• 한국정보디스플레이학회:학술대회논문집
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• 2003.07a
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• pp.673-674
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• 2003

The reliability of TFT, crystallized by sequential lateral solidification (SLS) technology, has been studied High current damage is characterized by high gate bias (-20V) and drain bias (-10V). It is found that performance of SLS TFTs is enhanced by high current stress up to 300 sec of stress time for 20/8 (W/L) N-TFT. After that, TFT performance is degraded with the increase of the stress time. It is speculated from the experimental data that SLS TFTs initially contain a number of unstable defect states. Then, the defect states seem to be cured by high current stress.

• Journal of Broadcast Engineering
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• v.18 no.4
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• pp.525-534
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• 2013

Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet transform to eliminate texture information in images. Then, we extract mura defect regions from the difference image between gabor wavelet transform image of original panel and generated reference panel image. Finally, all mura defect regions are quantified to detect accurate mura defects. Experimental results show that our method is more accurate and efficient than previous methods.

• IE interfaces
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• v.22 no.1
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• pp.1-9
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• 2009

As the LCD fabrication factories (Fab) are highly capital-intensive and the markets are very competitive, it is an essential requirement of operational management to achieve full-capacity production while meeting customer demands on time. In a typical LCD Fab, medium-term schedules such as release plans and production plans are critical to achieve the goal of full-capacity production and on-time delivery. Presented in this paper is a framework for weekly planning system generating medium-term schedules using a finite-capacity planning method. Also this paper presents a release planning method applying capacityfiltering algorithm, especially backward capacity-filtering procedure, which is one of the finite-capacity planning methods. In addition, performance analyses using actual data of a TFT-LCD Fab show that the proposed method is superior to existing methods or commercial S/W products generating release plans.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.148-154
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• 2009

In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura detection methods based on regression diagnostics, surface fitting and data transformation have been presented with good performance. This paper proposes an efficient Mura detection method that is based on a regression diagnostics using studentized residuals for automatic Mura inspection of FPD. The input image is estimated by a linear model and then the studentized residuals are calculated for filtering Mura regions. After image dilation, the proposed threshold is determined for detecting the non-uniform brightness region in TFT-LCD by means of monitoring the every pixel in the image. The experimental results obtained from several test images are used to illustrate the effectiveness and efficiency of the proposed method for Mura detection.

• Journal of Korea Society of Industrial Information Systems
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• v.19 no.6
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• pp.43-51
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• 2014

TFT-LCD image includes a defect of various properties. TFT-LCD image have a recognizable defects in the human inspector. On the other hand, it is difficult to detect defects that difference between the background and defect is very low. In this paper, we proposed sequentially detect algorithm from pixels included in the defect region to limited defects. And blob analysis methods using the blob size and gray difference are applied to the defect candidate image. Finally, we detect an accurate defect blob to distinguish the noise. The experimental results show that the proposed method finds the various defects reliably.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.15-18
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• 2004

Recent progress of the in-plane switching (IPS) TFT-LCD technologies is reviewed. We call the improved new technology 'advanced super IPS TFT-LCD(AS-IPS)'. After suppressing the viewing angle dependency of essential display characteristics, recent brightness, viewing angle and motion picture quality has been highly improved. The stage is now introducing it into consumer information appliance for higher display performances, by which we could open a large size digital LCD TVs application.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.281-285
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• 2006

Recently LG.Philips LCD (hereafter "LPL") has announced the development of the world's largest 100-inch TFT-LCD with Advanced Super IPS technology. This magnificent LCD achieves the feature of a full high definition resolution $1920{\times}1080(16:9)$, 600nit brightness, 3000:1 dynamic contrast ratio, 92% color gamut, 180 degree viewing angle, and 5msec response time at all grays, targeted for HDTV and public display applications. Some unique technologies such as Cu bus line, advanced wide view polarizer, and high color gamut lamp were applied. A new stitching free technology was developed to overcome the size limitation of photo mask in both the TFT and CF processes. The size of the panel (100-inch) based on the wide format (16:9) is determined by the maximum efficiency of world's $1^{st}$ seventh generation line (glass size:$1950{\times}2250mm$) in LPL's Paju display cluster. In this paper, we will discuss the issues of 100-inch TFT-LCD.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.1649-1652
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• 2006

2.22-inch qVGA $(240{\times}320)$ amorphous silicon thin film transistor liquid active matrix crystal display (${\alpha}$- Si TFT-AMLCD) panel has been successfully demonstrated employing a 2.5 um fine-patterning technology by a wet etch process. Higher resolution 2.22-inch qVGA LCD panel with an aperture ratio of 58% can be fabricated because the 2.5 um fine pattern formation technique is combined with high thermal photo-resist (PR) development. In addition, a novel concept of unique ${\alpha}$-Si TFT process architecture, which is advantageous in terms of reliability, was proposed in the fabrication of 2.22-inch qVGA LCD panel. Overall results show that the 2.5 um finepatterning is a considerably significant technology to obtain higher aperture ratio for higher resolution ${\alpha}$-Si TFT-LCD panel realization.

• Proceedings of the KIEE Conference
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• 2006.07d
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• pp.2053-2054
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• 2006

본 연구는 LCD 화질의 중요 Issue중 하나인 고속 응답 속도를 달성하기 위해 액정의 물성 및 TFT 구조 그리고 구동회로에 있어 필요한 조건을 찾기 위한 연구로서 응답속도에 관련된 주요 인자 중 특히 pixel에 인가되는 전압에 관련된 구동회로 조건과 TFT 구조에 초점을 맞추고 있다. 소비전류 Issue가 없는 Monitor 향 제품과 달리 Note 향 LCD 제품의 경우 액정의 유전율을 상승시켜 고속응답을 달성하고 있는데 이로 인해 Cst/Clc의 비율이 응답속도의 중요 인자로 작용하며 이에 최적 응답속도 달성을 위한 Cst/Clc 비율을 시뮬레이션 및 Test SPL 제작을 통해 제안하며 실제 pixel에 인가되는 Offset 전압에 의한 응답속도 유의차 및 Cusp 현상에 대해 논하였다

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.1546-1549
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• 2006

We have developed $EPLaR^{TM}$, a new way of making flexible electrophoretic displays. The TFTs have the same good performance, reliability and mature manufacturing processes as TFTs used in LCD monitors and LCD-TVs. We are working with partners to show that plastic displays can be made in existing TFT-LCD factories alongside glass LCDS. In this talk we describe the EPLaR process and show results for TFT arrays on plastic made in a factory by standard ${\alpha}$-Si TFT processing.