• Ocean and Polar Research
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• v.36 no.1
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• pp.77-85
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• 2014

The quality control of ocean observations data is becoming a major issue as real-time observational data and information services have increased recently. Therefore, it is necessary for oceanographic instruments to calibrate. In this paper, we first introduce the CTD calibration system and traceability. Next, CTD calibration procedures and estimation of uncertainty of measurement are described. The expanded uncertainty (k = 2) of the temperature, pressure and conductivity are 0.$0.003^{\circ}C$, $6.0{\times}10^{-5}$ and 0.006 mS/cm respectively. Finally, the excellence of CTD calibration and its measurement capability has been proven by comparing the inter-calibration result of KIOST and Sea-Bird Electronics (SBE). CTD calibration residuals are less than ${\pm}0.0001^{\circ}C$, ${\pm}0.001$ MPa, ${\pm}0.0001$ S/m for SBE 3plus temperature sensor, SBE 19plus pressure sensor and SBE 4C conductivity sensor respectively.

• Proceedings of the Korean Society of Agricultural Engineers Conference
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• 2001.10a
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• pp.93-98
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• 2001

This study was performed to analyse the rainfall and the rainfall-runoff characteristics of a rural watershed. The Sangwha basin($105.9km^{2}$) in the Geum river system was selected for this study. The arithmetic mean method, the Thiessen's weighing method, and the isohyetal method were used to analyse areal rainfall distribution and the Huff's quartile method was used to analyse temporal rainfall distribution. In addition, daily runoff analyses were peformed using the DAWAST and tank model. In the model calibration, the data from June through November, 1999 were used. In the model calibration, the observed runoff depth was 513.7mm and runoff rate was 45.2%, and the DAWAST model simulated runoff depth was 608.6mm and runoff rate was 53.5%, and the tank model runoff depth was 596.5mm and runoff rate was 52.5%, respectively. In the model test, the data from June through November, 2000 were used. In the model test, the observed runoff depth was 1032.3mm and runoff rate was 72.5%, and the DAWAST model simulated runoff depth was 871.6mm and runoff rate was 61.3%, and the tank model runoff depth was 825.4mm and runoff rate was 58%, respectively. The DAWAST and tank model's $R^{2}$ and RMSE were 0.85, 3.61mm, and 0.85, 2.77mm in 1999, and 0.83, 5.73mm, and 0.87, 5.39mm in 2000, respectively. Both models predicted low flow runoff better than flood runoff.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.410-413
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• 2005

There are technical requirements to manufacture large size functional parts with not only simple geometries like a flat or spherical surface but also sculptured geometries. In addition, the required machining accuracy for these parts is becoming more severe day-by-day. In general, the forms of machined parts are determined by relative position between the workpiece and the tool during cutting. To improve machining accuracy, the relative position error should be maintained within the required accuracy. This study deals with estimation and calibration of depth of cut using AE signal in micro-machining.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.274-274
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• 2012

In-depth analysis by secondary ion mass spectrometry (SIMS) is very important for the development of electronic devices using multilayered structures, because the quantity and depth distribution of some elements are critical for the electronic properties. Correct determination of the interface locations is critical for the calibration of the depth scale in SIMS depth profiling analysis of multilayer films. However, the interface locations are distorted from real ones by the several effects due to sputtering with energetic ions. In this study, the determination of interface locations in SIMS depth profiling of multilayer films was investigated by Si/Ge and Ti/Si multilayer systems. The original SIMS depth profiles were converted into compositional depth profiles by the relative sensitivity factors (RSF) derived from the atomic compositions of Si-Ge and Si-Ti alloy reference films determined by Rutherford backscattering spectroscopy. The thicknesses of the Si/Ge and Ti/Si multilayer films measured by SIMS depth profiling with various impact energy ion beam were compared with those measured by TEM. There are two methods to determine the interface locations. The one is the feasibility of 50 atomic % definition in SIMS composition depth profiling. And another one is using a distribution of SiGe and SiTi dimer ions. This study showed that the layer thicknesses measured with low energy oxygen and Cs ion beam and, by extension, with method of 50 atomic % definition were well correlated with the real thicknesses determined by TEM.

