Analysis of Current-Voltage Characteristics Caused by Electron Injection in Metal-Oxide-Semiconductor Devices (전자주입에 의해 야기되는 MOS 소자의 전류-전압 특성 분석)
-
- Journal of the Institute of Electronics Engineers of Korea SD
- /
- v.37 no.11
- /
- pp.25-35
- /
- 2000