• 제목/요약/키워드: chip processing

검색결과 808건 처리시간 0.038초

XML기반의 Rice 60K DNA Chip 데이터베이스 시스템의 구현 (Implementation of Rice 60K DNA Chip Database system based on XML)

  • 박영배;안기영;남백희;이태호;최형인
    • 한국정보처리학회:학술대회논문집
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    • 한국정보처리학회 2003년도 추계학술발표논문집 (하)
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    • pp.1375-1378
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    • 2003
  • 본 논문은 Rice 60K DNA Chip의 실험데이터를 기반으로 한 데이터베이스의 구축과 XML기반 검색시스템을 설계 및 구현에 대해 설명한다. 본 시스템은 실험 데이터를 저장하기 위하여 RDBMS 를 사용하고 Chip 데이터를 검색하기 위해 XML 기반의 검색시스템을 사용한다. 이를 위해 일반 속성으로 저장될 수 있는 데이터들은 데이터베이스의 테이블의 속성 값으로 저장하고, XML 기반 검색시스템을 통해 검색할 수 있도록 한다. 그리고 BLAST내용을 기반으로 하는 데이터는 테이블을 별도로 만들어서 검색이 가능하도록 한다.

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결함검출을 위한 실험적 연구

  • 목종수
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1996년도 춘계학술대회 논문집
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    • pp.24-29
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    • 1996
  • The seniconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip effect on the functions of the semiconductors. The defects of the chip surface is crack or void. Because general inspection method requires many inspection processes, the inspection system which searches immediately and preciselythe defects of the semiconductor chip surface. We propose the inspection method by using the computer vision system. This study presents an image processing algorithm for inspecting the surface defects(crack, void)of the semiconductor test samples. The proposed image processing algorithm aims to reduce inspection time, and to analyze those experienced operator. This paper regards the chip surface as random texture, and deals with the image modeling of randon texture image for searching the surface defects. For texture modeling, we consider the relation of a pixel and neighborhood pixels as noncasul model and extract the statistical characteristics from the radom texture field by using the 2D AR model(Aut oregressive). This paper regards on image as the output of linear system, and considers the fidelity or intelligibility criteria for measuring the quality of an image or the performance of the processing techinque. This study utilizes the variance of prediction error which is computed by substituting the gary level of pixel of another texture field into the two dimensional AR(autoregressive model)model fitted to the texture field, estimate the parameter us-ing the PAA(parameter adaptation algorithm) and design the defect detection filter. Later, we next try to study the defect detection search algorithm.

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Processing-Node Status-based Message Scattering and Gathering for Multi-processor Systems on Chip

  • Park, Jongsu
    • Journal of information and communication convergence engineering
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    • 제17권4호
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    • pp.279-284
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    • 2019
  • This paper presents processing-node status-based message scattering and gathering algorithms for multi-processor systems on chip to reduce the communication time between processors. In the message-scattering part of the message-passing interface (MPI) scatter function, data transmissions are ordered according to the proposed linear algorithm, based on the processor status. The MPI hardware unit in the root processing node checks whether each processing node's status is 'free' or 'busy' when an MPI scatter message is received. Then, it first transfers the data to a 'free' processing node, thereby reducing the scattering completion time. In the message-gathering part of the MPI gather function, the data transmissions are ordered according to the proposed linear algorithm, and the gathering is performed. The root node receives data from the processing node that wants to transfer first, and reduces the completion time during the gathering. The experimental results show that the performance of the proposed algorithm increases at a greater rate as the number of processing nodes increases.

