• Title/Summary/Keyword: defect rate

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A Study on the Monitoring of Reject Rate in High Yield Process

  • Nam, Ho-Soo
    • Journal of the Korean Data and Information Science Society
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    • v.18 no.3
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    • pp.773-782
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    • 2007
  • The statistical process control charts are very extensively used for monitoring of process mean, deviation, defect rate or reject rate. In this paper we consider a control chart to monitor the process reject rate in the high yield process, which is based on the observed cumulative probability of the number of items inspected until r defective items are observed. We first propose selection of the optimal value of r in the CPC-r charts, and also consider the usefulness of the chart in high yield process such as semiconductor or TFT-LCD manufacturing process.

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Properties of PD and Classification of Defect Patterns in Solid Insulation (고체절연체의 내부결함에 따른 부분방전 특성과 패턴분류)

  • Kang, S.H.;Park, Y.G.;Lee, K.W.;KiM, W.S.;Lee, Y.H.;Lim, K.J.
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1624-1626
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    • 1999
  • PD in defect of solid insulation system is very harmful since It often leads to deterioration of insulation by the combined action of the discharge ions bombarding the surface and the action of chemical compounds that are formed by the discharge. PD can indicate incipient failure, so it has been used to determine degradation of insulation. In this paper. we investigated PD in defects of solid insulation by using statical method and classified PD patterns with surface discharge, electrical tree and void discharge by using Kohonen network. we used peak charge, average discharge power, average discharge current, repetition rate, skewness, kurtosis, QN of the max pulse height vs. repetition rate $H_q(n)$ for analysis and classification.

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The effect of hydrogen flow rate on defects and thickness uniformity in graphene (수소량에 따른 그라핀의 두께와 결함 변화)

  • An, Hyo-Sub;Kim, Eun-Ho;Jang, Hyun-Chul;Cho, Won-Ju;Lee, Wan-Kyu;Jung, Jong-Wan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.262-262
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    • 2010
  • To investigate the effect of the amount of hydrogen on CVD grown-graphene, the flow rate of hydrogen was changed, while other process parameters were kept constant during CVD synthesis. Substrate which consists of 300nm-nickel/$SiO_2$/Si substrate, and methane gas mixed with hydrogen and argon were used for CVD growth. Graphene was synthesized at $950^{\circ}C$. The thickness and the defect of graphene were analyzed using raman spectroscopy. The synthesized graphene shows non-uniform and more defective below a certain amount of hydrogen.

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Variation Stack-Up Analysis Using Monte Carlo Simulation for Manufacturing Process Control and Specification

  • Lee, Byoungki
    • Journal of Korean Society for Quality Management
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    • v.22 no.4
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    • pp.79-101
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    • 1994
  • In modern manufacturing, a product consists of many components created by different processes. Variations in the individual component dimensions and in the processes may result in unacceptable final assemblies. Thus, engineers have increased pressure to properly set tolerance specifications for individual components and to control manufacturing processes. When a proper variation stack-up analysis is not performed for all of the components in a functional system, all component parts can be within specifications, but the final assembly may not be functional. Thus, in order to improve the performance of the final assembly, a proper variation stack-up analysis is essential for specifying dimensional tolerances and process control. This research provides a detailed case example of the use of variation stack-up analysis using a Monte Carlo simulation method to improve the defect rate of a complex process, which is the commutator brush track undercut process of an armature assembly of a small motor. Variations in individual component dimensions and process mean shifts cause high defect rate, Since some dimensional characteristics have non-normal distributions and the stack-up function is non-linear, the Monte Carlo simulation method is used.

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A Study on the Effect of the Vibration and Particle Generation of a Spin Coater on Thin Film Coating (회전박막제조기의 진동 및 입자발생이 박막제조에 미치는 영향에 관한 연구)

  • 허진욱;권태종;정진태;한창수;안강호
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.11 no.4
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    • pp.31-36
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    • 2001
  • A spin coater is a machine to coat wafer or LCD display with thin film. Vibration in the spin coater may be one of main troubles in the coating process. In this paper, we focus on the difference between two spin coaters. Vibration sources are identified by experimental approach and are compared to find the difference between the two spin coaters. Also, the particle concentration is observed by laser particle counter (LPC) for the two spin coaters, when the spin coaxers are working. It is also considered whether the defect rate is proportional to the particle concentration. The result shows that particle generation in the coating process is related to excessive vibration of the spin coater shaft and the particles influence the defect rate of the thin film product.

