• Journal of the Optical Society of Korea
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• v.18 no.4
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• pp.370-376
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• 2014

We optimized the design of the flat encapsulant of a light-emitting diode (LED) package to obtain higher light output power (LOP), both by experiment and simulation using three-dimensional ray-tracing software. In the experiment, the refractive index of the encapsulant was varied (1.41 and 1.53). In addition, double-layer structures with these refractive indices (1.41/1.53) were investigated by varying the shape of the interface between the two among flat, concave, and convex. The experiments showed that the LOP of the double-layer encapsulant with convex interface increased by 13.4% compared to the single-layer encapsulant with a refractive index 1.41, which was explained by the increase of the light extraction efficiency (LEE) in connection with the increase of the critical angle (${\theta}_c$) and the decrease of the Fresnel reflection.

• Bulletin of the Korean Chemical Society
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• v.34 no.12
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• pp.3787-3789
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• 2013

In this study, the silicone thermal curing degree of the silicone-encapsulated quantum dot light emission diode was measured using the various types of chemical ligands around quantum dot. It was confirmed that the trioctyl phosphin oxide (TOPO) ligand around the quantum dot was responsible for dispersion of the quantum dot in silicone encapsulant and decline of the thermal curing degree of the silicone encapsulant. Also, it was confirmed that the thermal curing degree of silicone encapsulants containing the steric acid (SA) and the dodecanoic acid (DA) ligands were higher than the one of TOPO ligand.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2003.05a
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• pp.88-93
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• 2003

IC 패키지 기술중 Underfilling 은 칩과 기판사이에 Encapsulant의 표면장력을 이용하여 주입하고 경화시킴으로써 전기적 기계적 보강력을 제공하는 기술로서 시스템 칩의 발전과 함께 차세대 패키징 기술중의 하나이다. 본 연구에서는 기존의 Underfilling 공정을 개선하여 충전시간을 획기적으로 줄일 수 있는 가압식 Underfilling 공정을 이용하여 차세대 반도체 패키징에 적용할 수 있는 가능성을 파악하였다. 이를 위하여 칩과 기판사이에 주입되고 경화되는 Encapsulant의 유동특성을 파악하였다. 가압식 Underfilling기술은 아직까지 상용화되지 않은 미래기술로써 효율적인 몰드 설계를 위하여 Encapsulant 종류에 따라 Gate 위치, Bump Pattern 및 개수, 칩과 기판 사이의 거리, Side Region에 따른 유동특성등의 파악이 중요하다. 본 연구에서는 $DEXTER^{TM}(US)$의 Encapsulant FP4511 을 사용하여 Cavity 내에 Void 를 없앨 수 있는 주입조건을 찾아내고 Underfilling 시간을 감소시킬 수 있는 모사를 진행하였다.

• Journal of the Microelectronics and Packaging Society
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• v.31 no.2
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• pp.9-15
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• 2024

The effect of the residual impurity on the prepreg surface on the wettability of encapsulant for chip on board package was analyzed with microstructure, compositions and chemical bonds using a scanning electron microscope and X-ray photoelectron spectroscopy. As a result, the contact angle of w/ residual impurity sample was measured to be 28° higher than that of w/o residual impurity sample, and the C-O bond was decreased to be 4% lower than that of w/o residual impurity sample. The surface energy of the prepreg decreased because the impurity ions, Na and F, generated by the manufacturing process and wet etching, reacted chemically with the C on the prepreg surface, forming C-F bonds and breaking the C-O bonds on the prepreg surface. Therefore, the wettability of the encapsulant was degraded because the contact angle between the encapsulant and the prepreg was increased.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.05a
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• pp.917-918
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• 2010

• Current Photovoltaic Research
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• v.8 no.1
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• pp.12-16
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• 2020

