb_{1-x}La_x)Ti_{1-x/4}O_3$ (x=0, 0.02, 0.04, 0.06, 0.08) ceramic thin films were fabricated by Sol-Gel method. A stock solution of (Pb,La)$TiO_3$ with excess Pb 10mol% was made and spin-coated on the Pt/Ti/$SiO_2$/Si substrate at 4000rpm for 30 seconds. Coated specimens were dried on the hot-plate at $350^{\circ}C$ for 10 min and sintered at $500{\sim}750^{\circ}C$ for 1 hour. The dielectric constant, remanent polarization and coercive field of the PLT(6 at.%) thin films sintered at $650^{\circ}C$ were 884, $13.95{\mu}C/cm^2$ and 8.7kV/cm, respectively. Pyroelectric coefficient, figure of merit of pyroelectric current, voltage responsivity and detectivity of PLT(6at.%) thin films were $3.2{\times}10^{-8}\;C/cm^2K$, $1.02{\times}10^{-8}\;C{\cdot}cm/J$, $2.9{\times}10^{-11}\;C{\cdot}cm/J$, $0.29{\times}10^{-8}\;C{\cdot}cm/J$, respectively.

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Dielectric and Piezoelectric Properties of PSS-PT-PZ Ceramics with the Addition of Dopant (불순물 첨가에 따른 PSS-PT-PZ 세라믹의 유전 및 압전특성)

  • Kang, Jeong-Min;Lee, Sung-Gap;Lee, Sang-Heon;Bae, Seon-Gi;Lee, Young-Hie
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.296-299
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    • 2003
  • In this paper, $0.10Pb(Sb_{1/2}Sn_{1/2})O_3-0.25PbTiO_3-0.65PbZrO_3$ ceramics were fabricated by the mixed-oxide method. The sintering temperature and time were $1230^{\circ}C$ and 2[hr], respectively. The structural, dielectric and piezoelectric properties with addition of NiO were studied. The crystal structure of a specimen was rhombohedral. As a result of SEM, the average grain size were decreased with increasing the contents of NiO. But the grains of the specimens doped with 0.4wt% NiO were increased, due to deposits of excess NiO at grain boundaries in the liquid phase. Relative dielectric constant and dielectric loss of the specimen doped with 0.1wt% NiO were 701 and 0.026, respectively.

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Chemical Analysis and Thermoelectric Properties of the PbSnTe Semiconductors (화학조성에 따른 PbSnTe계 반도체의 열전특성조사)

  • Oh, Kyu-Whan;Oh, Seung-Mo
    • Applied Chemistry for Engineering
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    • v.1 no.1
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    • pp.83-90
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    • 1990
  • The semiconducting $(Pb_1\;_xSn_x)_1$ $_yTe_y$, one of the low - temperature thermoelectric materials, has been prepared and its chemical composition and nonstoichiometry has been analyzed. The content of Pb in the specimens was determined by the complexometric back - titration method with EDTA and Pb(II) standard solutions. Te - content was analyzed with the redox titration method. The electrical conductivity and the thermoelectric power have also been measured by the DC 4 - probe and the heat-pulse technique, respectively. All of the specimens showed a nonstoichiometric behavior in their chemical compositions (Te excess), thus gave rise to a p - type semiconducting property, and the nonstoichoimetry became bigger as the Sn - content increased. The thermoelectric power vs. temperature results have been analyzed upon the basis of the Fermi level vs. temperature profiles in the saturation regime. The specimen of x=0.1 evolved a transition from p - to n - type property at about 670K, which has been explained by the fact that the mobility of electrons is bigger than that of holes in the temperature range of the intrinsic regime.

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Effect of PbO on Microwave Dielectric Properties of (Pb, Ca) (Fe, Nb, Sn) O3 Ceramics

  • Yoon, Seok-Jin;Park, Ji-Won;Kang, Chong-Yun;Kim, Hyun-Jai;Jung, Hyung-Jin;Sergey Kucheiko;Cho, Bong-Hee
    • The Korean Journal of Ceramics
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    • v.4 no.3
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    • pp.249-253
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    • 1998
  • The influence of PbO additive on dielectric properties and sintering behavior of $(Pb_{0.46}Ca_{0.55})$ {$(Fe__1/2}Nb_{1/2}){0.9}Sn_{{0.1}$}$O_3$ ceramics has been investigated. The incorporation of a limited excess PbO ($\leq$2.0 wt. %) in the starting materials is quite beneficial for densification in the temperature range of 1150~$1175^{\circ}C$ in air. At a small doping level (0.8 wt. %) the ceramics prepared from powders calcined at $900^{\circ}C$ showed the best dielectric properties. The dielectric constants ($\varepsilon_r$) and Q.f were found to be 85.8~85.6 and 8530~8600 GHz, respectively. The temperature coefficient of resonant frequency ($\tau_f$) varied in the range of -2~4 $ppm/^{\circ}C$. Examination of the microstructure as well as analysis of the second phases in these materials revealed the presence of the pyrochlore-type phase which is detrimental to the dielectrics.

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Crystal Structure of High Temperature Phase in ${Bi_2}{O_2}$-layered Perovskites ${ABi_2}{M_2}{O_9}$(A=Pb, Sr, M=Nb, Ta)

  • Kim, Jeong-Seog;Cheon, Chae-il;Lee, Chang-Hee;Choo, Woong-Gil
    • Journal of the Korean Ceramic Society
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    • v.38 no.11
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    • pp.962-966
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    • 2001
  • Crystal structure of PbBi$_2$Nb$_2$$O_{9}$ and $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ were determined by Rietveld method using neutron diffraction data in the temperature range of 300 K~1273K. Phase transition temperature were measured from the dielectric permittivitytemperature curve. The PbBi$_2$Nb$_2$$O_{9}$ showed a phase transition at about 810 K. In the Sr-excess compound $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ the phase transition was suppressed down to room temperature. Several structural models were tested by the Rietiveld refinement. Based on the \`R\` values and the structural parameters, the B2cb model is judged to be the most feasible one for the high temperature phase at above 810 K of the PbBi$_2$Nb$_2$$O_{9}$. The $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ sample was refined to show the most reliable results by the Am2m model.sults by the Am2m model.

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