A Bus Data Compression Method on a Phase-Based On-Chip Bus

  • Lee, Jae-Sung
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제12권2호
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    • pp.117-126
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    • 2012
  • This paper provides a method for compression transmission of on-chip bus data. As the data traffic on on-chip buses is rapidly increasing with enlarged video resolutions, many video processor chips suffer from a lack of bus bandwidth and their IP cores have to wait for a longer time to get a bus grant. In multimedia data such as images and video, the adjacent data signals very often have little or no difference between them. Taking advantage of this point, this paper develops a simple bus data compression method to improve the chip performance and presents its hardware implementation. The method is applied to a Video Codec - 1 (VC-1) decoder chip and reduces the processing time of one macro-block by 13.6% and 10.3% for SD and HD videos, respectively

Linux 상에서 NUMA 지원을 응용한 스크래치 패드 메모리 관리방법 (Scratchpad-Memory Management Using NUMA Infrastructure on Linux)

  • 박병훈;서대화
    • 한국정보처리학회:학술대회논문집
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    • 한국정보처리학회 2009년도 추계학술발표대회
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    • pp.41-42
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    • 2009
  • 현재 많은 임베디드 SoC(System-On-Chip)에는 캐시 메모리의 단점을 보완하기 위해 온-칩(On-Chip) SRAM, 즉, SPM(Scratchpad Memory)를 내장하고 있으며 SPM은 그 특성상 캐시 메모리와 달리 소프트웨어가 직접 관리해야 한다. 본 논문에서는 NUMA를 지원하는 Linux 상에서 이식성이 높으면서 단순하게 구현할 수 있는 SPM 관리 방법을 제안한다.

비젼 피드백 제어를 이용한 광통신 Laser Diode Test Device 개발 (Development of Laser Diode Test Device using Feedback Control with Machine Vision)

  • 유철우;송문상;김재희;박상민;유범상
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.1663-1667
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    • 2003
  • This thesis is on tile development of LD(Laser Diode) chip tester and the control system based on graphical programming language(LabVIEW) to control the equipment. The LD chip tester is used to test the optic power and the optic spectrum of the LD Chip. The emitter size of LD chip and the diameter of the receiver(optic fiber) are very small. Therefore, in order to test each chip precisely, this tester needs high accuracy. However each motion part of the tester could not accomplish hish accuracy due to the limit of the mechanical performance. Hence. an image processing with machine vision was carried out in order to compensate for the error. and also a load test was carried out so as to reduce tile impact of load on chip while the probing motion device is working. The obtained results were within ${\pm}$5$\mu\textrm{m}$ error.

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PN Chip Clock Generator for CDMA Code Synchronization

  • Oh, Hyun-Seo
    • 한국정보통신학회논문지
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    • 제1권2호
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    • pp.193-197
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    • 1997
  • In this paper, we propose a new PN chip clock generator which employs two synchronous counters to achieve precise phase control of chip clock. In a CDMA code acquisition and tracking system, the PN chip clock is required to operate highly reliable without any glitch even under harsh environment condition such as temperature and voltage fluctu-aliens. The digital implementation of the proposed PN chip clock generator imparts it with much desired reliability. Since the proposed chip clock generator can be easily controlled into one of the states: free running, phase advance, and delay state, it can be applied to data processing as well as code synchronization. We have done FPGA implementation of the proposed logic and have verified its satisfactory operation up to 50 MHz.

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선삭가공에 있어서 선삭저항의 신호처리와 그 응용에 관한 연구(II) (A Study on the Signal Process of Cutting Forces in Turning and its Application (2nd Report) -Automatic Monitor of Chip Rorms using Cutting Forces-)

  • 김도영;윤을재;남궁석
    • 한국정밀공학회지
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    • 제7권2호
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    • pp.85-94
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    • 1990
  • In automatic metal cuttings, the chip control is one of the serious problems. So the automatic detection of chip forms is essential to the chip control in automatic metal cuttings. Cutting experiments were carried out under the variety of cutting conditions (cutting speed, feed, depth of cut and tool geometry) and with workpiece made of steel (S45C), and cutting forces were measured in-processing by using a piezoelectric type Tool Dynamometer. In this report, the frequency analysis of dynamic components, the upper frequency distributions, the ratio of RMS values, the numbers of null point and the probability density were calculated from the dynamic componeents of cutting forces filtered through various band pass filters. Experimental results showed that computer chip form monitoring system based on the cutting forces was designed and simulated and that 6 type of chip forms could be detected while in-process machining.

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