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The Development of Surface Inspection System Using the Real-time Image Processing (실시간 영상처리를 이용한 표면흠검사기 개발)

  • 이종학;박창현;정진양
    • 제어로봇시스템학회:학술대회논문집
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    • 2000.10a
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    • pp.171-171
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    • 2000
  • We have developed m innovative surface inspection system for automated quality control for steel products in POSCO. We had ever installed the various kinds of surface inspection systems, such as a linear CCD and a laser typed surface inspection systems at cold rolled strips production lines. But, these systems cannot fulfill the sufficient detection and classification rate, and real time processing performance. In order to increase detection and classification rate, we have used the Dark, Bright and Transition Field illumination and area type CCD camera, and fur the real time image processing, parallel computing has been used. In this paper, we introduced the automatic surface inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms and its performance obtained at the production line.

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A Simplified Mathmethical Calculation for Radwaste Effluent with Fuel Defect Rate

  • Y. Koh;J. H. Mun;Kim, H. S.;Kim, H. G.;H. C. Baek
    • Proceedings of the Korean Nuclear Society Conference
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    • 1997.05b
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    • pp.433-438
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    • 1997
  • It Is necessary to calculate radwaste effluent due to change in the fuel defect rate to see the overall change in radwaste effluent md, at present, for this type of calculation DAMSAM code is being used. However, often, one can not access easily to this code with many reason and so we have chosen this case, in this paper, to show a very simplified but quite accurated calculation method without the solving equations. The physical meanning of the parameters in the equations used in DAMSAM have been reviewed to simplify the equations and the result calculated with this method have been compared with that of DAMSAM.

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Expansion of Thin-Film Transistors' Threshold Voltage Shift Model using Fractional Calculus (분수계 수학을 사용한 박막트랜지스터의 문턱전압 이동 모델 확장)

  • Taeho Jung
    • Journal of the Semiconductor & Display Technology
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    • v.23 no.2
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    • pp.60-64
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    • 2024
  • The threshold voltage shift in thin-film transistors (TFTs) is modeled using stretched-exponential (SE) and stretched-hyperbola (SH) functions. These models are derived by introducing empirical parameters into reaction rate equations that describe defect generation or charge trapping caused by hydrogen diffusion in the dielectric or interface. Separately, the dielectric relaxation phenomena are also described by the same reaction rate equations based on defect diffusion. Dielectric relaxation was initially modeled using the SE model, and various models have been proposed using fractional calculus. In this study, the characteristics of the threshold voltage shift and the dielectric relaxation phenomena are compared and analyzed to explore the applicability of analytical models used in the field of dielectric relaxation, in addition to the conventional SE and SH models.

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Rail Surface Defect Detection System of Next-Generation High Speed Train (차세대 고속열차의 레일표면 결함 검출 시스템)

  • Choi, Woo-Yong;Kim, Jeong-Yeon;Yang, Il-Dong
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.66 no.5
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    • pp.870-876
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    • 2017
  • In this paper, we proposed the automatic vision inspection system using multi-layer perceptron to detect the defects occurred on rail surface. The proposed system consists of image acquisition part and analysis part. Rail surface image is acquired as equal interval using line scan camera and lighting. Mean filter and dynamic threshold is used to reduce noise and segment defect area. Various features to characterize the defects are extracted. And they are used to train and distinguish defects by MLP-classifier. The system is installed on HEMU-430X and applied to analyze the rail surface images acquired from Honam-line at high speed up to 300 km/h. Recognition rate is calculated through comparison with manual inspection results.

The Scalable Template-Based Inspection of PCB Film (PCB 필름의 스케일러블 템플릿 기반 검사)

  • 진성아;주문원
    • Proceedings of the Korea Multimedia Society Conference
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    • 2001.11a
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    • pp.210-214
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    • 2001
  • PCB관련 제품의 최종 제작단계에서 defect 검사 과정은 제품의 질을 유지하기 위해 필수적인 단계이다. PCB 자동화 검사 시스템은 사람에 의해 이루어지는 품질검사에서 발견되는 비용을 절감하고, 신뢰성있는 제작 프로세스를 유지하기 위해 적극적으로 개발되고 있다. 이 논문에서는 PCB 필름의 defect를 검사하기 위하여 적응적 템플렛 기반 검사 방법을 제시하고자 한다. 고정된 템플릿은 구현하기 편리하고 속도면에서 이점을 발휘할 수 있으나, 강력한 센서의 선택에 제약이 있을 환경 하에서 100%에 근접하는 오류검출률 defect detection rate이 요구되는 고정된 템플릿을 제작하는 것에 문제가 있을 수 있다. 여기서는 템플릿 모델에 유연성을 부여하기 위하여 템플릿의 이미지를 목표 이미지들의 상태에 따라 템플릿을 적응적으로 구축하여 검사과정에 동적으로 적용하는 기법을 개발하고자 한다.

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