• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.275.1-275.1
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• 2014

The effects of the interfacial buffer layer and temperature on the organic bulk heterojunction (BHJ) nanostructures of copper phthalocyanine (CuPc) and fullerene (C60) systems were investigated using real time in-situ x-ray scattering. In the CuPc:C60 BHJ structures, standing-on configured ${\gamma}$-CuPc phase was formed by co-deposition of CuPc and C60. Once formed ${\gamma}$-phase was thermally stable during the annealing upon $180^{\circ}C$. Meanwhile, the insertion of CuI buffer layer prior to deposition of the CuPc:C60 BHJ layer induced lying-down configured CuPc crystals in the BHJ layer. The lying CuPc peak intensity and the lattice parameter were increased by the thermal annealing. This increment of the intensity seemed to be related to the strain at the interface between CuPc:C60 and CuI, which was proportional to the enhancement of the power conversion efficiency of the device.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07b
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• pp.1026-1029
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• 2002

We report the electric properties of organic light emitting diodes (OLEDs) by controlling the carrier density according to the crystalline of copper(II) phthalocyanine(CuPc) and the irradiation light intensity. OLEDs were constructed with indium tin oxaide (ITO)/CuPc/triphenyl-diamin (TPD)/tris-(8-hydroxyquinoline)aluminum (Alq3)/Al. The transport properties of OLEDs were changedby the heat-treatments of CuPc. The irradiation of red and blue light exciting CuPc, TPD and Alq3. And then we observed the carrier density of OLEDs.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.04b
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• pp.77-80
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• 2002

In order to enhence the photocurrent multiplication process, we controlled the irradiation light and the material of cathode layer of organic light emitting diodes (OLEDs). The structures of OLEDs were indium tin oxaide (ITO)/ copper(II) phthalocyanine (CuPc)/triphenyl-diamine (TPD)/ tris-(8-hydroxyquinoline)aluminum (Alq3)/ aluminum (Al). We found that OLEDs were changed by the photocurrent and free charge carrier multiplication process due to the irradiation of light. The rate of photocurrent was increased by the irradiation of red and blue light.

• Journal of the Korean Graphic Arts Communication Society
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• v.9 no.1
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• pp.27-44
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• 1991

In this research, double-layered photoconductor consist of the carrier generation layer(CGL) of ${\varepsilon}$ type copper phthalocyanine thin film by an aqueous coating method and the carrier transport layer(CGL) of polyvinyl carbazol(PVK) by spin coating. We inverstigated effect of the surfactant solution and cathod electrolysis to the crystal type of ${\varepsilon}$-CuPc in CGL with TEM, SEM and X-ray diffraction spectroscopy and studied the mechanism of an aqueous coating for the preparation of CGL. The effect of the washing of CGL about the electrophotographic characteristics of the ${\varepsilon}$-CUPC/PVK double-layered photoconductors is studied also.

• Progress in Superconductivity
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• v.3 no.1
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• pp.41-44
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• 2001

We report the current transport properties of a normal metal/organic conductor/ superconductor tunnel junction as a novel high- $T_{c}$ superconducting three terminal device. The organic copper (II) phthalocyanine (Cu-Pc) layer was used far a polaronic quasiparticle (QP) injector. The injection of polaronic QP from the Cu-Pc interlayer into a superconductor $Bi_2$$Sr_2$$CaCu_2$ $O_{8+}$ $\delta$/(BSCCO) thin film generated a substantially larger nonequilibrium effect as compared to the normal QP injection current. The tunneling spectroscopy of an Au/cu-PC/BSCCO junction exhibited a zero bias conductance peak which may be due to Andreev reflection at a Cu-Pc/d-wave superconductor junction.n..

• The Magazine of Kiice
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• v.9 no.1
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• pp.70-75
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• 2008

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.1074-1078
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• 2004

열 중착 방법을 이용하여 copper(II)-phthalocyanine(CuPc) 박막을 glass 기판 위에 제작하였다. 박막은 열처리를 하지 않은 경우와 열처리 조건을 $150^{\circ}C$ 로 후열(annealing) 처리 하는 방식으로 하였으며 후열 처리한 경우 $150^{\circ}C$에서의 열처리 지속 시간을 각각 2시간, 3시간, 4시간으로 달리하였다. 제작된 박막의 전기전도도를 평가하기 위해 마이크로파의 근접장 효과를 이용한 근접장 현미경(near-field scanning microwave microscope)을 이용하여 비파괴적인 방식으로 CuPc 박막의 반사계수(reflection coefficient)를 측정하였다. CuPc 박막의 전기전도도 특성을 UV 흡수도를 통한 HOMO(highest occupied molecular orbital), LUMO(lowest unoccupied molecular orbital) 준위의 밴드갭의 shift 현상과 관련지어 설명하였다. 박막 표면 특성은 SEM(scanning microscope microscopy)을 통해 관측하였다. 열처리 지속 시간에 따른 CuPc 박막의 전기전도도 특성은 2시간으로 지속한 경우의 박막의 경우 가장 좋았으며 그 보다 더 오랜 시간 동안 열처리를 지속한 경우에는 전기 전도 특성이 오히려 나빠짐을 알 수 있었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.317-318
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• 2008

Cu-Pc유기물 반도체를 얼 진공증착기술로 유리기판위에 40 nm 두께로 적층하였다. 상온에서 적층한 박막과 상온에서 적층한 후 $250^{\circ}C$ 이상의 온도로 후열 처리한 박막과 박막 적층 시 기판의 온도를 $250^{\circ}C$로 고정하여 적층한 박막들을 상호 비교 분석하였다. 적층된 Cu-Pc의 박막의 온도조건에 따라 X-ray diffraction(XRD)의 결정 특성이 $\alpha$-phase와 $\beta$-phase로 뚜렷이 구분되었으며， 자외선-가시광선 영역의 광 흡수도(UV-visible absorption spectra)와 field emission scanning electron microscopy(FE SEM)를 이용하여 결정성장 방향 및 표면 특성 변화를 비교조사하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2001.02a
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• pp.185-185
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• 2001

• Proceedings of the Korean Vacuum Society Conference
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• 2009.08a
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• pp.214-214
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• 2009