• Title/Summary/Keyword: dark silicon

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The study of ${\mu}c-Si/CaF_2$/glass properties for thin film transistor application (박막트랜지스터 응용을 위한 ${\mu}c-Si/CaF_2$/glass 구조특성연구)

  • Kim, Do-Young;Ahn, Byeung-Jae;Lim, Dong-Gun;Yi, Jun-Sin
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1514-1516
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    • 1999
  • This paper covers our efforts to improve the low carrier mobility and light instability of hydrogenated amorphous silicon (a-Si:H) films with microcrystalline silicon $({\mu}c-Si)$ films. We successfully prepared ${\mu}c-Si$ films on $CaF_2$/glass substrate by decomposition of $SiH_4$ in RPCVD system. The $CaF_2$ films on glass served as a seed layer for ${\mu}c-Si$ film growth. The XRD analysis on $CaF_2$/glass illustrated a (111) preferred $CaF_2$ grains with the lattice mismatch less than 5 % of Si. We achieved ${\mu}c-Si$ films with a crystalline volume fraction of 61 %, (111) and (220) crystal orientations. grain size of $706\AA$, activation energy of 0.49 eV, and Photo/dark conductivity ratio of 124. By using a $CaF_2$/glass structure. we were able to achieve an improved ${\mu}c-Si$ films at a low substrate temperature of $300^{\circ}C$.

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Effect of Annealing on a-Si:H Thin Films Fabricated by RF Magnetron Sputtering (RF 스퍼터를 이용하여 제작된 a-Si:H 박막의 어닐링 효과에 관한 연구)

  • Kim, Do-Yun;Kim, In-Soo;Choi, Se-Young
    • Korean Journal of Materials Research
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    • v.19 no.2
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    • pp.102-107
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    • 2009
  • The effect of annealing under argon atmosphere on hydrogenated amorphous silicon (a-Si:H) thin films deposited at room temperature and $300^{\circ}C$ using Radio Frequency (RF) magnetron sputtering has been investigated. For the films deposited at room temperature, there was not any increase in hydrogen content and optical band gap of the films, and as a result, quality of the films was not improved under any annealing conditions. For the films deposited at $300^{\circ}C$, on the other hand, significant increases in hydrogen content and optical band gap were observed, whereas values of microstructure parameter and dark conductivity were decreased upon annealing below $300^{\circ}C$. In this study, it was proposed that the Si-HX bonding strength is closely related to deposition temperature. Also, the improvement in optical, electrical and structural properties of the films deposited at $300^{\circ}C$ was originated from thermally activated hydrogen bubbles, which were initially trapped at microvoids in the films.

Utilization of Photoconductive Gain Mechanism in Amorphous Silicon Radiation Detectors (비정질 실리콘 방사선 계측기에서의 Photoconductive Gain의 응용)

  • Lee, H.K.;Suh, T.S.;Choe, B.Y.;Shinn, K.S.;Cho, G.;Perez-Mendez, V.
    • Proceedings of the KOSOMBE Conference
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    • v.1997 no.05
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    • pp.457-460
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    • 1997
  • The photoconductive gain mechanism in various types of hydrogenated amorphous silicon devices, such as p-i-n, n-i-n and n-i-p-i-n structures was investigated in connection with applications to radiation detection. We measured the photoconductive gain in two time scales: one for short pulses of visible light $(<1{\mu}sec)$ which simulate the transit of energetic charged particles, and the other for rather long pulses of light $(\sim1msec)$ which simulate x-ray exposure in medical imaging. We used two definitions of photoconductive gain: current gain and charge gain which is an integration of the current gain. We found typical charge gains of $3\sim9$ for short pulses and a few hundred for long pulses at a dark current density level of $10mA/cm^2$.