This study investigates the degradation characteristics of different material types of ethyl vinyl acetate (EVA) and polyolefin (POE) with combining transparent backsheet. To this end, we fabricated samples with structure of glass/encapsulant/transparent backsheet for each type of encapsulants, and shingled Si modules with the same structure. The samples were then subjected to accelerated test by storing under damp heat condition of 85℃ and 85% RH. As a result, encaplsulant discoloration was observed, which the transmittance of the samples with EVA decreased in a rapid rate than the samples with POE. The discoloration also affected a power degradation of the shingled modules with a reduction of current density, resulting that the module with EVA showed more drop on the efficiency than the modules with POE. Furthermore, corrosion of the soldered ribbon caused by acetic acid produced from the degraded EVA also contributed in fill factor reduction.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.12
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• pp.1289-1295
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• 2004

In this paper, degradation in field-aged PV modules including degradation of interconnect, discoloration of encapsulant and hot spot have been observed and analyzed. From the results, photovoltaic module installed for 6 years shows around 16 % drop of electrical properties due to the interconnect degradation and PV module passed 18 years has been found to drop of around 20 % mainly by the encapsulant discoloration. Furthermore the difference between low and high temperature of PV array at hot spot goes up to 3$0^{\circ}C$ and it leads to interconnect degradation. On the other hands, the temperature difference was observed to be around 15$^{\circ}C$ at the encapsulant discoloration spot of PV array.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07a
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• pp.28-32
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• 2004

In this paper, degradation in field-aged PV modules including degradation of interconnect, discoloration of encapsulant and hot spot have been observed and analyzed. From the results, photovoltaic module installed for 6 years shows around 16% drop of electrical properties due to the interconnect degradation and PV module passed 18 years has been found to drop of around 20% mainly by the encapsulant discoloration. Furthermore the difference between low and high temperature of PV array at hot spot goes up to $30^{\circ}C$ and it leads to interconnect degradation. On the other hands, the temperature difference was observed to be around $15^{\circ}C$ at the encapsulant discoloration spot of PV array.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.25 no.10
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• pp.844-848
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• 2012

Encapsulant curing in terms of convection oven leads to thermal induced stress due to nonuniform thermal conductivity in LED package. We have adopted infrared (IR) light for silicone curing in order to release the stress. The light uniformity irradiated on an encapsulant surface is confirmed to be uniform by optical simulation. Shear strength of die paste using IR compared to convection oven is increased 19.2% at the same curing time, which indicates curing time can be shortened. The indentation depth difference between center and edge of silicone encapsulant in terms of convection oven and IR are 14.8% and 3.4%, respectively. Curing by IR also shows 2.3% better radiant flux persistency rate of LED at $85^{\circ}C$ after 1,000 h reliability test compared to convection curing.

• Journal of the Semiconductor & Display Technology
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• v.9 no.2
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• pp.33-39
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• 2010

The moisture absorption properties such as diffusion coefficient and moisture content ratio of liquid type epoxy resin systems with the filler were investigated. Bisphenol A type and Bisphenol F type epoxy resin, Kayahard MCD as hardener and 2-methylimidazole as catalyst were used in these epoxy resin systems. The nano-sized spherical type fused silica as filler were used in order to study the moisture absorption properties of these liquid type epoxy encapsulant according to the change of filler size. The temperature of glass transition (Tg) of these epoxy resin systems was measured using Dynamic Scanning Calorimeter (DSC), and the moisture absorption properties of these epoxy resin systems according to the change of time were observed at $85^{\circ}C$ and 85% relative humidity condition using a thermo-hygrostat. The diffusion coefficients in these systems were calculated in terms of modified Crank equation based on Ficks' law. An increase of Tg and diffusion coefficient with filler size in these systems can be observed, which are attributed to the increase of free volume with Tg. The change of maximum moisture absorption ratio according to the filler size and filler content cannot be observed; however, the diffusion coefficients of these systems decreased with filler content. The diffusion via free volume is dominant in the epoxy resin systems with low nano-sized filler content; however, the diffusion with the interaction of absorption according the increase of the filler surface area is dominant in the liquid type epoxy encapsulant with high nano-sized filler content.