• Journal of Institute of Control, Robotics and Systems
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• v.21 no.7
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• pp.602-608
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• 2015

This paper proposes an algorithm for precise detection of corner points on a coplanar checkerboard in order to perform stereo camera calibration using a single frame. Considering the conditions of automobile production lines where a stereo camera is attached to the windshield of a vehicle, this research focuses on a coplanar calibration methodology. To obtain the accurate values of the stereo camera parameters using the calibration methodology, precise localization of a large number of feature points on a calibration target image should be ensured. To realize this demand, the idea with respect to a checkerboard pattern design and the use of a Homography matrix are provided. The calibration result obtained by the proposed method is also verified by comparing the depth information from stereo matching and a laser scanner.

• Journal of Radiation Protection and Research
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• v.12 no.1
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• pp.1-11
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• 1987

Central axis percentage depth-doses, P(%), were measured at the points from the 2.5cm depth of reference point to 20 cm depth with 2.5 cm interval. Distance from the X-ray target to the water phantom($30{\times}30{\times}30cm^3$) surface was 1 m, and at this point three different beam sizes of $5cm{\phi},\;10cm{\phi},\;and\;15cm{\phi}$ were used. While the X-ray tube voltage varied from 150 to 250 kV, the tube current remained constant at 5 mA. Absorbed dose rate in water, $\dot{D}_w$, was determined using the air kerma calibration factor, $N_k$, which was derived from the exposure calibration factor, $N_x$, of the NE 2571 ion chamber. The reference exposure rate, $\dot{X}_c$, was measured using the Exradin A-2 ion chamber calibrated at ETL, Japan. The half value layers of the X-rays determined to meet ETL calibration qualities. The absorbed dose rates determined at the calibration point were compared to the values obtained from Burlin's general cavity theory, and the percentage depth-dose values determined from $N_k$ showed a good agreement with the values of the published depth dose data(BJR Suppl. 17).

• Proceedings of the Optical Society of Korea Conference
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• 2009.02a
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• pp.415-416
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• 2009

• Journal of the Korean Society for Nondestructive Testing
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• v.27 no.5
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• pp.393-397
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• 2007

Eddy current standard including an artificial slot for the calibration of absolute type surface probe was fabricated. Developed eddy current standard has the electric conductivity and dimensions, and contains artificial slot as established in ASTM E 1629. The width and depth of artificial slot are 0.1 mm and 0.5 mm respectively. This slot was only possible to measure the depth on the two side edges, and impossible for the middle part with general measurement tools. The ultrasonic test method was applied for measuring depth of the middle part of the artificial slot in the standard. Using this method the dimension could be measured successfully with uncertainty about $15\;{\mu}m$. Calibration of eddy current standard for the absolute probe can be performed by this technique.

• Korean Journal of Materials Research
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• v.13 no.10
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• pp.651-657
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• 2003

Ultrasonic microscope has been used to detect the defects on surface or inner solid. Conventionally, it has used at a single operating frequency. The resolution and quality of the measured images are determined by a characteristic of the transducer of the ultrasonic microscope. The conventional ultrasonic microscope has been used envelope detector to detect the amplitude of reflected signal, but the changes in amplitude is not sensitive enough for specimen with microstructure that in phase. In this paper, we have studied multi-frequency depth resolution enhancement with ultrasonic reflection microscope for the reflectors of a stainless steel reference specimen and a reference calibration block to be used as the material in nuclear power plants for ISI, PSI. Increased depth resolution can be obtained by taking two, three-dimensional images at more that one frequency and numerically combining the results. As results of the experiment, we could get enhanced images with the rate of contrast in proportion and high quality signal distribution for the image to the changing rate of depth for the reflectors of the two kinds of specimens.

• Proceedings of the Korea Institute of Convergence Signal Processing
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• 2001.06a
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• pp.173-176
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• 2001

In this thesis, a new measurement system is implemented for depth data extraction based on the camera calibration of the known pattern. The relation between 3D world coordinate and 2D image coordinate is analyzed. A new camera calibration algorithm is established from the analysis and then, the internal variables and external variables of the CCD camera are obtained. Suppose that the measurement plane is horizontal plane, from the 2D plane equation and coordinate transformation equation the approximation values corresponding minimum values using Newton-Rabbson method is obtained and they are stored into the look-up table for real time processing . A slit laser light is projected onto the object, and a 2D image obtained on the x-z plane in the measurement system. A 3D shape image can be obtained as the 2D (x-z)images are continuously acquired, during the object is moving to the y direction. The 3D shape images are displayed on computer monitor by use of OpenGL software. In a measuremental result, we found that the resolution of pixels have $\pm$ 1% of error in depth data. It seems that the error components are due to the vibration of mechanic and optical system. We expect that the measurement system need some of mechanic stability and precision optical system in order to improve the system.