• KSII Transactions on Internet and Information Systems (TIIS)
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• v.13 no.12
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• pp.6043-6062
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• 2019

Low-rank matrix decomposition has shown its capability in many applications such as image in-painting, de-noising, background reconstruction and defect detection etc. In this paper, we consider the texture background of rail track images and the sparse foreground of the defects to construct a low-rank matrix decomposition model with block sparsity for defect inspection of rail tracks, which jointly minimizes the nuclear norm and the 2-1 norm. Similar to ADM, an alternative method is proposed in this study to solve the optimization problem. After image decomposition, the defect areas in the resulting low-rank image will form dark stripes that horizontally cross the entire image, indicating the preciselocations of the defects. Finally, a two-stage defect extraction method is proposed to locate the defect areas. The experimental results of the two datasets show that our algorithm achieved better performance compared with other methods.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.20 no.5
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• pp.666-672
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• 2011

In this paper, we describes the development of automatic inspection system for detecting the defects on photovoltaic wafer by using machine vision. Until now, The defect inspection process was manually performed by operators. So these processes caused the produce of poorly-made articles and inaccuracy results. To improve the inspection accuracy, the inspection system is not only configured, but the image processing algorithm is also developed. The inspection system includes dimensional verification and pattern matching which compares a 2-D image of an object to a pattern image the method proves to be computationally efficient and accurate for real time application and we confirmed the applicability of the proposed method though the experience in a complex environment.

• Journal of Korea Society of Digital Industry and Information Management
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• v.15 no.4
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• pp.63-70
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• 2019

The subject of the simultaneous measuring system of base pattern and deposition pattern is a new research topic on a defect inspection of OLED. In this paper, we propose a new OLED inspection method that simultaneously measures standard and deposition pattern images. This method reduces unnecessary processes and tac time during OLED inspection. For an additional reduction of the tac time during pattern measurement, the ROI was configured to measure only in the designated ROI area instead of measuring the entire area of an image. During the ROI set-up, the value of effective deposition pattern area is included so that if the deposition pattern is out of the ROI zone, it would be treated as a defect before measuring the size and center point of the pattern. As a result, the tac time and inspection process could be shortened. The proposed method also could be applied to the OLED manufacturing process. Production of OLED could be increased by reducing tac time and inspection process.

• Journal of KIISE:Databases
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• v.34 no.2
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• pp.99-108
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• 2007

In this paper, we design and implement the Film Defect Inspection System (FDIS) that detects film defects and determines their types which can be used for producing polarized films of TFT-LCD. The proposed system is designed to detect film defects from polarized film images using image segmentation techniques and to determine defect types through the image analysis of detected defects. To determine defect types, we extract features such as shape and texture of defects, and compare those features with corresponding features of referential images stored in a template database. Experimental results using FDIS show that the proposed system detects all defects of test images effectively (Precision 1.0, Recall 1.0) and efficiently (within 0.64 second in average), and achieves the considerably high correctness in determining defect types (Precision 0.96 and Recall 0.95 in average). In addition, our system shows the high robustness for rotated transformation of images, achieving Precision 0.95 and Recall 0.89 in average.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.5
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• pp.432-437
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• 2008

This paper proposes a defect cell extraction algorithm for TFT-LCD auto-repair system. Auto defect search algorithm and automatic defect cell extraction method are very important for TFT-LCD auto repair system. In the previous literature[1], we proposed an automatic visual inspection algorithm of TFT-LCD. Based on the inspected information(defect size and defect axis, if defect exists) by the automatic search algorithm, defect cells should be extracted from the input image for the auto repair system. For automatic extraction of defect cells, we used a novel block matching algorithm and a simple filtering process in order to find a given reference point in the LCD cell. The proposed defect cell extraction algorithm can be used in all kinds of TFT-LCD devices by changing a stored template which includes a given reference point. Various experimental results show the effectiveness of the proposed method.

• Journal of Korea Society of Industrial Information Systems
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• v.12 no.3
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• pp.116-123
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• 2007

Despite the number of backlight manufacturer is increased as the market of flat panel display equipments and related development devices is enlarged, the inspection based on the human eye is still used in many backlight production lines. The defects such as particle, spot and scratch on the light emitting surface of the backlight prevent the LCD device from displaying the colors correctly. From that manual inspection it is difficult to maintain the quality of backlight consistently because the accuracy and the speed of the inspection may change with the physical condition of the operater. In this paper we studied on the development of automatic backlight surface defect inspection system. For this, we made up of the computer vision system and we developed the main program with various user interfaces to operate the inspection system effectively. And we developed the image processing module to extract the defect information. Furthermore, we presented the labeling process to reconstruct defect regions using the labeling table and the defect index. From the experimental results, we found that our system can detect all defect regions identified from human eye and it is sufficient to substitute for the conventional surface inspection.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.101.6-101
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• 2001

This paper deals with inspect algorithm using visual system. One of the major problems that arise during polymer production is the estimation of the noise of the product(bad pallets). An erroneous output can cause a lot of losses (production and financial losses). Therefore new methods for real-time inspection of the noise are demanded. For this reason, we have presented a development of vision system algorithm for the defect inspection of PE pallets. First of all, in order to detect the edge of object, the differential filter is used. And we apply to the labeling algorithm for feature extraction. This algorithm is designed for the defect inspection of pallets ...

• Smart Structures and Systems
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• v.25 no.2
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• pp.255-264
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• 2020

This paper deals with a defect classification technique that considers the structural characteristics of a refrigerant compressor. First, the pressure pulsation of the refrigerant flowing in the suction pipe of a normal compressor was measured at the same time as the acceleration of the shell surface, and then the transfer function between the two signals was estimated. Next, the frequency-weighted acceleration signals of the defect classification target compressors were generated using the estimated transfer function. The estimation of the variance of the transfer function is presented to formulate the frequency-weighted acceleration signals. The estimated frequency-weighted accelerations were applied to defect classification using frequency-domain features. Experiments were performed using commercial compressors to verify the technique. The results confirmed that it is possible to perform an effective defect classification of the refrigerant compressor by the shell surface acceleration of the compressor. The proposed method could make it possible to improve the total inspection performance for compressors in a mass-production line.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.12
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• pp.1094-1098
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• 2013

AVI (Automatic Vision Inspection) systems automatically detect defect features and measure their sizes via camera vision. Defect detection is not an easy process because of noises from various sources and optical distortion. In this paper the acquired images from a TFT panel are enhanced with the adoption of an HVS (Human Visual System). A human visual system is more sensitive on the defect area than the illumination components because it has greater sensitivity to variations of intensity. In this paper we modified an MTF (Modulation Transfer Function) in the Wavelet domain and utilized the characteristics of an HVS. The proposed algorithm flattens the inner illumination components while preserving the defect information intact.

• 제어로봇시스템학회:학술대회논문집
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• 2000.10a
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• pp.171-171
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• 2000

We have developed m innovative surface inspection system for automated quality control for steel products in POSCO. We had ever installed the various kinds of surface inspection systems, such as a linear CCD and a laser typed surface inspection systems at cold rolled strips production lines. But, these systems cannot fulfill the sufficient detection and classification rate, and real time processing performance. In order to increase detection and classification rate, we have used the Dark, Bright and Transition Field illumination and area type CCD camera, and fur the real time image processing, parallel computing has been used. In this paper, we introduced the automatic surface inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms and its performance obtained at the production line.