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Hydrogen-Dependent Catalytic Growth of Amorphous-Phase Silicon Thin-Films by Hot-Wire Chemical Vapor Deposition (HWCVD를 이용한 Amorphous Si 박막 증착공정에서 수소량에 따른 박막성장 특성)

  • Park, Seungil;Ji, Hyung Yong;Kim, MyeongJun;Kim, Keunjoo
    • Current Photovoltaic Research
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    • v.1 no.1
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    • pp.27-32
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    • 2013
  • We investigated the growth mechanism of amorphous-phase Si thin films in order to improve the film characteristics and circumvent photo-degradation effects by implementation of hot-wire chemical vapor deposition. Amorphous silicon thin films grown in a silane/hydrogen mixture can be decomposed by a resistive heat filament. The structural properties were observed by Raman spectroscopy, FTIR, SEM, and TEM. The electrical properties of the films were measured by photo-conductivity, dark-conductivity, and photo-sensitivity. The contents of Si-H and $Si-H_n$ bonds were measured to be 19.79 and 9.96% respectively, at a hydrogen flow rate of 5.5 sccm, respectively. The thin film has photo-sensitivity of $2.2{\times}10^5$ without a crystalline volume fraction. The catalyst behavior of the hot-wire to decompose the chemical precursors by an electron tunneling effect depends strongly on the hydrogen mixture rate and an amorphous Si thin film is formed from atomic relaxation.

Development of low-cost, compact, real-time, and wireless radiation monitoring system in underwater environment

  • Kim, Jeong Ho;Park, Ki Hyun;Joo, Koan Sik
    • Nuclear Engineering and Technology
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    • v.50 no.5
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    • pp.801-805
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    • 2018
  • In this study, an underwater radiation detector was built using a GAGG(Ce) scintillator and silicon photomultiplier to establish an underwater radiation exposure monitoring system. The GAGG(Ce) scintillator is suitable for small radiation detectors as it strongly absorbs gamma rays and has a high light emission rate with no deliquescent properties. Additionally, the silicon photomultiplier is a light sensor with characteristics such as small size and low applied voltage. Further, a program and mobile app were developed to monitor the radiation coefficient values generated from the detector. According to the results of the evaluation of the characteristics of the underwater radiation monitoring system, when tested for its responsiveness to radiation intensity and reactivity, the system exhibited a coefficient of determination of at least 0.99 with respect to the radiation source distance. Additionally, when tested for its underwater environmental temperature dependence, the monitoring system exhibited an increase in the count rate up to a certain temperature because of the increasing dark current and a decrease in the count rate because of decreasing overvoltage. Extended studies based on the results of this study are expected to greatly contribute to immediate and continuing evaluation of the degree of radioactive contamination in underwater environments.

Fabrication of n-ITO/p-PSL heterojunction type photodetectors and their characteristics (n-ITO/p-PSL 이종접합형 광검출 소자의 제조 및 그 특성)

  • Kim, Hang-Kyoo;Shin, Jang-Kyoo;Lee, Jong-Hyun;Song, Jae-Won
    • Journal of Sensor Science and Technology
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    • v.4 no.1
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    • pp.3-8
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    • 1995
  • n-ITO/p-PSL heterojunction photodetector have been fabricated on the Si wafer by using ITO(indium tin oxide) and PSL(porous silicon layer). They were anodized selectively by using silicon nitride and Ni-Cr/Au and were passivated by using ITO as well as being isolated by using mesa structure. With white light from 0 to 3000 Lux, the photocurrent varied linearly with incident light intensity. The reverse characteristics of fabricated devices were very stable up to a bias voltage of -40V and dark current density was about $40nA/mm^{2}$. When the device was exposed by Xe lamp whose wavelength range from 400nm to 1100nm, the maximum photo responsivity was about 0.6A/W between 600 and 700nm. Variation of the characteristics of fabricated devices after 5 weeks was negligible.

