• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.45 no.4
• /
• pp.137-145
• /
• 2008

In this paper, novel CMOS charge pump having NMOS and PMOS transfer switches and a bulk-pumping circuit has been proposed. The NMOS and PMOS transfer switches allow the charge pump to improve the current-driving capability at the output. The bulk-pumping circuit effectively solves the bulk forward problem of the charge pump. To verify the effectiveness, the proposed charge pump was designed using a 80-nm CMOS process. The comparison results indicate that the proposed charge pump enhances the current-driving capability by more than 47% with pumping speed improved by 9%, as compared to conventional charge pumps having either NMOS or PMOS transfer switch. They also indicate that the charge pump reduces the worst-case forward bias of p-type bulk by more than 24%, effectively solving the forward current problem.

• Journal of the Society of Naval Architects of Korea
• /
• v.35 no.2
• /
• pp.63-73
• /
• 1998

Due to the collapse of corrugated bulkheads subject to accidental flooding which is thought to be a primary cause of bulk carrier losses International Maritime Organization(IMO), the International Association of Classification Societies(IACS) and the leading classification societies are taking a growing concern for the structural safety of corrugated bulkheads of bulk carriers. To prevent progressive collapse of corrugated bulkhead in flooded condition particularly of forward cargo ho1d they try to make rules which require reinforcement of corrugated bulkhead structure. However, we are still confronted with the urgent problem of more accurate and efficient ultimate strength assessment for corrugated bulkheads. This paper develops a special purpose nonlinear FE program for analyzing progressive collapse behavior of corrugated bulkheads subject to lateral pressure loads. As verification examples, the program is applied to collapse strength analysis of steel corrugated bulkhead test model.