• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.9
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• pp.1348-1358
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• 1989

We analyzed electrostatic lens with axi-symmetic configurations using the analytic equation for a single apertured lens. The developed computer code afforded to estimate ion optical properties such as ion trajectories, aberrations and ion beam diameters, and was found to have advantages of a shorter calculation time. The calculated ion optical properties for several types of electrostatic lens were in good agreement with Burghard's ones and it was seem that 20% reduction of ion beam diameter could be obtained by the change of aperture diameters.

• Transactions of the Korean Society of Machine Tool Engineers
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• v.16 no.6
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• pp.163-167
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• 2007

A field emission electron gun including 3 electrodes including one cathode and two anodes is very important for high resolution electron microscope. To have functions to control the initially-emitted electron beam, two anodes act as an electrostatic lens according to equipotential lines by adjusting the spot size, intensity, and working distance. To verify the action of the electron beam by the electrostatic lens by changing several parameters such as electrode shape, displacement and applied voltage to the electrodes, the two lenses were design and simulated and then their performances were analyzed with angular beam intensity(distribution), electrical optic axis variation and their stability.

• Journal of the Semiconductor & Display Technology
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• v.8 no.4
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• pp.43-48
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• 2009

The aim of this paper is to describe the development of the electron-beam optic analysis algorithm for simulating the e-beam behavior concerned with electrostatic lenses and their focal properties in the micro-column of the multi-beam lithography system. The electrostatic lens consists of an array of electrodes held at different potentials. The electrostatic lens, the so-called einzel lens, which is composed of three electrodes, is used to focus the electron beam by adjusting the voltages of the electrodes. The optics of an electron beam penetrating a region of an electric field is similar to the situation in light optics. The electron is accelerated or decelerated, and the trajectory depends on the angle of incidence with respect to the equi-potential surfaces of the field. The performance parameters, such as the working distances and the beam diameters are obtained by the computational simulations as a function of the focusing voltages of the einzel lens electrodes. Based on the developed simulation algorithm, the high performance of the micro-column can be achieved through optimized control of the einzel lens.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.24 no.3
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• pp.270-277
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• 2015

In this paper, we describe the production of a specific electrostatic-type scanning electron microscope based on miniaturization for application in other types of vacuum equipment. The initial configuration of the SEM starts with a minimal configuration that allows people to view sample images. After improving the stability of the SEM operation and resolution, we conducted experiments on identifying the characteristics and development of an einzel-type condenser lens with reference to the demagnification lens system of an SEM. The experiments were conducted at an acceleration voltage of 5 kV and we found the shape of the lens to be more reliable than a conventional lens. The lens was then added to improve the resolution in the nanometer region. The current measured on the sample was approximately 40 pA and its magnification was 4,000 times.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.9
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• pp.48-53
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• 1998

We have fabricated electrostatic lens with novel structure by mixing surface- and bulk-micromachining technology. Polysilicon was used for both the structure and sacrificial layer, and the structure layer was passivated with thermal oxide in order not to be attacked during the silicon wet etching. Compared with conventional electrostatic lens used in microcolumn, this device has the advantages in ; 1) hole alignment, throughput, reliability, damage of lens, 2) the possibility of arrayed lithography through the integration of microcolumn.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2013.05a
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• pp.779-780
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• 2013

• Korean Journal of Optics and Photonics
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• v.16 no.5
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• pp.428-432
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• 2005

Microlens precisely fabricated by MEMS process, is a key component of the Microcolumn, Since, miniaturization can reduces aberrations, microcolumn is expected to have better performance than conventional columns. Depending on the fabrication techniques, the sectional view of micro lens has different shape. In the paper, the effect of the sectional shape of extractor lens and limiting aperture on the focusing property of microcolumns have been studied.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2012.05a
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• pp.653-654
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• 2012

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.18 no.7
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• pp.63-70
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• 2019

An electro-aerodynamic lens for improving the performance of virtual impactor has been proposed in this study. ANSYS FLUENT Release 16.1 was used for numerical analysis of virtual impactor with and without the electro-aerodynamic lens, used to collimate the incoming aerosol particles into a particle beam before injecting the particles into the virtual impactor. Particles supplied to the electro-aerodynamic lens were assumed to be highly charged. By using an aerodynamic lens before the virtual impactor, without any electrostatic effect, it was found that the cut-off diameter of the virtual impactor was reduced from $4.2{\mu}m$ to $0.68{\mu}m$ and that the fine particle contamination problem became more serious. However, by employing the combined electrostatic and aerodynamic effects, that is, by applying electric voltage potential to the electro-aerodynamic lens, the cut-off diameter was found to be further reduced to $0.45{\mu}m$ and the fine particle contamination was eliminated.

• Journal of the Korean Society for Precision Engineering
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• v.26 no.4
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• pp.128-133
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• 2009

Focused-ion-beam (FIB) system is capable of both machining and measuring in nano-scale; hence nano-scale focusing quality is important. This paper investigates design parameters of two electrostatic lenses in order to achieve the best ion beam focusing performance. Commercial SIMION simulator is used to optimize the dimensions of the condenser and objective lenses and investigate the influence of assembly error on focusing quality The simulation results show that the beam focusing quality is not influenced by angle deviation within ${\pm}0.02\;deg$ and geometrical eccentricity within ${\pm}50$ micrometers.