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A Study on the Characteristics Analysis and Design of High Sensitivity Silicon Photodiode for Laser Detector (레이저 검출용 고감도 실리콘 포토다이오드 제조 및 특성 분석에 관한 연구)

  • Lee, Jun-Myung;Kang, Eun-Young;Park, Keon-Jun;Kim, Yong-Kab
    • The Journal of the Korea institute of electronic communication sciences
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    • v.9 no.5
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    • pp.555-560
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    • 2014
  • In order to improve spectrum sensitivity of photodiode for detection of the laser wavelength at 850 nm ~ 1000 nm of near-infrared band, this study has produced silicon-based photodiode whose area is $5000{\mu}m{\times}2000{\mu}m$, and the thickness is $280{\mu}m$. It was packed by the TO-5 type. The electrical properties of the dark currents have valued of approximately 0.1 nA for 5 V reverse bias, while the capacitance showed 32.5 pF at frequency range of 1 kHz and about 32.4 pF at the range of 200 kHz for 0 V. In addition, the rising time of output signal was as fast response as 20.92 ns for 10V. For the optical properties, the best spectrum sensitivity was 0.57 A/W for 890 nm, while it was relatively excellent value of 0.37 A/W for 1,000 nm. Over all, there were good spectrum sensitivity for this diode over the range of 870 ~ 920 nm.

An Analysis on Performance Degradation of Silicon Photomultipliers over Temperatures Variation for PET-MR Application (PET-MR 시스템에 적용을 위한 실리콘 광증배센서의 온도 변화에 따른 성능 열화 분석)

  • Park, Kyeongjin;Kim, Hyoungtaek;Lim, Kyungtaek;Cho, Minsik;Kim, Giyoon;Cho, Gyuseong
    • Journal of Radiation Industry
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    • v.9 no.3
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    • pp.143-151
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    • 2015
  • A PET-MR system is particularly useful in diagnosing brain diseases. We have developed a prototype positron emission tomography (PET) system which can be inserted into the bore of a whole-body magnetic resonance imaging (MRI) system that enables us to obtain PET and MRI images simultaneously with a reduced cost. Silicon photomultipliers (SiPM) are appropriated as a PET detector at PET/MR system because detectors have a high gain and are insensitive to magnetic fields. Despite of its improved performance compared to that of PMT-based detectors, there is a problem of the photo-peak channel shift which is due to the increase of the temperature inside the ring detector. This problem will occur decreasing sensitivity of the PET and image distortion. In this paper, I quantitative analyze parameters of the KAIST SiPM depending on temperature by experiments. And I designed cooling methods in consideration of the degradation of sensors for correction of the temperature in the PET gantry. According to this research, we expect that distortive images and degradation of the sensitivity will not be occurred with using the above idea to reduce heat even if the PET system operates for a long time.

Fabrication and Characterization of Photo-Sensors for Very Small Scale Image System (초소형 영상시스템을 위한 광센서 제조 및 특성평가)

  • Shin, K.S.;Paek, K.K.;Lee, Y.S.;Lee, Y.H.;Park, J.H.;Ju, B.K.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.04a
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    • pp.187-190
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    • 2000
  • We fabricated general photo diode, surface etched photo diode and floating gate MOSFET by CMOS process. In a design stage, we expect that surface etched photo diode will be improved as to photo sensitivity. However, because the surface of silicon was damaged in etching process, the surface etched diode had a high dark current as well as low photo current level. Finally, we examined the current-voltage properties for the floating gate MOSFET on n-well and confirmed that the device can be act as an efficient photo-sensor. The floating gate MOSFET was operated in parasitic bipolar transistor mode.

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HWCVD를 이용하여 Microcrystalline film 성장시 Silane 농도에 따른 박막 성장 특성

  • Park, Seung-Il;Lee, Jung-Tack;Lee, Jeong-Chul;Huh, Yun-Sung;Kim, Keun-Joo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.267-267
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    • 2010
  • The structural and electrical properties of microcrystalline silicon films were investigated by hot wire chemical vapor deposition(HWCVD) often called catalytic chemical vapor deposition(Cat-CVD). The Si microcrystalline phase is easily controlled by changing the rate of the silane concentration of $SiH_4$ to $H_2$ during deposition. The Structural property was observed by Raman and SEM. Photo-conductivity and dark conductivity, and photo-sensitivity were observed by Sunsimulator (AM 1.5 illumination). The film color was changed by the variation of silane concentration. HWCVD is useful for the formation of Si thin films for solar cell and needs further commercialized development for mass production.

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