• Journal of information and communication convergence engineering
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• v.6 no.1
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• pp.43-46
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• 2008

This paper proposes an advanced test circuit for detecting the connectivity between a drum ring of laser printer and PCB. The detection circuit of charge sharing is proposed, which minimizes the influences of internal parasitic capacitances. The test circuit is composed of precharge circuit, analog comparator, level shifter. Its functional operation is verified using $0.6{\mu}m$ 3.3V/40V CMOS process parameter by HSPICE. Access time is100ns. Layout of the drum contact test circuit is $465{\mu}m\;{\times}\;117{\mu}m$.

• The Transactions of the Korean Institute of Power Electronics
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• v.27 no.2
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• pp.100-105
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• 2022

This paper applies the arc detection algorithm to prevent the false detection in photo voltaic series arc detection circuit, which is required not only to detect the series arc quickly, but also not falsely detect the arc for the non-arc noise. For this purpose, this study proposes a rapid and preventive false detection method of single peak noise and short noise signals. First, to prevent false detection by single peak noise, Discrete wavelet transform (DWT)-based characteristic parameters are applied to determine the shape and the amplitude of the noise. In addition, arc fault detection within a few milliseconds is performed with the DWT iterative algorithm to quickly prevent false detection for short noise signals, considering the continuity of serial arc noise. Thus, the method operates not only to detect series arc, but also to avoid false arc detection for peak and short noises. The proposed algorithm is applied to real-time serial arc detection circuit based on the TMS320F28335 DSP. The serial arc detection and peak noise filtering performances are verified in the built simulated arc test facility. Furthermore, the filtering performance of short noise generated through DC switch operation is confirmed.

• ETRI Journal
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• v.27 no.5
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• pp.539-544
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• 2005

An analog CMOS vision chip for edge detection with power consumption below 20mW was designed by adopting electronic switches. An electronic switch separates the edge detection circuit into two parts; one is a logarithmic compression photocircuit, the other is a signal processing circuit for edge detection. The electronic switch controls the connection between the two circuits. When the electronic switch is OFF, it can intercept the current flow through the signal processing circuit and restrict the magnitude of the current flow below several hundred nA. The estimated power consumption of the chip, with $128{\times}128$ pixels, was below 20mW. The vision chip was designed using $0.25{\mu}m$ 1-poly 5-metal standard full custom CMOS process technology.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.24 no.1
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• pp.160-166
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• 2010

Railroad level crossing systems are used to prevent train from collisions by informing pedestrians and vehicles of approaching trains on the level crossing. The current detection systems mostly use track-based electrical circuits to detect approaching trains. The making and breaking of the circuit when the train wheel passes along the track sends a signal to barriers that restrict access to the track. Unfortunately, this track-based signal system is vulnerable to malfunctions in certain situations. If the rail becomes rusted due to moisture, weather conditions, or infrequent use, the electrical circuit detection system could fail. Such a failure could lead to a train-vehicle or train-pedestrian collision. This paper suggests a replacement of the electrical circuit-based system with an infrared detection system. The research shows that an infrared detection system improves safety by reducing the frequency of detection failure of the alarming circuit to system.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.6
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• pp.706-711
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• 2014

A low power 6-bit flash ADC that uses an input voltage range detection algorithm is described. An input voltage level detector circuit has been designed to overcome the disadvantages of the flash ADC which consume most of the dynamic power dissipation due to comparators array. In this work, four digital input voltage range detectors are employed and each input voltage range detector generates the specific clock signal only if the input voltage falls between two adjacent reference voltages applied to the detector. The specific clock signal generated by the detector is applied to turn the corresponding latched comparators on and the rest of the comparators off. This ADC consumes 68.82 mW with a single power supply of 1.2V and achieves 4.3 effective number of bits for input frequency up to 1 MHz at 500 MS/s. Therefore it results in 4.6 pJ/step of Figure of Merit (FoM). The chip is fabricated in 0.13-um CMOS process.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.6
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• pp.789-796
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• 2014

A CMOS photo detection bias quenching circuit is developed to be used with single photon avalanche photodiodes (SPADs) operating in Geiger mode for the detection of weak optical signals. The proposed bias quenching circuits for the performance improvement reduce the circuit size as well as improve the performance of the quenching operation. They are fabricated in a $0.18-{\mu}m$ standard CMOS technology to verify the effectiveness of this technique with the chip area of only $300{\mu}m^2$, which is about 60 % of the previous reported circuit. Two types of proposed circuits with resistive and capacitive load demonstrated improved performance of reduced quenching time. With a commercial APD by HAMAMATSU, the dead time can be adjusted as small as 50 ns.

• ETRI Journal
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• v.31 no.2
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• pp.209-214
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• 2009

In this paper, we propose a novel test methodology for the detection of catastrophic and parametric faults present in analog very large scale integration circuits. An automatic test pattern generation algorithm is proposed to generate piece-wise linear (PWL) stimulus using wavelets and a genetic algorithm. The PWL stimulus generated by the test algorithm is used as a test stimulus to the circuit under test. Faults are injected to the circuit under test and the wavelet coefficients obtained from the output response of the circuit. These coefficients are used to train the neural network for fault detection. The proposed method is validated with two IEEE benchmark circuits, namely, an operational amplifier and a state variable filter. This method gives 100% fault coverage for both catastrophic and parametric faults in these circuits.

• Journal of Multimedia Information System
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• v.7 no.3
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• pp.205-214
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• 2020

Crime has become one of the major problems in modern society. Even though visual surveillances through closed-circuit television (CCTV) is extensively used for solving crime, the number of crimes has not decreased. This is because there is insufficient workforce for performing 24-hour surveillance. In addition, CCTV surveillance by humans is not efficient for detecting dangerous situations owing to accuracy issues. In this paper, we propose the autonomous detection of dangerous situations in CCTV scenes using a deep learning model with relational inference. The main feature of the proposed method is that it can simultaneously perform object detection and relational inference to determine the danger of the situations captured by CCTV. This enables us to efficiently classify dangerous situations by inferring the relationship between detected objects (i.e., distance and position). Experimental results demonstrate that the proposed method outperforms existing methods in terms of the accuracy of image classification and the false alarm rate even when object detection accuracy is low.

• Journal of the Institute of Electronics and Information Engineers
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• v.53 no.11
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• pp.107-113
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• 2016

All circuits in power input can only use the power provided by an external power supply. General electronic circuits use a secondary supply generated by a converter using a primary power in the power input. But protection and detection circuit for over-voltage circuit or under-voltage in power input have to use that input power because there is no other supply in power input. Therefore, previous electronics for satellite can protect only over-voltage using a zener diode, and can't detect over-voltage and under-voltage events, and provide a detection capability for over-voltage and under-voltage only for secondary supply. The proposed circuit can detect over-voltage and under-voltage using a single supply for the primary power input, +28V, with the threshold characteristics for MOS-FET, and the accuracy for a detection circuit is increased by 2.5%.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2015.10a
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• pp.842-846
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• 2015

In this study, we propose an algorithm of the method of recovering quickly find the location of the error encountered during separate operations in the functional structure of complex digital circuits by mimicking the self-healing function of the cell. By the digital circuit was divided by 9 function block unit of function, proposes a method that It can quickly detect and recover the error position. It was the detection and recovery algorithms for the error location in the digital circuit of a complicated structure and could extended the number of function block for the $3{\times}3$ matrix structure on the digital circuit.